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US5730802A Expired / Lapsed US ⏱️ 0.0 years remaining

Vapor growth apparatus and vapor growth method capable of growing good productivity

Assignee: Sharp Corp
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Filing: 1996-12-27
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Granted: 1998-03-24
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Expires: 2016-12-27
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Abstract

Abstract A vapor growth apparatus and a vapor growth method is capable of growing a compound semiconductor layer having an evenness and an interfacial sharpness in units of atomic layers with a good productivity. A growth chamber has a cylindrical portion and an end plate which closes an upstream end of the cylindrical portion. The end plate is provided with a cation gas material supply inlet and an anion material gas supply inlet, while an exhaust device is provided on the downstream side of the cylindrical portion. A substrate holder having a substrate support surface is provided in the cylinder portion. A gas separating member separates flow paths of material gases from each other, thereby forming on the substrate support surface a plurality of material gas supply areas to which the material gases are independently supplied. A drive device rotates the substrate holder with a substrate set on the substrate support surface thereof around the center line of the cylindrical portion. Then a cation material and an anion material gas are alternately supplied to the surface of the substrate.

Inventors

  • 👤 Takashi Ishizumi
  • 👤 Shinji Kaneiwa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 01:48
CPC Classifications
C; C30; C30B; C30B25/00; C23; C23C; C23C16/00; C23C16/44; C23C16/455; C23C16/45587; C23C16/45591; C23C16/22; C23C16/30; C23C16/301; C23C16/303; C23C16/45523; C23C16/45525; C23C16/45544; C23C16/45548; C23C16/45551; C23C16/458; C23C16/4582; C30B25/02; C30B25/14; C30B29/00; C30B29/10; C30B29/40; C30B29/403; C30B29/406

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 268 words
A vapor growth apparatus for growing a compound semiconductor layer on a surface of a substrate maintained at a specified temperature in a growth chamber by alternately supplying a cation material gas and an anion material gas and reacting the gases, wherein the growth chamber has a cylindrical portion which extends in a direction from an upstream side to a downstream side and an end plate which closes an upstream end portion of the cylindrical portion, the end plate has in specified portions thereof a material gas supply inlet for supplying the cation material gas into the cylindrical portion and a material gas supply inlet for supplying the anion material gas into the cylindrical portion, and further comprising exhaust means for discharging gas inside the cylindrical portion from a downstream side of the cylindrical portion, a substrate holder provided between the upstream side and the downstream side of the cylindrical portion and having a substrate holding surface. gas separation means for forming a plurality of material gas supply areas where the material gases are independently supplied to the substrate holding surface by separating flow paths of the material gases extending from the material gas supply inlets to the substrate holding surface, and drive means for rotating the substrate holder with the substrate set on the substrate holding surface around a center line of the cylindrical portion, wherein the substrate holder has a cylindrical outer surface centered about the center line and a non-cylindrical interior surface whereby the substrate holder has a polygonal transverse section, the substrate holding surface being provided on the interior surface of the substrate holder.
Claim 2
Dependent Claim 268 words
A vapor growth apparatus for growing a compound semiconductor layer on a surface of a substrate maintained at a specified temperature in a growth chamber by alternately supplying a cation material gas and an anion material gas and reacting the gases, wherein the growth chamber has a cylindrical portion which extends in a direction from an upstream side to a downstream side and an end plate which closes an upstream end portion of the cylindrical portion, the end plate has in specified portions thereof a material gas supply inlet for supplying the cation material gas into the cylindrical portion and a material gas supply inlet for supplying the anion material gas into the cylindrical portion, and further comprising exhaust means for discharging gas inside the cylindrical portion from a downstream side of the cylindrical portion, a substrate holder provided between the upstream side and the downstream side of the cylindrical portion and having a substrate holding surface. gas separation means for forming a plurality of material gas supply areas where the material gases are independently supplied to the substrate holding surface by separating flow paths of the material gases extending from the material gas supply inlets to the substrate holding surface, and drive means for rotating the substrate holder with the substrate set on the substrate holding surface around a center line of the cylindrical portion, wherein the substrate holder has a cylindrical outer surface centered about the center line and a non-cylindrical interior surface whereby the substrate holder has a polygonal transverse section, the substrate holding surface being provided on the interior surface of the substrate holder.

References Cited (Backward Citations)

US3785853A Cited
US4058430A Cited
GB1526694A Cited
EP0015390A1 Cited
US4480585A Cited
EP0175030A2 Cited
JPS6226811A Cited
US4986214A Cited
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US5338362A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-03-23 2001-09-22 2002-03-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-03-23 2005-09-22 2006-03-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-03-23 2009-09-22 2010-03-24 $7700.00 Window Closed / Lapsed

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