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US5774011A Expired / Lapsed US ⏱️ 0.0 years remaining

Antifuse circuit using standard MOSFET devices

Assignee: International Business Machines Corp
•
Filing: 1997-05-28
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Granted: 1998-06-30
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Expires: 2017-05-28
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Abstract

Abstract A programmable device is formed from a field-effect transistor. Specifically, the present invention generally related to integrated circuit (IC) structures and more particularly, to an improved antifuse structure for use in programming redundant and customizable IC chips. The anti-fuse is NFET made of MOS material and formed at a face of a semiconductor layer having an n-type doped source, and drain region, and a p-type doped channel region separating the source and drain regions. The device is programmed by applying a high voltage to the NFET drain to form a hot spot located along the channel width of the drain and thereby forming a bridge, which now has less resistance than the surrounding channel material, to the NFET source.

Inventors

  • 👤 Wai-Ming William Au
  • 👤 Edward Joseph Nowak
  • 👤 Ming Ho Tong

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 15:05
CPC Classifications
G; G11; G11C; G11C17/00; G11C17/14; G11C17/16; H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/491

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 105 words
An integrated circuit having an antifuse circuit for enabling a discretionary circuit, comprising: a) a first node having a programmable high voltage applied thereto; b) a PFET having: a gate, a source coupled to the first node, and a drain coupled to a second node and the discretionary circuit; c) a programmable circuit, coupled to the gate of the PFET, for pulling the PFET gate voltage high and low; and d) an NFET having a drain electrode coupled to the second node, the NFET gate having a channel region with a predetermined width and length that is shorted upon application of the programmable high voltage.
Claim 2
Dependent Claim 105 words
An integrated circuit having an antifuse circuit for enabling a discretionary circuit, comprising: a) a first node having a programmable high voltage applied thereto; b) a PFET having: a gate, a source coupled to the first node, and a drain coupled to a second node and the discretionary circuit; c) a programmable circuit, coupled to the gate of the PFET, for pulling the PFET gate voltage high and low; and d) an NFET having a drain electrode coupled to the second node, the NFET gate having a channel region with a predetermined width and length that is shorted upon application of the programmable high voltage.
Claim 3
Dependent Claim 28 words
The integrated circuit of claim 1 further comprising: an integrated circuit input pad, coupled to the first node, for applying the programmable high voltage to the first node.
Claim 4
Dependent Claim 25 words
The integrated circuit of claim 1 wherein the NFET is shorted by the programmable high voltage creating a hot spot in the NFET channel region.
Claim 5
Dependent Claim 17 words
The integrated circuit of claim 1 wherein the source of the NFET is coupled to the gate.
Claim 6
Dependent Claim 19 words
The integrated circuit of claim 1 wherein the gate of the NFET is coupled through a diode to ground.
Claim 7
Dependent Claim 18 words
The integrated circuit of claim 1 wherein the gate of the NFET is coupled to a floating node.
Claim 8
Dependent Claim 19 words
The integrated circuit of claim 1 wherein the gate of the NFET is coupled to a second control circuit.
Claim 9
Dependent Claim 16 words
The integrated circuit of claim 1 wherein the gate of the NFET is coupled to ground.
Claim 10
Dependent Claim 16 words
The integrated circuit of claim 3 wherein the high voltage is between 6 to 9 volts.
Claim 11
Dependent Claim 14 words
The integrated circuit of claim 3 wherein the high voltage is about 6.5 volts.
Claim 12
Dependent Claim 22 words
The integrated circuit of claim 10 wherein the NFET channel width is about 10 μm and channel length is about 0.5 μm.

References Cited (Backward Citations)

US5019878A Cited
US5293133A Cited
US5450030A Cited
US5486776A Cited
US5672994A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-06-29 2001-12-29 2002-06-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-06-29 2005-12-29 2006-06-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-06-29 2009-12-29 2010-06-30 $7700.00 Window Closed / Lapsed

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