NDIR gas sensor

Claim 2

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates; d. a light source integrally formed on one of the substrates and positioned at one end of the optical waveguide; e. a light detector integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical path between the light source and light detector; g. a pair of windows interposed in the optical path between the light source and light detector so as to define therebetween a sample chamber within the waveguide and thermally isolate the light source and light detector, the pair of windows being micromachined from one of the semiconductor material substrates, and wherein the sample chamber extends along an indirect path; and h. means for permitting diffusion of gas into and out of the sample chamber.

Claim 3

An NDIR gas sensor according to claim 1, wherein the light source and light detector are fabricated on the same substrate.

Claim 4

An NDIR gas sensor according to claim 1, wherein at least a portion of the walls of the optical waveguide are metallized to improve internal reflectivity of the waveguide.

Claim 5

An NDIR gas sensor according to claim 1, further comprising means for heating the walls of the optical waveguide to a temperature above the dew point of the gas in the sample chamber.

Claim 6

An NDIR gas sensor according to claim 1, wherein the light detector is an infrared detector selected from the group consisting of Platinum Silicide Schottky photodiode, bolometer, infrared tunnel sensor, thermocouple, and thermopile.

Claim 7

An NDIR gas sensor according to claim 1, further comprising: a. a source driver for energizing the source at a preset frequency; and b. signal processing electronics for converting the electrical output produced by the detector into a signal which represents the concentration of the gas being measured.

Claim 8

An NDIR gas sensor according to claim 1, wherein the means for permitting gas to diffuse into and out of the space within the sample chamber comprises at least one aperture in a wall of the sample chamber.

Claim 9

An NDIR gas sensor according to claim 1, wherein the means for permitting gas to diffuse into and out of the sample chamber comprises: a. a plurality of apertures in at least one wall of the sample chamber; and b. a gas permeable layer covering the plurality of apertures.

Claim 10

An NDIR gas sensor according to claim 8, wherein the gas permeable layer is made from a dielectric selected from the group consisting of TFE fluorocarbon polymers, polyimide, silicon oxide, and silicon nitride.

Claim 11

An NDIR gas sensor according to claim 8, wherein the gas permeable layer prevents particles larger than 0.1 μm from entering the sample chamber within the optical waveguide.

Claim 12

An NDIR gas sensor according to claim 1, further comprising: a. a plurality of light detectors integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; b. a plurality of bandpass filters, wherein each bandpass filter passes a different range of wavelengths and is interposed between the light source and one of the plurality of light detectors.

Claim 13

An NDIR gas sensor according to claim 11, wherein at least one of the plurality of bandpass filters is designed to pass a neutral wavelength.

Claim 14

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates; d. a light source integrally formed on one of the substrates and positioned at one end of the optical waveguide; e. a light detector integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical oath between the light source and light detector; g. a pair of windows interposed in the optical path between the light source and light detector so as to define therebetween a sample chamber within the waveguide and thermally isolate the light source and light detector, wherein the sample chamber extends along an indirect path; h. means for permitting diffusion of gas into and out of the sample chamber; and i. means for sensing the humidity level in the optical waveguide sample chamber.

Claim 15

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates; d. a light source integrally formed on one of the substrates and positioned at one end of the optical waveguide; e. a light detector integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical oath between the light source and light detector; g. a pair of windows interposed in the optical path between the light source and light detector so as to define therebetween a sample chamber within the waveguide and thermally isolate the light source and light detector, wherein the sample chamber extends along an indirect path; h. means for permitting diffusion of gas into and out of the sample chamber; and i. means for sensing the humidity level in the optical waveguide sample chamber.

Claim 16

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates; d. a light source integrally formed on one of the substrates and positioned at one end of the optical waveguide; e. a light detector integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical path between the light source and light detector; g. a pair of windows interposed in the optical path between the light source and light detector so as to define therebetween a sample chamber within the waveguide and thermally isolate the light source and light detector, wherein the sample chamber extends along an indirect path; h. means for permitting diffusion of gas into and out of the sample chamber; and i. means for detecting the pressure level within the optical waveguide sample chamber.

Claim 17

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates; d. a light source integrally formed on one of the substrates and positioned at one end of the optical waveguide; e. a light detector integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical path between the light source and light detector; g. a pair of windows interposed in the optical path between the light source and light detector so as to define therebetween a sample chamber within the waveguide and thermally isolate the light source and light detector, wherein the sample chamber extends along an indirect path; h. means for permitting diffusion of gas into and out of the sample chamber; and i. means for detecting the pressure level within the optical waveguide sample chamber.

Claim 18

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates; d. a light source integrally formed on one of the substrates and positioned at one end of the optical waveguide; e. a light detector integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical path between the light source and light detector; g. a first and a second window disposed in the waveguide between the light source and light detector, the first window and second window being micromachined from one of the semiconductor material substrates; h. a sample chamber interposed between the first and second windows in the optical waveguide, the sample chamber extending along an indirect path between the first and second windows; and i. at least one aperture in the wall of the sample chamber.

