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US5691230A Expired / Lapsed US ⏱️ 0.0 years remaining

Technique for producing small islands of silicon on insulator

Assignee: Micron Technology Inc
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Filing: 1996-09-04
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Granted: 1997-11-25
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Expires: 2016-09-04
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Abstract

Abstract Using sub-micron technology, silicon on insulator (SOI) rows and islands are formed in a silicon substrate. Trenches are directionally-etched in the silicon substrate, leaving rows of silicon between the trenches. Silicon nitride is then deposited over the trenches, extending partly down the sides of the trenches. An isotropic chemical etch is then used to partially undercut narrow rows of silicon in the substrate. A subsequent oxidation step fully undercuts the rows of silicon, isolating the silicon rows from adjacent active areas. Devices, such as transistors for CMOS and DRAMs, are then formed in active areas, wherein the active areas are defined on the silicon rows by LOCal Oxidation of Silicon (LOCOS).

Inventors

  • 👤 Leonard Forbes

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 15:38
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/61; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0121; H10W10/0123; H10W10/061; H10W10/10; H10W10/13; H10W10/181; Y; Y10; Y10S; Y10S148/00; Y10S148/05

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 65 words
A method for manufacturing a silicon on insulator substrate, comprising the steps of: directionally etching a silicon substrate, to form a plurality of trenches between protruding silicon rows; forming a silicon nitride cap on the silicon rows, extending partway down the sides of the trenches; isotropically etching the trenches, to partially undercut the silicon rows; and oxidizing the substrate, to fully undercut the silicon rows.
Claim 2
Independent Claim 65 words
A method for manufacturing a silicon on insulator substrate, comprising the steps of: directionally etching a silicon substrate, to form a plurality of trenches between protruding silicon rows; forming a silicon nitride cap on the silicon rows, extending partway down the sides of the trenches; isotropically etching the trenches, to partially undercut the silicon rows; and oxidizing the substrate, to fully undercut the silicon rows.
Claim 3
Dependent Claim 23 words
The method of claim 1, wherein the silicon substrate has a {100} crystallographic orientation and the directional etch is in the <100> direction.
Claim 4
Dependent Claim 14 words
The method of claim 1, wherein the directional etchant comprises a reactive ion etch.
Claim 5
Dependent Claim 12 words
The method of claim 1, wherein the isotropic etchant comprises hydrofluoric acid.
Claim 6
Dependent Claim 18 words
The method of claim 1, wherein the silicon rows have a width dimension of one micron or less.
Claim 7
Dependent Claim 18 words
The method of claim 1, wherein the silicon rows have a width dimension of 0.25 microns or less.
Claim 8
Dependent Claim 31 words
The method of claim 1, wherein the directional etch is approximately as deep as the width of the silicon rows and approximately as wide as the width of the silicon rows.
Claim 9
Dependent Claim 28 words
The method of claim 1, wherein the oxidizing step comprises oxidizing the substrate in a wet oxidizing ambient at a temperature of approximately 900 to 1,100 degrees Celsius.
Claim 10
Dependent Claim 26 words
The method of claim 1, and further comprising the step of: defining a plurality of active areas on the silicon rows by local oxidation of silicon.
Claim 11
Dependent Claim 23 words
The method of claim 9, and further comprising the step of: forming a transistor on each of a plurality of the active areas.

References Cited (Backward Citations)

US4437226A Cited
US4580331A Cited
US4604162A Cited
US4615746A Cited
US4561932A Cited
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US5391911A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-11-24 2001-05-26 2001-11-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-11-24 2005-05-26 2005-11-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-11-24 2009-05-26 2009-11-25 $7700.00 Window Closed / Lapsed

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