US5671175A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Capacitor over bitline DRAM cell
Assignee: Texas Instruments Inc
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Filing: 1996-06-26
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Granted: 1997-09-23
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Expires: 2016-06-26
Abstract
Abstract A DRAM array (100) having reduced bitline capacitance. The DRAM cell includes a pass transistor and a storage capacitor (150). An isolation structure (108) surrounds the DRAM cell. The bitline (140) is connected to a source/drain region (120b) of the pass transistor using a first polysilicon plug (112). A second polysilicon plug (110) connects the storage capacitor (150) to the other source/drain region (120a&c) of the pass transistor. Both polysilicon plugs (110, 112) extend through an interlevel dielectric layer (116) to one of the source/drain region (120a-c) of the pass transistor, but neither extends over the isolation structure (108). If desired, either the storage capacitor (150) or the bitline (140) may be offset from the source/drain regions (120a-c).
Inventors
- 👤 Jiann Liu
- 👤 Clarence W. Teng
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 10:54
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/30; H10B12/31; Y; Y10; Y10S; Y10S257/00; Y10S257/908
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
92 words
A DRAM cell comprising: a moat region; an isolating structure surrounding and defining said moat region; a pass transistor located in said moat region; an interlevel dielectric layer located above said pass transistor and said isolating structure; a first and a second doped polysilicon plug each extending through said interlevel dielectric layer to said moat region; and an offset connecting piece extending from said first doped polysilicon plug to over a portion of said isolating structure, wherein said offset connecting piece is separated from said isolating structure by said interlevel dielectric layer.
Claim 2
Dependent Claim
92 words
A DRAM cell comprising: a moat region; an isolating structure surrounding and defining said moat region; a pass transistor located in said moat region; an interlevel dielectric layer located above said pass transistor and said isolating structure; a first and a second doped polysilicon plug each extending through said interlevel dielectric layer to said moat region; and an offset connecting piece extending from said first doped polysilicon plug to over a portion of said isolating structure, wherein said offset connecting piece is separated from said isolating structure by said interlevel dielectric layer.
Claim 3
Dependent Claim
29 words
The DRAM cell of claim 1 further comprising a bitline offset from said moat region, said bitline connected to said first doped polysilicon plug by said offset connecting piece.
Claim 4
Dependent Claim
28 words
The DRAM cell of claim 2 further comprising a storage capacitor located above said moat region, wherein said storage capacitor is connected to said second doped polysilicon plug.
Claim 5
Dependent Claim
15 words
The DRAM cell of claim 2 wherein said bitline runs parallel to said moat region.
Claim 6
Dependent Claim
29 words
The DRAM cell of claim 1 further comprising a storage capacitor offset from said moat region and connected to said first doped polysilicon plug through said offset connecting piece.
Claim 7
Dependent Claim
23 words
The DRAM cell of claim 5, further comprising a bitline located above said moat region and connected to said second doped polysilicon plug.
Claim 8
Dependent Claim
15 words
The DRAM cell of claim 5 wherein said bitline runs parallel with said moat region.
Claim 9
Dependent Claim
140 words
A DRAM comprising an array of DRAM cell pairs, each DRAM cell pair comprising: a moat region; an isolating structure surrounding and defining said moat region; a first and a second pass transistor located in said moat region each having a wordline gate and a first source/drain region, wherein said first and second pass transistors share a common second source/drain region; an interlevel dielectric layer located above said first and second pass transistors and said isolating structure; three polysilicon plugs each extending through said interlevel dielectric layer to one of said first and second source/drain regions; and a first offset connecting piece extending from one of said three polysilicon plugs to over a portion of said isolating structure, wherein said offset connecting piece extends over said isolating structure and is separated from said isolating structure by said interlevel dielectric layer.
Claim 10
Dependent Claim
140 words
A DRAM comprising an array of DRAM cell pairs, each DRAM cell pair comprising: a moat region; an isolating structure surrounding and defining said moat region; a first and a second pass transistor located in said moat region each having a wordline gate and a first source/drain region, wherein said first and second pass transistors share a common second source/drain region; an interlevel dielectric layer located above said first and second pass transistors and said isolating structure; three polysilicon plugs each extending through said interlevel dielectric layer to one of said first and second source/drain regions; and a first offset connecting piece extending from one of said three polysilicon plugs to over a portion of said isolating structure, wherein said offset connecting piece extends over said isolating structure and is separated from said isolating structure by said interlevel dielectric layer.
Claim 11
Dependent Claim
28 words
The DRAM array of claim 8, further comprising a bitline, wherein said first offset connecting piece extends from a first of said three polysilicon plugs to said bitline.
Claim 12
Dependent Claim
25 words
The DRAM array of claim 9, further comprising two storage capacitors directly connected to a second and a third of said three polysilicon plugs, respectively.
Claim 13
Dependent Claim
18 words
The DRAM array of claim 9, wherein said bitline is offset from and parallel to said moat region.
Claim 14
Dependent Claim
53 words
The DRAM array of claim 8, further comprising: a first storage capacitor connected to said first offset connecting piece; a second offset connecting piece connected to a second of said three polysilicon plugs; and a second storage capacitor connected to said second of said three polysilicon plugs through said second offset connecting piece.
Claim 15
Dependent Claim
20 words
The DRAM array of claim 12, further comprising a bitline connected directly to a third of said three polysilicon plugs.
Claim 16
Dependent Claim
18 words
The DRAM array of claim 13 wherein said bitline is located above and parallel to said moat region.
Claim 17
Dependent Claim
20 words
The DRAM array of claim 8 wherein said plurality of DRAM cell pairs are arranged using a quarter pitch layout.
Claim 18
Dependent Claim
20 words
The DRAM array of claim 8 wherein said plurality of DRAM cell pairs are arranged using a half pitch layout.
References Cited (Backward Citations)
US5291433A
Cited
US5392232A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-09-22 | 2001-03-24 | 2001-09-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-09-22 | 2005-03-24 | 2005-09-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-09-22 | 2009-03-24 | 2009-09-23 | $7700.00 | Window Closed / Lapsed |