Claim 19

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates; d. a light source integrally formed on one of the substrates and positioned at one end of the optical waveguide; e. a light detector integrally formed on one of the substrates and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical path between the light source and light detector; g. a first and a second window disposed in the waveguide between the light source and light detector, the first window and second window being micromachined from one of the semiconductor material substrates; h. a sample chamber interposed between the first and second windows in the optical waveguide, the sample chamber extending along an indirect path between the first and second windows; and i. at least one aperture in the wall of the sample chamber.

Claim 20

An improved NDIR gas sensor, comprising: a. a first silicon substrate; b. a second silicon substrate attached to the first silicon substrate; c. an optical waveguide formed between the first and second silicon substrates; d. a black body light source integrally formed on the first silicon substrate and positioned at one end of the optical waveguide; e. an infrared light detector integrally formed on the first silicon substrate and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical path between the light source and light detector; g. a pair of optically transparent silicon windows interposed in the optical path between the light source and light detector so as to define therebetween a sample chamber within the waveguide and thermally isolate the light source and light detector from the sample gas, the sample chamber extending along an indirect path between the light source and light detector; h. a plurality of apertures in at least one wall of the sample chamber; i. a gas permeable layer covering the plurality of apertures to prevent particles larger than 0.1 μm from entering the sample chamber; j. a source driver for energizing the source at a preset frequency; and k. signal processing electronics for converting the electrical output produced by the detector into a signal which represents the concentration of the gas being measured.

Claim 21

An improved NDIR gas sensor, comprising: a. a first silicon substrate; b. a second silicon substrate attached to the first silicon substrate; c. an optical waveguide formed between the first and second silicon substrates; d. a black body light source integrally formed on the first silicon substrate and positioned at one end of the optical waveguide; e. an infrared light detector integrally formed on the first silicon substrate and positioned at the end of the optical waveguide opposite the light source; f. a bandpass filter interposed in the optical path between the light source and light detector; g. a pair of optically transparent silicon windows interposed in the optical path between the light source and light detector so as to define therebetween a sample chamber within the waveguide and thermally isolate the light source and light detector from the sample gas, the sample chamber extending along an indirect path between the light source and light detector; h. a plurality of apertures in at least one wall of the sample chamber; i. a gas permeable layer covering the plurality of apertures to prevent particles larger than 0.1 μm from entering the sample chamber; j. a source driver for energizing the source at a preset frequency; and k. signal processing electronics for converting the electrical output produced by the detector into a signal which represents the concentration of the gas being measured.

Claim 22

An improved NDIR gas sensor, comprising: a. a semiconductor material substrate; b. an optical waveguide formed within the substrate, the optical waveguide comprising a source chamber, a detector chamber and a sample chamber, the source and detector chambers separated from the sample chamber by a first and a second window, respectively, and the source and detector chambers being located on the same end of the optical waveguide; c. a light source integrally formed on the substrate in the source chamber; d. a light detector integrally formed on the substrate in the detector chamber; e. a bandpass filter interposed in the optical path between the light source and light detector; f. at least one aperture in a wall of the sample chamber, wherein light from the source is reflected off at least one wall of the sample chamber before reaching the detector.

Claim 23

An improved NDIR gas sensor, comprising: a. a semiconductor material substrate; b. an optical waveguide formed within the substrate, the optical waveguide comprising a source chamber, a detector chamber and a sample chamber, the source and detector chambers separated from the sample chamber by a first and a second window, respectively, and the source and detector chambers being located on the same end of the optical waveguide; c. a light source integrally formed on the substrate in the source chamber; d. a light detector integrally formed on the substrate in the detector chamber; e. a bandpass filter interposed in the optical path between the light source and light detector; f. at least one aperture in a wall of the sample chamber, wherein light from the source is reflected off at least one wall of the sample chamber before reaching the detector.

Claim 24

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates, the optical waveguide comprising a source chamber, a detector chamber and a sample chamber, wherein the source and detector chambers are separated from the sample chamber by a first and second window, respectively, the first window and second window are micromachined from one of the semiconductor material substrates, and the source and detector chambers are located on the same end of the optical waveguide; d. a light source integrally formed on one of the substrates in the source chamber; e. a light detector integrally formed on one of the substrates in the detector chamber; f. a bandpass filter interposed in the optical path between the light source and light detector; and g. at least one aperture in a wall of the sample chamber, wherein light from the source is reflected off at least one wall of the sample chamber before reaching the detector.

Claim 25

An improved NDIR gas sensor, comprising: a. a first semiconductor material substrate; b. a second semiconductor material substrate attached to the first substrate; c. an optical waveguide formed between the first and second substrates, the optical waveguide comprising a source chamber, a detector chamber and a sample chamber, wherein the source and detector chambers are separated from the sample chamber by a first and second window, respectively, the first window and second window are micromachined from one of the semiconductor material substrates, and the source and detector chambers are located on the same end of the optical waveguide; d. a light source integrally formed on one of the substrates in the source chamber; e. a light detector integrally formed on one of the substrates in the detector chamber; f. a bandpass filter interposed in the optical path between the light source and light detector; and g. at least one aperture in a wall of the sample chamber, wherein light from the source is reflected off at least one wall of the sample chamber before reaching the detector.