Method and apparatus for adjusting pin driver charging and discharging current

Claim 2

A circuit comprising: pulse forming means responsive to a data input signal for providing a pulsed output to an output node, said pulsed output being timed in accordance with said data input signal and having high and low voltage levels responsive to respective high and low reference voltages, said pulse forming means comprising means for providing charging currents to and discharging currents from said node; and means responsive to said high and low reference voltages for adjusting said charging and discharging currents of said pulse forming means in accordance with the difference between said high and low reference voltages.

Claim 3

The circuit recited in claim 1 further comprising an output amplifier responsive to said pulsed output of said pulse forming means for providing driver pulses adapted to be fed to a device under test.

Claim 4

The circuit recited in claim 1 further comprising means for clamping said node to a range between upper and lower voltages in response to said high and low reference voltages.

Claim 5

The circuit recited in claim 1 wherein said adjusting means comprises a first transistor for providing charging current to said node and a second transistor for discharging current from said node.

Claim 6

The circuit recited in claim 4 wherein said adjusting means further comprises a difference amplifier fed by said high and low reference voltages, and means responsive to an output of said difference amplifier for producing a current in accordance with the difference between said high and low reference voltages, said first and second transistors having respective terminals connected to mirror current in response to said current producing means.

Claim 7

In an automatic test equipment system adapted to produce driver output pulses to be transmitted to a pin of a device under test wherein the output driver pulses are to have predetermined high and low voltage levels each corresponding to a respective high and low reference voltage, a pin driver circuit comprising: pulse forming means responsive to a data input signal for providing to an output node a pulsed output timed in accordance with said data input signal, said pulse forming means comprising means for providing charging current to and discharging current from said node; means responsive to said high and low reference voltages for clamping said node in a range between upper and lower voltages; a buffer circuit coupled to receive said pulsed output from said node; an output amplifier coupled to receive a buffered output from said buffer circuit and produce said output driver pulses having high and low voltage levels corresponding to said high and low reference voltage levels, respectively; and means for adjusting the magnitude of said charging and discharging currents of said pulse forming means in response to a difference between said high and low reference voltages to compensate slew rate and overshoot for devices under test operating at different logic levels.

Claim 8

In an automatic test equipment system adapted to produce driver output pulses to be transmitted to a pin of a device under test wherein the output driver pulses are to have predetermined high and low voltage levels each corresponding to a respective high and low reference voltage, a pin driver circuit comprising: pulse forming means responsive to a data input signal for providing to an output node a pulsed output timed in accordance with said data input signal, said pulse forming means comprising means for providing charging current to and discharging current from said node; means responsive to said high and low reference voltages for clamping said node in a range between upper and lower voltages; a buffer circuit coupled to receive said pulsed output from said node; an output amplifier coupled to receive a buffered output from said buffer circuit and produce said output driver pulses having high and low voltage levels corresponding to said high and low reference voltage levels, respectively; and means for adjusting the magnitude of said charging and discharging currents of said pulse forming means in response to a difference between said high and low reference voltages to compensate slew rate and overshoot for devices under test operating at different logic levels.

Claim 9

The pin driver circuit recited in claim 6 wherein said adjusting means comprises a first transistor for providing said charging current to said node and a second transistor for discharging current from said node.

Claim 10

The pin driver circuit recited in claim 7 wherein said adjusting means further comprises mirror means for producing a current in accordance to the magnitudes of said high and low reference voltages.

Claim 11

The pin driver circuit recited in claim 8 wherein said adjusting means comprises means for mirroring the current of said first and second transistors to said mirror means.

Claim 12

The pin driver circuit recited in claim 9 wherein said mirror means comprises a difference amplifier fed by said high and low reference voltages, and a third transistor having a terminal coupled to an output of said difference amplifier.

Claim 13

In an automatic test system adapted to produce output driver pulses to be transmitted to a pin of a device under test wherein said system is adapted to produce driver pulses of selected high and low voltage levels to test devices operated at different logic levels, said selected high and low voltage levels being determined in response to selected high and low reference voltages, a pin driver circuit comprising: pulse forming means responsive to a data input signal for providing to an output node a pulsed output timed in accordance with said data input signal, said pulse forming means comprising means for providing charging current to and discharging current from said node; means responsive to selected high and low reference voltages for clamping said node between upper and lower voltages; a buffer circuit coupled to receive said pulsed output from said node; an output amplifier coupled to receive a buffered output from said buffer circuit and produce said output driver pulses having selected high and low voltage levels substantially in accordance with said selected high and low reference voltages; and means for optimizing slew rate and overshoot of output driver pulses having selected high and low voltage levels, said optimizing means comprising means for adjusting said charging and discharging currents flowing to and from said node.

Claim 14

In an automatic test system adapted to produce output driver pulses to be transmitted to a pin of a device under test wherein said system is adapted to produce driver pulses of selected high and low voltage levels to test devices operated at different logic levels, said selected high and low voltage levels being determined in response to selected high and low reference voltages, a pin driver circuit comprising: pulse forming means responsive to a data input signal for providing to an output node a pulsed output timed in accordance with said data input signal, said pulse forming means comprising means for providing charging current to and discharging current from said node; means responsive to selected high and low reference voltages for clamping said node between upper and lower voltages; a buffer circuit coupled to receive said pulsed output from said node; an output amplifier coupled to receive a buffered output from said buffer circuit and produce said output driver pulses having selected high and low voltage levels substantially in accordance with said selected high and low reference voltages; and means for optimizing slew rate and overshoot of output driver pulses having selected high and low voltage levels, said optimizing means comprising means for adjusting said charging and discharging currents flowing to and from said node.

Claim 15

The pin driver circuit recited in claim 11 wherein said adjusting means comprises a first transistor for providing said charging current to said node and a second transistor for discharging current from said node.

Claim 16

The pin driver circuit recited in claim 12 wherein said adjusting means further comprises mirror means for producing a current in accordance to the magnitudes of said selected high and low reference voltages.

Claim 17

The pin driver circuit recited in claim 13 wherein said adjusting means comprises means for mirroring the current of said first and second transistors to said mirror means.

Claim 18

The pin driver circuit recited in claim 14 wherein said mirror means comprises a difference amplifier fed by said selected high and low reference voltages, and a third transistor having a terminal coupled to an output of said difference amplifier.

Claim 21

The method recited in claim 16 further comprising a step of amplifying said pulses from said node to provide said driver pulses.

Claim 22

The method recited in claim 16 wherein said providing step comprises the steps of providing said charging current through a first transistor to said node, and discharging current from said node through a second transistor.

Claim 23

The method recited in claim 17 wherein said adjusting step comprises a step of producing through a third transistor a current corresponding to a difference between said selected high and low reference voltages.

Claim 24

The method recited in claim 17 wherein said adjusting step comprises a step of mirroring current of said first and second transistors to said third transistor.