Self-setup non-overlap clock generator

Claim 2

A self-setup non-overlap clock generator, comprising: a primary clock signal input terminal for providing a primary clock signal; a selection signal input terminal for providing at least one selection signal; a first logic gate having a first input terminal and a second input terminal, the first input terminal of said first logic gate being coupled to receive an inverted signal of said primary clock signal; a second logic gate having a first input terminal and a second input terminal, the first input terminal of said second logic gate being coupled to receive said primary clock signal; first programmable delay means, connected between an output of said first logic gate and the second input terminal of said second logic gate, for delaying an output signal from said first logic gate an amount of time according to said at least one selection signal, said amount of time being adjustable according to a different value of said at least one selection signal; second programmable delay means, connected between an output of said second logic gate and the second input terminal of said first logic gate, for delaying an output signal from said second logic gate a predetermined amount of time according to said at least one selection signal, said predetermined amount of time being adjustable according to a different value of said at least one selection signal, thereby generating a first clock signal from the output of said first logic gate, and generating a second clock signal from the output of said second logic gate, wherein the first clock signal and the second clock signal are not logically active at the same time; means for testing whether a non-overlap space between the first clock signal and the second clock signal conforms to a predetermined value; and selection means for generating said at least one selection signal in response to at least one output of said testing means such that a smallest value out of all possible non-overlap spaces is chosen.

Claim 3

The clock generator according to claim 1, further comprising a first buffer coupled to the output of said first logic gate.

Claim 4

The clock generator according to claim 2, further comprising a second buffer coupled to the output of said second logic gate.

Claim 5

The clock generator according to claim 1, wherein said first logic gate comprises a first NAND gate.

Claim 6

The clock generator according to claim 4, wherein said second logic gate comprises a second NAND gate.

Claim 7

The clock generator according to claim 1, wherein said first programmable delay means comprises a plurality of first delay components, one of said first delay components being then selected as the output of said first programmable delay circuit.

Claim 8

The clock generator according to claim 6, wherein said second programmable delay means comprises a plurality of second delay components, one of said second delay components being then selected as the output of said second programmable delay means.

Claim 9

The clock generator according to claim 7, wherein said first delay component is selected by a first multiplexer.

Claim 10

The clock generator according to claim 8, wherein said second delay component is selected by a second multiplexer.

Claim 11

The clock generator according to claim 7, wherein each of said first and second delay components comprises an even number of inverters.

Claim 12

The clock generator according to claim 1, wherein said first programmable delay means comprises a plurality of first delay components connected in serial, at least one of said first delay components being selected as a delay path of said first programmable delay means.

Claim 13

The clock generator according to claim 11, wherein said second programmable delay means comprises a plurality of second delay components connected in serial, at least one of said second delay components being selected as a delay path of said second programmable delay means.

Claim 14

The clock generator according to claim 1, wherein said selection means comprises: a selector counter which provides said at least one selection signal; and a failure detect circuit which commands said testing means to start the test, and controls said selector counter in response to said at least one output of said testing means, so that said smallest value is chosen.

Claim 15

The clock generator according to claim 13, wherein said selector counter comprises a plurality of flip-flops connected in serial, outputs of said plurality of flip-flops providing said at least one selection signal.

Claim 16

The clock generator according to claim 13, wherein function of said failure detect circuit is performed by the steps of: resetting content of said selector counter; sending a command signal to said testing means to start the test; and incrementing the content of said selector counter when the test by said testing means fails to conform to the predetermined value.

Claim 17

A self-setup non-overlap clock generator, comprising: a primary clock signal input terminal for providing a primary clock signal; a selection signal input terminal for providing at least one selection signal; a first logic gate having a first input terminal and a second input terminal, the first input terminal of said first logic gate being coupled to receive an inverted signal of said primary clock signal; a second logic gate having a first input terminal and a second input terminal, the first input terminal of said second logic gate being coupled to receive said primary clock signal; a plurality of first delay components coupled to receive an output of said first logic gate; a first multiplexer coupled to said plurality of first delay components, one of said first delay components being then selected by said first multiplexer as an output of said first multiplexer coupled to the second input terminal of said second logic gate; a plurality of second delay components coupled to receive an output of said second logic gate; a second multiplexer coupled to said plurality of second delay components, one of said second delay components being then selected by said second multiplexer as an output of said second multiplexer coupled to the second input terminal of said first logic gate, thereby generating a first clock signal from the output of said first logic gate, and generating a second clock signal from the output of said second logic gate, wherein the first clock signal and the second clock signal are not logically active at the same time; a self-test circuit configured to test whether a non-overlap space between the first clock signal and the second clock signal conforms to a predetermined value; a selector counter which provides said at least one selection signal; and a failure detect circuit which commands said self-test circuit to start the test, and controls said selector counter in response to said at least one output of said self-test circuit, so that a smallest value out of all possible non-overlap spaces is chosen.

Claim 18

A self-setup non-overlap clock generator, comprising: a primary clock signal input terminal for providing a primary clock signal; a selection signal input terminal for providing at least one selection signal; a first logic gate having a first input terminal and a second input terminal, the first input terminal of said first logic gate being coupled to receive an inverted signal of said primary clock signal; a second logic gate having a first input terminal and a second input terminal, the first input terminal of said second logic gate being coupled to receive said primary clock signal; a plurality of first delay components coupled to receive an output of said first logic gate; a first multiplexer coupled to said plurality of first delay components, one of said first delay components being then selected by said first multiplexer as an output of said first multiplexer coupled to the second input terminal of said second logic gate; a plurality of second delay components coupled to receive an output of said second logic gate; a second multiplexer coupled to said plurality of second delay components, one of said second delay components being then selected by said second multiplexer as an output of said second multiplexer coupled to the second input terminal of said first logic gate, thereby generating a first clock signal from the output of said first logic gate, and generating a second clock signal from the output of said second logic gate, wherein the first clock signal and the second clock signal are not logically active at the same time; a self-test circuit configured to test whether a non-overlap space between the first clock signal and the second clock signal conforms to a predetermined value; a selector counter which provides said at least one selection signal; and a failure detect circuit which commands said self-test circuit to start the test, and controls said selector counter in response to said at least one output of said self-test circuit, so that a smallest value out of all possible non-overlap spaces is chosen.

Claim 19

The clock generator according to claim 16, further comprising a first buffer coupled to the output of said first logic gate.

Claim 20

The clock generator according to claim 17, further comprising a second buffer coupled to the output of said second logic gate.

Claim 21

The clock generator according to claim 16, wherein said first logic gate comprises a first NAND gate.

Claim 22

The clock generator according to claim 19, wherein said second logic gate comprises a second NAND gate.

Claim 23

The clock generator according to claim 16, wherein each of said first and second delay components comprises an even number of inverters.

Claim 24

The clock generator according to claim 16, wherein said selector counter comprises a plurality of flip-flops connected in serial, outputs of said plurality of flip-flops providing said at least one selection signal.

Claim 25

The clock generator according to claim 16, wherein function of said failure detect circuit is performed by the steps of: resetting content of said selector counter; sending a command signal to said self-test circuit to start the test; and incrementing the content of said selector counter when the test by said self-test circuit fails to conform to the predetermined value.