US5712855A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for testing and measuring electronic device and method of calibrating its timing and voltage level
Assignee: Advantest Singapore Pte Ltd
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Filing: 1993-10-29
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Granted: 1998-01-27
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Expires: 2013-10-29
Abstract
Abstract The present invention is intended to provide a testing and measuring apparatus for accurately and quickly calibrating the input and output timing of a plurality of test signal patterns and voltage levels. The invention also offers a method used for the calibration. The apparatus is equipped with a plurality of units (timing vector generators) each having a timing-generating circuit (a capture timing generator) and an external common reference timing circuit (a golden edge generator) outside the units. Each unit comprises: (1) a timing comparator circuit (a capture comparator) for comparing the timing each of the timing-generating circuits with the timing of the reference timing circuit to determine whether the former timing leads or lags the latter timing; and (2) a counter circuit which counts a number of comparisons made by the comparator circuit until their sequential relation has been reversed.
Inventors
- 👤 Masaharu Goto
- 👤 Kenichi Ito
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 21:50
CPC Classifications
G; G01; G01R; G01R35/00; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31903; G01R31/31908; G01R31/3191
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
192 words
An apparatus for calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the apparatus comprising: (a) at least one reference timing circuit for providing a reference timing signal for the units; (b) at least one sequencer for varying a phase of the timing signal in a stepwise fashion by a predefined time step; (c) a plurality of timing comparing circuits each located in corresponding one of the units for comparing the timing signal and the reference timing signal so as to determine a sequence of the timing signal and the reference timing signal whenever the sequencer varies the phase of the timing signals; (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the timing comparing circuit until the sequence of the timing signal and the reference timing signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating timing of the units according to the data.
Claim 2
Independent Claim
192 words
An apparatus for calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the apparatus comprising: (a) at least one reference timing circuit for providing a reference timing signal for the units; (b) at least one sequencer for varying a phase of the timing signal in a stepwise fashion by a predefined time step; (c) a plurality of timing comparing circuits each located in corresponding one of the units for comparing the timing signal and the reference timing signal so as to determine a sequence of the timing signal and the reference timing signal whenever the sequencer varies the phase of the timing signals; (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the timing comparing circuit until the sequence of the timing signal and the reference timing signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating timing of the units according to the data.
Claim 3
Independent Claim
193 words
An apparatus for calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the apparatus comprising: (a) at least one reference timing circuit for providing a reference timing signal for the units; (b) at least one sequencer for varying a phase of the reference timing signal in a stepwise fashion by a predefined time step; (c) a plurality of timing comparing circuits each located in corresponding one of the units for comparing the timing signal and the reference timing signal so as to determine a sequence of the timing signal and the reference timing signal whenever the sequencer varies the phase of the timing signals; (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the timing comparing circuit until the sequence of the timing signal and the reference timing signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating timing of the units according to the data.
Claim 4
Independent Claim
193 words
An apparatus for calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the apparatus comprising: (a) at least one reference timing circuit for providing a reference timing signal for the units; (b) at least one sequencer for varying a phase of the reference timing signal in a stepwise fashion by a predefined time step; (c) a plurality of timing comparing circuits each located in corresponding one of the units for comparing the timing signal and the reference timing signal so as to determine a sequence of the timing signal and the reference timing signal whenever the sequencer varies the phase of the timing signals; (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the timing comparing circuit until the sequence of the timing signal and the reference timing signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating timing of the units according to the data.
Claim 5
Independent Claim
137 words
A method of calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the electronic circuit tester has at least one reference timing circuit providing a reference timing signal for the units, comprising the steps of: (a) varying a phase of each of the timing signals concurrently and stepwise by a predefined time step; (b) determining a sequence of the timing signal and the reference timing signal in each of the units whenever the phase of each of the timing signals changes; (c) counting a number of determining of the sequence in each of the units until the sequence is reversed; and (d) calibrating timing of the plurality of units according to the counted number of the determining of the sequence.
Claim 6
Independent Claim
137 words
A method of calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the electronic circuit tester has at least one reference timing circuit providing a reference timing signal for the units, comprising the steps of: (a) varying a phase of each of the timing signals concurrently and stepwise by a predefined time step; (b) determining a sequence of the timing signal and the reference timing signal in each of the units whenever the phase of each of the timing signals changes; (c) counting a number of determining of the sequence in each of the units until the sequence is reversed; and (d) calibrating timing of the plurality of units according to the counted number of the determining of the sequence.
Claim 7
Independent Claim
134 words
A method of calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the electronic circuit tester has at least one reference timing circuit providing a reference timing signal for the units, comprising the steps of: (a) varying a phase of the reference timing signal stepwise by a predefined time step; (b) determining a sequence of the timing signal and the reference timing signal in each of the units whenever the phase of each of the timing signals changes; (c) counting a number of determining of the sequence in each of the units until the sequence is reversed; and (d) calibrating timing of the plurality of units according to the counted number of the determining of the sequence.
Claim 8
Independent Claim
134 words
A method of calibrating timing of a plurality of units of an electronic circuit tester, each of the units having a timing generating circuit for generating a timing signal, the electronic circuit tester has at least one reference timing circuit providing a reference timing signal for the units, comprising the steps of: (a) varying a phase of the reference timing signal stepwise by a predefined time step; (b) determining a sequence of the timing signal and the reference timing signal in each of the units whenever the phase of each of the timing signals changes; (c) counting a number of determining of the sequence in each of the units until the sequence is reversed; and (d) calibrating timing of the plurality of units according to the counted number of the determining of the sequence.
