US5668036A
Expired / Lapsed
US
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Fabrication method of the post structure of the cell for high density DRAM
Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
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Filing: 1996-06-21
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Granted: 1997-09-16
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Expires: 2016-06-21
Abstract
Abstract A method is disclosed to form memory cell structures for DRAMs in which the capacitor nodes are formed in the shape of posts that fit in an area no larger than that which is over the active regions of the semiconductor substrate. Hence, the posts are suitable to accommodate the area that is appropriate for any one of the very high density DRAMs up to and including 1 G-bit. Furthermore, one less mask is used to form the node electrode in comparison with prior art. The interior of said post structure constitutes one electrode and the exterior wall the other, while a thin dielectric separates the two polysilicon plates of the capacitor. It is shown that said post structures perform the multi-function of providing a good support during the planarization process. Optional pillars may be formed at judiciously chosen locations in the cell to provide additional storage nodes and/or more uniform support structures to more readily facilitate chemical-mechanical polishing (CMP) of the substrate surface. In an alternate approach for increasing the storage capacity of capacitors in DRAMs, a branched-post structure is used. It is predicted that cells with four branches can allow the manufacture of 1 G-bit DRAMs.
Inventors
- 👤 Ching-Tzong Sune
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 12:44
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/03; H10B12/033; H10B12/30; H10B12/31; H10B12/318; H10D; H10D1/00; H10D1/60; H10D1/68
Claims Analysis
Total Claims: 46
Claim 1
Independent Claim
246 words
A method of forming multipurpose unitary post structures as storage nodes in dynamic random access memory (DRAM) cells comprising the steps of: providing a semiconductor substrate over which are formed first polysilicon I gates on gate oxide; depositing over said substrate a layer of silicon nitride (SIN); depositing over said SiN a first layer of dielectric; planarizing said first dielectric layer; forming a mask over said first dielectric layer; opening first set of contact holes through said first dielectric layer; forming said storage node openings in said first dielectric layer for said unitary post structures; etching native oxide formed in said contact holes; depositing second polysilicon II over said substrate; etching back said polysilicon II layer; removing said first dielectric layer to form said unitary post structures; removing said silicon nitride layer; depositing dielectric film over said substrate; depositing third polysilicon III layer over said dielectric film; etching said polysilicon III layer to form outer node electrode; depositing second dielectric layer over said substrate; planarizing said second dielectric layer; opening second set of contact holes through said second dielectric layer; opening contact holes on the periphery of chip sites; depositing fourth polysilicon IV over said substrate; etching back said polysilicon IV layer; depositing third dielectric layer over said substrate; planarizing said third dielectric layer; opening third set of contact holes through said third dielectric layer; depositing metal layer over said substrate; etching said metal layer to form patterns; and depositing a passivation layer over said substrate.
Claim 2
Independent Claim
246 words
A method of forming multipurpose unitary post structures as storage nodes in dynamic random access memory (DRAM) cells comprising the steps of: providing a semiconductor substrate over which are formed first polysilicon I gates on gate oxide; depositing over said substrate a layer of silicon nitride (SIN); depositing over said SiN a first layer of dielectric; planarizing said first dielectric layer; forming a mask over said first dielectric layer; opening first set of contact holes through said first dielectric layer; forming said storage node openings in said first dielectric layer for said unitary post structures; etching native oxide formed in said contact holes; depositing second polysilicon II over said substrate; etching back said polysilicon II layer; removing said first dielectric layer to form said unitary post structures; removing said silicon nitride layer; depositing dielectric film over said substrate; depositing third polysilicon III layer over said dielectric film; etching said polysilicon III layer to form outer node electrode; depositing second dielectric layer over said substrate; planarizing said second dielectric layer; opening second set of contact holes through said second dielectric layer; opening contact holes on the periphery of chip sites; depositing fourth polysilicon IV over said substrate; etching back said polysilicon IV layer; depositing third dielectric layer over said substrate; planarizing said third dielectric layer; opening third set of contact holes through said third dielectric layer; depositing metal layer over said substrate; etching said metal layer to form patterns; and depositing a passivation layer over said substrate.
