Magnetic disk apparatus having inspection function of recording medium and method of inspecting recording medium in magnetic disk apparatus

Claim 2

A magnetic disk apparatus connected to a host system, comprising: a plurality of magnetic disks; means for positioning a magnetic head at an arbitrary position on each said magnetic disk to perform write/read processing of data; idling detection means for detecting an idling state of said magnetic disk apparatus; a nonvolatile memory; defect detection means for, when the idling state of said magnetic disk apparatus is detected by said idling detection means, sequentially detecting the presence/absence of defects in said plurality of magnetic disks in units of bits from the addresses stored in said nonvolatile memory; substitute processing means for performing processing in which, when a defect is detected by said defect detection means and a defect quantity level is calculated, an area corresponding to a detected defect having a level higher than a predetermined level is assigned to a substitute area; means for, when the defect is detected by said defect detection means, calculating the defect quantity level and storing a location of the detected defect in said nonvolatile memory as a defect location map when the defect quantity level is lower than or equal to the predetermined level; means for analyzing locations of the defect in units of at least one of disks and heads by using said defect location map; means for outputting a warning signal to said host system in accordance with a result of said analyzing means; means for calculating a formation rate of defects detected by said defect detection means, and storing the defect formation rate in said nonvolatile memory; determination means for checking, on the basis of the defect formation rate stored in said nonvolatile memory, whether the number of defects increases; and means for outputting a warning signal to said host system when said determination means determines that the number of defects increases.

Claim 3

An apparatus according to claim 1, wherein said defect detection means includes: interrupt means for interrupting sequentially detection by said defect detection means in response to the command sent from said host system, and storage means for storing an access address into said nonvolatile memory during interruption in response to interruption of the sequentially detection caused by said interrupt means.

Claim 4

An apparatus according to claim 1, wherein said defect detection means includes: interrupt means for interrupting sequentially detection by said defect detection means in response to the command sent from said host system: and storage means for storing an access address into an arbitrary magnetic disk of said plurality of magnetic disks during interruption in response to interruption of the sequentially detection caused by said interrupt means.

Claim 5

An apparatus according to claim 1, wherein said defect detection means includes formation means for forming defect address information on said magnetic disk by using the access address on said magnetic disk when it is determined that the information is not properly read out.

Claim 6

An apparatus according to claim 4, wherein said formation means stores the defect address information in said nonvolatile memory.

Claim 7

An apparatus according to claim 4, wherein said formation means stores the defect address information in an arbitrary one magnetic disk of said plurality of magnetic disks.

Claim 8

An apparatus according to claim 4, wherein said formation means includes means for, when it is determined that the information is not properly read out and the access address on an accessed one of said magnetic disks is registered in the defect address information, updating information corresponding to the registered access address.

Claim 9

A magnetic disk apparatus according to claim 1, further comprising: interrupt means for interrupting said defect detection means in response to a command from said host system to store an address during interruption in said nonvolatile memory.

Claim 10

An apparatus according to claim 1, wherein said substitute processing means includes means for, when the defect quantity level detected by said defect detection means is lower than a predetermined level, forming defect information including a data length of the detected defect and the number of defects.

Claim 11

An apparatus according to claim 1, further comprising means for outputting a warning signal to said host system when the number of defects detected by said defect detection means is not lower than a predetermined number.

Claim 12

An apparatus according to claim 10, wherein said warning means checks in each of said plurality of disks whether the number of defects detected by said defect detection means is not lower than the predetermined number, and outputs a warning signal to said host system when the number of detected defects is not lower than the predetermined number.

Claim 13

An apparatus according to claim 1, wherein the defect quantity level corresponds to a number of retries required to read a data block containing said defects.

Claim 14

An inspection method in a magnetic disk apparatus connected to a host system and having a plurality of magnetic disks, means for positioning a magnetic head at an arbitrary position on each of said magnetic disks to perform write/read processing of data, and a nonvolatile memory for storing an address on said magnetic disk, comprising the steps of: a) detecting an idling state of said magnetic disk apparatus; b) when the idling state of said magnetic disk apparatus is detected in the step a), sequentially detecting the presence/absence of defects in said plurality of magnetic disks in units of bits from the address stored in said nonvolatile memory; c) when a defect is detected in the step b), calculating a defect quantity level and assigning an area corresponding to a detected defect having the defect quantity level higher than a predetermined level to a substitute area; d) interrupting the step b) in response to a command from said host system to store an address during interruption in said nonvolatile memory; e) when a defect is detected in the step b). calculating the defect quantity level and storing a location of the detected defect in said nonvolatile memory as a defect location map when the defect quantity level detected is lower than or equal to the predetermined level; f) analyzing locations of the detect in units of at least one of disks and heads by using said defect location map; g) outputting a warning signal to said host system in accordance with a result of analyzing in the step f); h) calculating a formation rate of detected defects by said defect detection means, and storing the defect formation rate in said nonvolatile memory; i) checking, on the basis of the defect formation rate stored in said nonvolatile memory, whether the number of defects increases; and j) outputting a warning signal to said host system when it is determined, in the step g), that the number of defects increases.

Claim 15

An inspection method in a magnetic disk apparatus connected to a host system and having a plurality of magnetic disks, means for positioning a magnetic head at an arbitrary position on each of said magnetic disks to perform write/read processing of data, and a nonvolatile memory for storing an address on said magnetic disk, comprising the steps of: a) detecting an idling state of said magnetic disk apparatus; b) when the idling state of said magnetic disk apparatus is detected in the step a), sequentially detecting the presence/absence of defects in said plurality of magnetic disks in units of bits from the address stored in said nonvolatile memory; c) when a defect is detected in the step b), calculating a defect quantity level and assigning an area corresponding to a detected defect having the defect quantity level higher than a predetermined level to a substitute area; d) interrupting the step b) in response to a command from said host system to store an address during interruption in said nonvolatile memory; e) when a defect is detected in the step b). calculating the defect quantity level and storing a location of the detected defect in said nonvolatile memory as a defect location map when the defect quantity level detected is lower than or equal to the predetermined level; f) analyzing locations of the detect in units of at least one of disks and heads by using said defect location map; g) outputting a warning signal to said host system in accordance with a result of analyzing in the step f); h) calculating a formation rate of detected defects by said defect detection means, and storing the defect formation rate in said nonvolatile memory; i) checking, on the basis of the defect formation rate stored in said nonvolatile memory, whether the number of defects increases; and j) outputting a warning signal to said host system when it is determined, in the step g), that the number of defects increases.

Claim 16

A method according to claim 13, wherein the step e includes the step of, when the defect quantity level detected in the step b is lower than or equal to the predetermined level, forming defect information including a data length of the detected defect and the number of defects.

Claim 17

A method according to claim 13, further comprising the step of: k) when the number of detected defects in the step b is not lower than a predetermined number, outputting a warning signal to said host system.

Claim 18

A method according to claim 15, wherein, in the step k), it is checked, in each magnetic disk of said plurality of magnetic disks, whether the number of detected defects in the step b) is larger than the predetermined number, and outputting the warning signal to said host system when the number of detected defects is not lower than the predetermined number.

Claim 19

A method according to claim 13, wherein the step c) of calculating the defect quantity level further include the step of determining the number of retries needed to read the data block containing said defects.

Claim 20

A method according to claim 13, wherein the step e) of calculating the defect quantity level further include the step of determining the number of retries needed to read the data block containing said defects.