Claim 9
Independent Claim
195 words
An apparatus for calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the apparatus comprising: (a) at least one reference voltage circuit for providing a reference voltage signal for the units; (b) at least one sequencer for varying the voltage level of the voltage signal in a stepwise fashion by a predefined voltage step; (c) a plurality of voltage comparing circuits each located in corresponding one of the units for comparing the voltage signal and the reference voltage signal so as to determine a relationship in magnitude between the voltage signal whenever the sequencer varies the voltage of the voltage signals; and (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the voltage comparing circuit until the relationship in magnitude between the voltage signal and the reference voltage signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating voltage levels of the units according to the data.
Claim 10
Independent Claim
195 words
An apparatus for calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the apparatus comprising: (a) at least one reference voltage circuit for providing a reference voltage signal for the units; (b) at least one sequencer for varying the voltage level of the voltage signal in a stepwise fashion by a predefined voltage step; (c) a plurality of voltage comparing circuits each located in corresponding one of the units for comparing the voltage signal and the reference voltage signal so as to determine a relationship in magnitude between the voltage signal whenever the sequencer varies the voltage of the voltage signals; and (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the voltage comparing circuit until the relationship in magnitude between the voltage signal and the reference voltage signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating voltage levels of the units according to the data.
Claim 11
Independent Claim
201 words
An apparatus for calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the apparatus comprising: (a) at least one reference voltage circuit for providing a reference voltage signal for the units; (b) at least one sequencer for varying the voltage level of the reference voltage signal in a stepwise fashion by a predefined voltage step; (c) a plurality of voltage comparing circuits each located in corresponding one of the units for comparing the voltage signal and the reference voltage signal so as to determine a relationship in magnitude between the voltage signal and the reference voltage signal whenever the sequencer varies the voltage of the voltage signals; and (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the voltage comparing circuit until the relationship in magnitude between the voltage signal and the reference voltage signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating voltage levels of the units according to the data.
Claim 12
Independent Claim
201 words
An apparatus for calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the apparatus comprising: (a) at least one reference voltage circuit for providing a reference voltage signal for the units; (b) at least one sequencer for varying the voltage level of the reference voltage signal in a stepwise fashion by a predefined voltage step; (c) a plurality of voltage comparing circuits each located in corresponding one of the units for comparing the voltage signal and the reference voltage signal so as to determine a relationship in magnitude between the voltage signal and the reference voltage signal whenever the sequencer varies the voltage of the voltage signals; and (d) a plurality of counter circuits each located in corresponding one of the units for counting a number of comparisons made by the voltage comparing circuit until the relationship in magnitude between the voltage signal and the reference voltage signal is reversed; and (e) a controller connected to the counter circuits for receiving data indicative of the number of comparisons from the counter circuits and calibrating voltage levels of the units according to the data.
Claim 13
Independent Claim
143 words
A method of calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the electronic circuit tester has at least one reference voltage generating circuit providing a reference voltage signal for the units, comprising the steps of: (a) varying a voltage level each of the voltage signals concurrently and stepwise by a predefined voltage time step; (b) determining a relationship in magnitude between the voltage signal and the reference voltage signal in each of the units whenever the voltage of each of the voltage signals changes; (c) counting a number of determining of the relationship in each of the units until the relationship is reversed; and (d) calibrating voltage levels of the plurality of units according to the counted number of the determining of the relationship.
Claim 14
Independent Claim
143 words
A method of calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the electronic circuit tester has at least one reference voltage generating circuit providing a reference voltage signal for the units, comprising the steps of: (a) varying a voltage level each of the voltage signals concurrently and stepwise by a predefined voltage time step; (b) determining a relationship in magnitude between the voltage signal and the reference voltage signal in each of the units whenever the voltage of each of the voltage signals changes; (c) counting a number of determining of the relationship in each of the units until the relationship is reversed; and (d) calibrating voltage levels of the plurality of units according to the counted number of the determining of the relationship.
Claim 15
Independent Claim
139 words
A method of calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the electronic circuit tester has at least one reference voltage generating circuit providing a reference voltage signal for the units, comprising the steps of: (a) varying a voltage of the reference voltage signal stepwise by a predefined voltage step; (b) determining a relationship in magnitude between the voltage signal and the reference voltage signal in each of the units whenever the voltage of each of the voltage signals changes; (c) counting a number of determining of the relationship in each of the units until the relationship is reversed; and (d) calibrating voltage levels of the plurality of units according to the counted number of the determining of the relationship.
Claim 16
Independent Claim
139 words
A method of calibrating voltage levels of a plurality of units of an electronic circuit tester, each of the units having a voltage generating circuit for generating a voltage signal, the electronic circuit tester has at least one reference voltage generating circuit providing a reference voltage signal for the units, comprising the steps of: (a) varying a voltage of the reference voltage signal stepwise by a predefined voltage step; (b) determining a relationship in magnitude between the voltage signal and the reference voltage signal in each of the units whenever the voltage of each of the voltage signals changes; (c) counting a number of determining of the relationship in each of the units until the relationship is reversed; and (d) calibrating voltage levels of the plurality of units according to the counted number of the determining of the relationship.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-01-26 | 2001-07-28 | 2002-01-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-01-26 | 2005-07-28 | 2006-01-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-01-26 | 2009-07-28 | 2010-01-27 | $7700.00 | Window Closed / Lapsed |