US5837598A
Expired / Lapsed
US
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Diffusion barrier for polysilicon gate electrode of MOS device in integrated circuit structure, and method of making same
Assignee: Avago Technologies International Sales Pte Ltd
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Filing: 1997-03-13
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Granted: 1998-11-17
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Expires: 2017-03-13
Abstract
Abstract A uniformly doped polysilicon gate electrode of an MOS device forming a part of an integrated circuit structure on a semiconductor substrate is formed by first depositing a very thin layer of amorphous or polycrystalline silicon, e.g., from about 2 nm to about 10 nm, over a gate oxide layer. The thin layer of silicon layer is then exposed to a nitrogen plasma formed from N 2 at a power level sufficient to break the silicon--silicon bonds in the thin layer of silicon, but insufficient to cause sputtering of the silicon to cause a barrier layer of silicon and nitrogen to form at the surface of the thin silicon layer. Further silicon, e.g., polysilicon, is then deposited over the barrier layer to the desired thickness of the polysilicon gate electrode. The gate electrode is then conventionally doped, i.e., by implantation followed by furnace annealing, to diffuse and activate the dopant in the polysilicon gate electrode without, however, resulting in penetration of the dopant through the barrier layer into the underlying gate oxide layer or the semiconductor substrate.
Inventors
- 👤 Sheldon Aronowitz
- 👤 Valeriy Sukharev
- 👤 Jon Owyang
- 👤 John Haywood
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 01:42
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01306; H10D64/60; H10D64/66; H10D64/661
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
164 words
A process for forming a uniformly doped polysilicon gate electrode of an MOS device comprising an integrated circuit structure formed on a semiconductor substrate which comprises: a) forming a thin layer of amorphous or polycrystalline silicon over a gate oxide portion of said MOS device on said semiconductor substrate; b) exposing said thin layer of silicon to a nitrogen plasma to thereby form a barrier layer of silicon and nitrogen over said gate oxide; c) depositing polysilicon over said barrier layer of silicon and nitrogen to form said polysilicon gate electrode; and d) doping said polysilicon gate electrode by implanting said electrode with a dopant and then annealing said electrode to diffuse and activate said dopant uniformly through said polysilicon gate electrode above said barrier layer of silicon and nitrogen; whereby said uniformly doped polysilicon gate electrode of an MOS device is formed without penetration of said dopant through said barrier layer to said gate oxide and said semiconductor substrate underlying said barrier layer.
Claim 2
Dependent Claim
164 words
A process for forming a uniformly doped polysilicon gate electrode of an MOS device comprising an integrated circuit structure formed on a semiconductor substrate which comprises: a) forming a thin layer of amorphous or polycrystalline silicon over a gate oxide portion of said MOS device on said semiconductor substrate; b) exposing said thin layer of silicon to a nitrogen plasma to thereby form a barrier layer of silicon and nitrogen over said gate oxide; c) depositing polysilicon over said barrier layer of silicon and nitrogen to form said polysilicon gate electrode; and d) doping said polysilicon gate electrode by implanting said electrode with a dopant and then annealing said electrode to diffuse and activate said dopant uniformly through said polysilicon gate electrode above said barrier layer of silicon and nitrogen; whereby said uniformly doped polysilicon gate electrode of an MOS device is formed without penetration of said dopant through said barrier layer to said gate oxide and said semiconductor substrate underlying said barrier layer.
Claim 3
Dependent Claim
15 words
The process of claim 1 wherein said nitrogen plasma is formed from N 2 gas.
Claim 4
Dependent Claim
66 words
The process of claim 2 wherein said step of forming said thin layer of amorphous or polycrystalline silicon over said gate oxide further comprises forming a silicon layer sufficiently thick to provide sufficient silicon to form said barrier layer of silicon and nitrogen capable of preventing diffusion of said dopant through said barrier layer to said gate oxide and said semiconductor substrate underlying said barrier layer.
Claim 5
Dependent Claim
58 words
The process of claim 2 wherein said step of forming said thin layer of amorphous or polycrystalline silicon over said gate oxide further comprises forming a silicon layer sufficiently thin to result in an amount of silicon left below said barrier layer of silicon and nitrogen incapable of causing a shift in the Vt of said MOS device.
Claim 6
Dependent Claim
43 words
The process of claim 2 wherein said step of forming said thin layer of amorphous or polycrystalline silicon over said gate oxide further comprises forming a silicon layer of from about 2 nm to about 10 nm in thickness over said gate oxide.
