Semiconductor device leadframe die attach pad having a raised bond pad

Claim 2

A semiconductor device lead frame assembly adapted to be encapsulated by a plastic package, comprising: a die attach pad, inner bond fingers spaced apart from a die attach pad, said lead frame having dual gauge metal portions, said die attach pad being in a portion with reduced thickness, said die attach pad having its thickness so dimensioned that the bottom of said die attach pad does not extend through said plastic package, said die attach pad adapted to allow a die to be secured to said die attach pad by a die bonding material, a portion of said die bonding material which flows out from between said die and said die attach pad to form a squash out layer covering a first area of said die attach pad, and a raised bond pad, at least partially in said first area, extending upward from said die attach pad sufficient to be above said squash out layer.

Claim 3

The semiconductor device lead frame assembly of claim 1, adapted to allow a bond wire to have one end secured to said die and the other end to said raised bond pad, wherein said raised bond pad is so dimensioned upward to reduce the angle at which said bond wire attaches to the raised bond pad so as to create a secure bond attachment resistant to thermal cycling stresses and not contacting the edge of the die.

Claim 4

The semiconductor device lead frame assembly of claim 1, wherein said raised bond pad is formed upward from a portion of said die attach pad.

Claim 5

The semiconductor device lead frame assembly of claim 3, wherein said portion of said die attach pad is slit and formed upward from said die attach pad.

Claim 6

The semiconductor device lead frame assembly of claim 4, wherein two sides of said raised bond pad are secured to said die attach pad and so dimensioned so as to be self supporting and able to be wire bonded without support fixtures.

Claim 7

A semiconductor device, comprising: a plastic package, a lead frame having a die attach pad and inner bond fingers spaced apart from said die attach pad, said lead frame having dual gauge metal portions, said die attach pad being in a portion with reduced thickness, said die attach pad having its thickness so dimensioned that the bottom of said die attach pad does not extend through said plastic package, a die secured to said die attach pad by a die bonding material, a portion of said die bonding material which flows out from between said die and said die attach pad to form a squash out layer covering a first area of said die attach pad, a raised bond pad at least partially in said first area extending upward from said die attach pad sufficient to be above said squash out layer, a bond wire having one end secured to said die and the other end to said raised bond pad, and said plastic package encapsulating said die, die attach pad, raised bond pad and bond wire.

Claim 8

A semiconductor device, comprising: a plastic package, a lead frame having a die attach pad and inner bond fingers spaced apart from said die attach pad, said lead frame having dual gauge metal portions, said die attach pad being in a portion with reduced thickness, said die attach pad having its thickness so dimensioned that the bottom of said die attach pad does not extend through said plastic package, a die secured to said die attach pad by a die bonding material, a portion of said die bonding material which flows out from between said die and said die attach pad to form a squash out layer covering a first area of said die attach pad, a raised bond pad at least partially in said first area extending upward from said die attach pad sufficient to be above said squash out layer, a bond wire having one end secured to said die and the other end to said raised bond pad, and said plastic package encapsulating said die, die attach pad, raised bond pad and bond wire.

Claim 9

The semiconductor device of claim 6, wherein said raised bond pad is so dimensioned upward to reduce the angle at which said bond wire attaches to the raised bond pad so as to create a secure bond attachment resistant to thermal cycling stresses and not contacting the edge of the die.

Claim 10

The semiconductor device of claim 7, wherein said raised bond pad is formed upward from a portion of said die attach pad.

Claim 11

The semiconductor device of claim 8, wherein said portion is slit and formed upward from said die attach pad.

Claim 12

The semiconductor device of claim 9, wherein said raised bond pad is secured to said die attach pad on two sides of said raised bond pad and is so dimensioned to be self supporting and able to be wire bonded without support fixtures.