Claim 3
Dependent Claim
11 words
The method of claim 1, wherein said silicon nitride is fluorinated.
Claim 4
Dependent Claim
16 words
The method of claim 1, wherein said first dielectric layer is chemical vapor deposited (CVD) oxide.
Claim 5
Dependent Claim
21 words
The method of claim 1, wherein said first dielectric layer consists of a material with high selectivity for polysilicon and nitride.
Claim 6
Dependent Claim
14 words
The method of claim 4, wherein said first dielectric layer is Borophosphosilicate Glass (BPSG).
Claim 7
Dependent Claim
19 words
The method of claim 4, wherein said first dielectric layer is TEOS film deposited by decomposition of tetraethyl orthosilicate.
Claim 8
Dependent Claim
15 words
The method of claim 1, wherein said planarization is performed by reactive ion etch (RIE).
Claim 9
Dependent Claim
15 words
The method of claim 1, wherein said planarization is performed by chemical mechanical polishing (CMP).
Claim 10
Dependent Claim
13 words
The method of claim 1, wherein said mask is formed with photolithography emulsion.
Claim 11
Dependent Claim
16 words
The method of claim 9, wherein said mask is patterned over contact regions on said substrate.
Claim 12
Dependent Claim
18 words
The method of claim 9, wherein said mask is positioned over said unitary post regions on said substrate.
Claim 13
Dependent Claim
12 words
The method of claim 1, wherein said contact holes are dry etched.
Claim 14
Dependent Claim
16 words
The method of claim 1, wherein said node openings are dry etched over unitary post regions.
Claim 15
Dependent Claim
19 words
The method of claim 1, wherein said oxide etching in contact holes is accomplished by means of wet etch.
Claim 16
Dependent Claim
16 words
The method of claim 1, wherein said polysilicon II is blanket deposited by means of CVD.
Claim 17
Dependent Claim
16 words
The method of claim 1, wherein said polysilicon II is etched back by means of RIE.
Claim 18
Dependent Claim
17 words
The method of claim 1, wherein said first dielectric layer is removed by means of dry etch.
Claim 19
Dependent Claim
16 words
The method of claim 1, wherein said silicon nitride is removed by means of dry etch.
Claim 20
Dependent Claim
20 words
The method of claim 1, wherein said dielectric film is a composite consisting of SiO 2 /SiN/SiO 2 layers (ONO).
Claim 21
Dependent Claim
16 words
The method of claim 1, wherein said polysilicon III is blanket deposited by means of CVD.
Claim 22
Dependent Claim
14 words
The method of claim 1, wherein said polysilicon III is etched by means RIE.
Claim 23
Dependent Claim
21 words
The method of claim 1, wherein said second dielectric layer consists of a material with high selectivity for polysilicon and nitride.
Claim 24
Dependent Claim
16 words
The method of claim 1, wherein said second dielectric layer is chemical vapor deposited (CVD) oxide.
Claim 25
Dependent Claim
14 words
The method of claim 1, wherein said second dielectric layer is Borophosphosilicate Glass (BPSG).
Claim 26
Dependent Claim
19 words
The method of claim 1, wherein said second dielectric layer is TEOS film deposited by decomposition of tetraethyl orthosilicate.
Claim 27
Dependent Claim
20 words
The method of claim 1, wherein said planarization of said second dielectric layer is performed by reactive ion etch (RIE).
Claim 28
Dependent Claim
20 words
The method of claim 1, wherein said planarization of said second dielectric layer is performed by chemical mechanical polishing (CMP).
Claim 29
Independent Claim
15 words
The method of claims 1, wherein said second set of contact holes are dry etched.
Claim 30
Dependent Claim
15 words
The method of claim 1, wherein said holes in the peripheral area are dry etched.
Claim 31
Dependent Claim
16 words
The method of claim 1, wherein said polysilicon IV is blanket deposited by means of CVD.
Claim 32
Dependent Claim
14 words
The method of claim 1, wherein said polysilicon IV is etched by means RIE.