Claim 7
Dependent Claim
43 words
The process of claim 2 wherein said step of forming said thin layer of amorphous or polycrystalline silicon over said gate oxide further comprises forming a silicon layer of from about 3 nm to about 6 nm in thickness over said gate oxide.
Claim 8
Dependent Claim
23 words
The process of claim 2 wherein said nitrogen plasma has a power level sufficient to break silicon--silicon bonds, but insufficient to sputter silicon.
Claim 9
Dependent Claim
33 words
The process of claim 7 wherein said step of forming said barrier layer of silicon and nitrogen by said nitrogen plasma is carried out at a temperature of about 100° C. or less.
Claim 10
Dependent Claim
36 words
The process of claim 7 wherein said step of forming said barrier layer of silicon and nitrogen by said nitrogen plasma is carried out at a temperature of from about 15° C. to about 30° C.
Claim 11
Dependent Claim
35 words
The process of claim 7 wherein said step of forming said barrier layer of silicon and nitrogen by said nitrogen plasma is carried out at a temperature of from about 20° to about 27° C.
Claim 12
Dependent Claim
72 words
The process of claim 2 wherein said step of exposing said thin layer of silicon to said nitrogen plasma is carried out for at least about 5 minutes to form said barrier layer of silicon and nitrogen having a nitrogen concentration of at least about 10 atomic percent to prevent subsequent penetration of dopant from said polysilicon gate electrode above said barrier layer to said gate oxide portion beneath said barrier layer.
Claim 13
Dependent Claim
81 words
The process of claim 2 wherein said step of exposing said thin layer of silicon to said nitrogen plasma is carried out for from at least about 2 minutes to about 20 minutes to form said barrier layer of silicon and nitrogen having a nitrogen concentration of from about 10 atomic percent to about 20 atomic percent to prevent subsequent penetration of dopant from said polysilicon gate electrode above said barrier layer to said gate oxide portion beneath said barrier layer.
Claim 14
Dependent Claim
197 words
A process for forming a uniformly doped polysilicon gate electrode of an MOS device comprising an integrated circuit structure on a semiconductor substrate which comprises: a) forming a layer of amorphous or polycrystalline silicon of from about 2 nm to about 10 nm in thickness over a gate oxide portion of said MOS device on said semiconductor substrate; b) exposing said thin layer of silicon, at a temperature of about 100° C. or less to a nitrogen plasma formed from N 2 gas, said plasma having a power level sufficient to break silicon--silicon bonds, but insufficient to sputter silicon, to thereby form a barrier layer of silicon and nitrogen over said gate oxide; c) depositing polysilicon over said barrier layer to form said polysilicon gate electrode; and d) doping said polysilicon gate electrode by implanting said electrode with a dopant and then annealing said electrode to diffuse and activate said dopant uniformly through said electrode above said barrier layer; whereby said uniformly doped polysilicon gate electrode of an MOS device is formed without penetration of said dopant through said barrier layer of silicon and nitrogen to said gate oxide and said semiconductor substrate underlying said barrier layer.
Claim 15
Dependent Claim
197 words
A process for forming a uniformly doped polysilicon gate electrode of an MOS device comprising an integrated circuit structure on a semiconductor substrate which comprises: a) forming a layer of amorphous or polycrystalline silicon of from about 2 nm to about 10 nm in thickness over a gate oxide portion of said MOS device on said semiconductor substrate; b) exposing said thin layer of silicon, at a temperature of about 100° C. or less to a nitrogen plasma formed from N 2 gas, said plasma having a power level sufficient to break silicon--silicon bonds, but insufficient to sputter silicon, to thereby form a barrier layer of silicon and nitrogen over said gate oxide; c) depositing polysilicon over said barrier layer to form said polysilicon gate electrode; and d) doping said polysilicon gate electrode by implanting said electrode with a dopant and then annealing said electrode to diffuse and activate said dopant uniformly through said electrode above said barrier layer; whereby said uniformly doped polysilicon gate electrode of an MOS device is formed without penetration of said dopant through said barrier layer of silicon and nitrogen to said gate oxide and said semiconductor substrate underlying said barrier layer.
Claim 16
Dependent Claim
35 words
The process of claim 13 wherein said step of forming said barrier layer of silicon and nitrogen by said nitrogen plasma is carried out at a temperature of from about 15° to about 30° C.
Claim 17
Dependent Claim
43 words
The process of claim 13 wherein said step of forming said thin layer of amorphous or polycrystalline silicon over said gate oxide further comprises forming a silicon layer of from about 3 nm to about 6 nm in thickness over said gate oxide.
References Cited (Backward Citations)
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