US5874328A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Reverse CMOS method for dual isolation semiconductor device
Assignee: GlobalFoundries Inc
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Filing: 1997-06-30
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Granted: 1999-02-23
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Expires: 2017-06-30
Abstract
Abstract CMOS transistors are formed by a damascene process resulting in field oxide regions exhibiting essentially no bird's beak portions. A trench isolation is also formed in a source/drain region each transistor between adjacent junctions.
Inventors
- 👤 Yowjuang W. Liu
- 👤 Kuang-Yeh Chang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 12:01
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0165; H10D84/0188; H10D84/02; H10D84/03; H10D84/038; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/014; H10W10/0148; H10W10/10; H10W10/17
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
184 words
A method of manufacturing a semiconductor device comprising CMOS transistors, which method comprises: forming an insulating layer on a main surface of a semiconductor substrate; forming a first resist mask on the insulating layer; etching a portion of the insulating layer through a first resist mask to a first depth within but not completely through the insulating layer to form a first opening; forming a second resist mask on the insulating layer; etching the insulating layer through a second resist mask to form second openings within the first opening extending to a second depth greater than the first depth, leaving field oxide regions for isolating CMOS transistors, which isolating regions have essentially no tapering bird's beak portions adjacent active regions; filling the first and second openings with a conductive material to form gate electrodes of CMOS transistors in the second openings and a gate interconnection in the first opening; ion implanting impurities to form source/drain regions of the CMOS transistors; and forming a trench isolation through a source/drain region in each CMOS transistor, which trench isolation extends into the substrate to isolate adjacent junctions.
Claim 2
Independent Claim
184 words
A method of manufacturing a semiconductor device comprising CMOS transistors, which method comprises: forming an insulating layer on a main surface of a semiconductor substrate; forming a first resist mask on the insulating layer; etching a portion of the insulating layer through a first resist mask to a first depth within but not completely through the insulating layer to form a first opening; forming a second resist mask on the insulating layer; etching the insulating layer through a second resist mask to form second openings within the first opening extending to a second depth greater than the first depth, leaving field oxide regions for isolating CMOS transistors, which isolating regions have essentially no tapering bird's beak portions adjacent active regions; filling the first and second openings with a conductive material to form gate electrodes of CMOS transistors in the second openings and a gate interconnection in the first opening; ion implanting impurities to form source/drain regions of the CMOS transistors; and forming a trench isolation through a source/drain region in each CMOS transistor, which trench isolation extends into the substrate to isolate adjacent junctions.
Claim 3
Dependent Claim
18 words
The method according to claim 1, comprising simultaneously filling the first and second openings with a conductive material.
Claim 4
Dependent Claim
35 words
The method according to claim 1, comprising implanting impurities of a conductivity type opposite to that in the semiconductor substrate to form a well implant in the semiconductor substrate prior to forming the insulating layer.
Claim 5
Dependent Claim
26 words
The method according to claim 3, comprising: implanting impurities to form an N-well in a P-type semiconductor substrate; and forming a PMOS transistor in the N-well.
Claim 6
Dependent Claim
13 words
The method according to claim 1, wherein the insulating layer comprises silicon dioxide.
Claim 7
Dependent Claim
42 words
The method according to claim 5, comprising forming the insulating layer by: depositing a first silicon dioxide layer; depositing a layer of silicon nitride on the first silicon dioxide layer; and depositing a second silicon dioxide layer on the silicon nitride layer.
Claim 8
Dependent Claim
40 words
The method according to claim 6, comprising etching through the first mask to form the first opening extending through the second silicon dioxide layer to the silicon nitride layer, wherein the silicon nitride layer serves as an etch stop layer.
Claim 9
Dependent Claim
38 words
The method according to claim 7, comprising: etching to remove the silicon nitride layer; and etching through the second mask to form the second openings extending into the first silicon dioxide layer, thereby forming a profiled composite mask.
Claim 10
Dependent Claim
28 words
The method according to claim 1, wherein the second openings extend completely through the insulating layer to and expose portions of the main surface of the semiconductor substrate.
Claim 11
Dependent Claim
37 words
The method according to claim 9, further comprising oxidizing the main surface of the semiconductor substrate to form a gate oxide layer on the exposed portions of the semiconductor substrate at the bottom of the second openings.
Claim 12
Dependent Claim
19 words
The method according to claim 1, further comprising implanting into the substrate impurities to form field and/or channel implants.
Claim 13
Dependent Claim
25 words
The method according to claim 1, wherein the conductive material comprises polycrystalline silicon or a polysilicide structure of polycrystalline silicon and a metal silicide thereon.
Claim 14
Dependent Claim
40 words
The method according to claim 8, comprising implanting impurities to form field and/or channel implants, wherein, by virtue of the profiled composite mask, the impurities are implanted at different depths in the semiconductor substrate to form a retrograde well structure.
Claim 15
Dependent Claim
28 words
The method according to claim 1, comprising: simultaneously forming the gate electrodes and interconnection layer in electrical contact with the gate electrodes in a single metal deposition step.
Claim 16
Dependent Claim
36 words
The method according to claim 1, comprising: depositing an insulating layer on a semiconductor substrate; etching the insulating layer through a mask to form openings; and implanting impurity ions through the openings to form source/drain regions.
Claim 17
Dependent Claim
49 words
The method according to claim 1, comprising forming the trench isolation by: etching through a mask to form a trench in the substrate; oxidizing to form a thin oxide layer lining the trench and simultaneously activating the source/drain regions; and depositing an interlayer insulating film simultaneously filling the trench.
Claim 18
Independent Claim
44 words
A method of manufacturing a semiconductor device, comprising: forming a plurality of transistors on a semiconductor substrate separated by a field oxide region; and subsequently forming a trench isolation extending through a source/drain region of each transistor into the semiconductor substrate isolating adjacent junctions.
Claim 19
Independent Claim
44 words
A method of manufacturing a semiconductor device, comprising: forming a plurality of transistors on a semiconductor substrate separated by a field oxide region; and subsequently forming a trench isolation extending through a source/drain region of each transistor into the semiconductor substrate isolating adjacent junctions.
Claim 20
Dependent Claim
26 words
The method according to claim 17, comprising: depositing an insulating layer on the semiconductor substrate; and etching the insulating layer to form openings defining gate electrodes.
Claim 21
Dependent Claim
28 words
The method according to claim 18, comprising: simultaneously forming the gate electrodes and interconnection layer in electrical contact with the gate electrodes in a single metal deposition step.
Claim 22
Dependent Claim
36 words
The method according to claim 17, comprising: depositing an insulating layer on the semiconductor substrate; etching the insulating layer through a mask to form openings; and implanting impurity ions through the openings to form source/drain regions.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2002-02-22 | 2002-08-24 | 2003-02-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-02-22 | 2006-08-24 | 2007-02-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-02-22 | 2010-08-24 | 2011-02-23 | $7700.00 | Window Closed / Lapsed |