US5672966A
Expired / Lapsed
US
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High speed post-programming net packing method
Assignee: Xilinx Inc
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Filing: 1995-08-04
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Granted: 1997-09-30
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Expires: 2015-08-04
Abstract
Abstract A method and structure for verifying interconnect structure of an FPGA device after programming. In a preferred embodiment, after programming, a single wire segment on each net of a layout is pulled down to a low reference voltage. Voltage levels on all wire segments of the device are then captured and shifted out of the device for comparison to the expected values. Low voltage levels on segments expected to remain high reveal short circuit flaws. High voltage levels on segments expected to remain low reveal open circuit flaws. The test is conducted simultaneously on a group of packed nets, wherein each group comprises a number of disjoint nets separated from one another by at least two MicroVia™ interconnects. A preferred packing method minimizes the number of net groups on a device for maximum test efficiency.
Inventors
- 👤 Mikael Palczewski
- 👤 David P. Schultz
- 👤 F. Erich Goetting
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 02:04
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/02; H03K19/173; H03K19/1733; H03K19/1735; H03K19/1736; G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318516; G01R31/318519; H03K19/177; H03K19/17748; H03K19/17764; H03K19/1778; H03K19/17796
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
145 words
A method of verifying the connection layout of an array of conducting segments and programmable interconnects on an integrated circuit, said method comprising the steps of: programming a selected set of said programmable interconnects to connect selected ones of said segments; altering the voltage level at a first of said segments to a selected level; measuring the voltage levels at a selected plurality of said segments; verifying the accuracy of the connection layout by comparing the voltage levels at said plurality of segments to a set of voltage levels representing a desired connection layout for said selected plurality of segments, wherein said altering step is performed simultaneously on a second plurality of segments, and wherein each of said second plurality of segments is separated by at least two programmable interconnects from said first segment and from any other one of said second plurality of segments.
Claim 2
Independent Claim
145 words
A method of verifying the connection layout of an array of conducting segments and programmable interconnects on an integrated circuit, said method comprising the steps of: programming a selected set of said programmable interconnects to connect selected ones of said segments; altering the voltage level at a first of said segments to a selected level; measuring the voltage levels at a selected plurality of said segments; verifying the accuracy of the connection layout by comparing the voltage levels at said plurality of segments to a set of voltage levels representing a desired connection layout for said selected plurality of segments, wherein said altering step is performed simultaneously on a second plurality of segments, and wherein each of said second plurality of segments is separated by at least two programmable interconnects from said first segment and from any other one of said second plurality of segments.
Claim 3
Dependent Claim
88 words
The method of claim 1, wherein said second plurality of segments is derived from a grouping method comprising the steps of: defining a third plurality of segments as a first net; defining a fourth plurality of segments as a second net; comparing said first and second nets; determining if said first and second nets are separated by at least two programmable interconnects; merging said first and second nets into said second plurality of segments if said first and second nets are separated by at least two programmable interconnects.
Claim 4
Dependent Claim
34 words
The method of claim 1, further comprising the step of adjusting the voltage level at said plurality of segments to provide a contrast to said selected voltage level at said first of said segments.
Claim 5
Dependent Claim
24 words
The method of claim 1, wherein said altering step comprises reducing the voltage level at said first segment to below a selected threshold level.
Claim 6
Dependent Claim
24 words
The method of claim 1, wherein said altering step comprises increasing the voltage level at said first segment to above a selected threshold level.
Claim 7
Dependent Claim
32 words
The method of claim 1, further comprising the step of providing a plurality of monitoring units, each of said monitoring units electrically connected to a corresponding one of said plurality of segments.
Claim 8
Dependent Claim
98 words
The method of claim 6, wherein said monitoring units comprise configuration control units (CCUs) which comprise: memory means which may be loaded and read, said memory means providing a stored value; and means for controlling application of a testing voltage to a corresponding interconnect line, comprising: means for supplying a testing voltage to said corresponding interconnect line; means for controlling said means for supplying; whereby when said stored value is a selected voltage, and said means for controlling selects said stored value, said means for supplying a testing voltage supplies said testing voltage to said corresponding interconnect line.
Claim 9
Dependent Claim
15 words
The method of claim 1, wherein said integrated circuit comprises a field programmable gate array.
Claim 10
Dependent Claim
11 words
The method of claim 1, wherein said programmable interconnects comprise antifuses.
Claim 11
Dependent Claim
22 words
The method of claim 1, wherein any two of said programmable interconnects are separated by at least one of said conducting segments.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-09-29 | 2001-03-31 | 2001-09-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-09-29 | 2005-03-31 | 2005-09-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-09-29 | 2009-03-31 | 2009-09-30 | $7700.00 | Window Closed / Lapsed |