Abstract A portable integrated circuit die testing system that offers a cost-effective solution for electrically testing bare, unpackaged, integrated circuit chips or die. The system provides for direct electrical interconnection of die of various sizes and thicknesses to an automatic tester without wire bonding or packaging of the semiconductor chip or die. The system includes an X-Y table that is adjustable in horizontal X and Y directions. A contact platform is disposed above the X-Y table that has an opening therein, and is movable in a vertical direction relative to the X-Y table. An adjustment member is coupled to the contact platform for finely adjusting the movement thereof in the vertical direction. A die holder is secured to the X-Y table for holding the die that is to be tested, and in response to movement of the X-Y table. A vacuum connection is provided for drawing a vacuum on the tested die to secure it in the die holder. A probe flexible printed circuit is secured to the contact platform that extends into the opening in the contact platform and includes a plurality of bumps that mate with contact pads on the die. An interface flexible printed circuit is coupled between the probe flexible printed circuit and the automated test equipment. A microscope is used to align the bumps of the printed circuit to the contact pads on the die, which completes an electrical path between the die and the automated test equipment.
A testing system for connecting an integrated circuit die having a plurality of contact pads to automated test equipment, said testing system comprising: a base plate; an X-Y table secured directly to the base plate that is adjustable in horizontal X and Y directions relative to the base plate; a die holder secured to the X-Y table for securing the die that is to be tested to the X-Y table, which die holder is movable in response to movement of the X-Y table; vacuum means connected to the die holder for drawing a vacuum on the tested die to secure the die to the die holder; a contact platform disposed above the X-Y table that has an opening therein, and wherein the contact platform is movable in a vertical direction relative to the X-Y table; adjustment means coupled to the contact platform for finely adjusting the movement of the contact platform in the vertical direction; a probe flexible printed circuit secured to the contact platform that extends into the opening in the contact platform and that includes a plurality of bumps that are designed to mate with contact pads on the die; an interface flexible printed circuit coupled at a first end by means of a plurality of bumps to the probe flexible printed circuit and at a second end to the automated test equipment; and a microscope disposed above the contact platform for aligning the bumps of the printed circuit to the contact pads on the die.
Claim 2
Dependent Claim
248 words
A testing system for connecting an integrated circuit die having a plurality of contact pads to automated test equipment, said testing system comprising: a base plate; an X-Y table secured directly to the base plate that is adjustable in horizontal X and Y directions relative to the base plate; a die holder secured to the X-Y table for securing the die that is to be tested to the X-Y table, which die holder is movable in response to movement of the X-Y table; vacuum means connected to the die holder for drawing a vacuum on the tested die to secure the die to the die holder; a contact platform disposed above the X-Y table that has an opening therein, and wherein the contact platform is movable in a vertical direction relative to the X-Y table; adjustment means coupled to the contact platform for finely adjusting the movement of the contact platform in the vertical direction; a probe flexible printed circuit secured to the contact platform that extends into the opening in the contact platform and that includes a plurality of bumps that are designed to mate with contact pads on the die; an interface flexible printed circuit coupled at a first end by means of a plurality of bumps to the probe flexible printed circuit and at a second end to the automated test equipment; and a microscope disposed above the contact platform for aligning the bumps of the printed circuit to the contact pads on the die.
Claim 3
Dependent Claim
12 words
The system of claim 1 wherein the adjustment means comprises a micrometer.
Claim 4
Dependent Claim
18 words
The system of claim 1 wherein the microscope comprises a vertically adjustable microscope coupled to the base plate.
Claim 5
Dependent Claim
26 words
The system of claim 1 wherein the interface flexible printed circuit further comprises a connector that mates with a corresponding connector on the automated test equipment.
Claim 6
Dependent Claim
38 words
The system of claim 1 further comprising a clear robber member that presses on the probe flexible printed circuit to insure contact between the bumps of the probe flexible printed circuit and the contact pads on the die.
Claim 7
Dependent Claim
14 words
The system of claim 1 wherein the die holder comprises a removable vacuum chuck.
Claim 8
Dependent Claim
22 words
The system of claim 1 wherein X and Y movements of the X-Y table are precisely controlled by two orthogonal thumbwheel screws.
Claim 9
Dependent Claim
24 words
The system of claim 1 wherein the die holder comprises grooves machined therein to distribute hold-down pressure evenly over the surface of the die.