Claim 33
Dependent Claim
21 words
The method of claim 1, wherein said third dielectric layer consists of a material with high selectivity for polysilicon and nitride.
Claim 34
Dependent Claim
16 words
The method of claim 1, wherein said third dielectric layer is chemical vapor deposited (CVD) oxide.
Claim 35
Dependent Claim
14 words
The method of claim 1, wherein said third dielectric layer is Borophosphosilicate Glass (BPSG).
Claim 36
Dependent Claim
19 words
The method of claim 1, wherein said third dielectric layer is TEOS film deposited by decomposition of tetraethyl orthosilicate.
Claim 37
Dependent Claim
20 words
The method of claim 1, wherein said planarization of said third dielectric layer is performed by reactive ion etch (RIE).
Claim 38
Dependent Claim
20 words
The method of claim 1, wherein said planarization of said third dielectric layer is performed by chemical mechanical polishing (CMP).
Claim 39
Independent Claim
15 words
The method of claims 1, wherein said third set of contact holes are dry etched.
Claim 40
Dependent Claim
10 words
The method of claim 1, wherein said metal is aluminum.
Claim 41
Dependent Claim
12 words
The method of claim 1, wherein the said passivation layer is BPSG.
Claim 42
Independent Claim
161 words
A method of forming multipurpose branched-post structures as storage nodes in dynamic random access memory (DRAM) cells comprising the steps of: providing a semiconductor substrate over which are formed first polysilicon I gates on gate oxide; depositing over said substrate a layer of silicon nitride (SIN); depositing over said SiN a first layer of dielectric; planarizing said first dielectric layer; forming a mask over said first dielectric layer; opening contact holes through said first dielectric layer; forming node openings in said first dielectric layer for said branched-post structures; etching native oxide in said contact holes; depositing second polysilicon II over said substrate; etching back said polysilicon II layer; removing said first dielectric layer to form said branched-post structures; removing said silicon nitride layer; depositing dielectric film over said substrate; depositing third polysilicon III layer over said dielectric film; etching said polysilicon III layer to form outer node electrode; depositing second dielectric layer over said substrate; and planarizing said second dielectric layer.
Claim 43
Independent Claim
161 words
A method of forming multipurpose branched-post structures as storage nodes in dynamic random access memory (DRAM) cells comprising the steps of: providing a semiconductor substrate over which are formed first polysilicon I gates on gate oxide; depositing over said substrate a layer of silicon nitride (SIN); depositing over said SiN a first layer of dielectric; planarizing said first dielectric layer; forming a mask over said first dielectric layer; opening contact holes through said first dielectric layer; forming node openings in said first dielectric layer for said branched-post structures; etching native oxide in said contact holes; depositing second polysilicon II over said substrate; etching back said polysilicon II layer; removing said first dielectric layer to form said branched-post structures; removing said silicon nitride layer; depositing dielectric film over said substrate; depositing third polysilicon III layer over said dielectric film; etching said polysilicon III layer to form outer node electrode; depositing second dielectric layer over said substrate; and planarizing said second dielectric layer.
Claim 44
Dependent Claim
13 words
The method of claim 41, wherein said mask has patterns for branched-post structures.
Claim 45
Independent Claim
164 words
A method of forming multipurpose unitary and branched post structures as storage nodes in dynamic random access memory (DRAM) cells comprising the steps of: providing a semiconductor substrate over which are formed first polysilicon I gates on gate oxide; depositing over said substrate a layer of silicon nitride (SIN); depositing over said SiN first layer of dielectric; planarizing said first dielectric layer; forming a mask over said first dielectric layer; opening contact holes through said dielectric layer; forming node openings in said dielectric layer for said unitary and branched post structures; etching native oxide in said contact holes; depositing second polysilicon II over said substrate; etching back said polysilicon II layer; removing said first dielectric layer to form said unitary and branched post structures; removing said silicon nitride layer; depositing dielectric film over said substrate; depositing third polysilicon III layer over said dielectric film; etching said polysilicon III layer to form outer node electrode; depositing second dielectric layer; and planarizing said second dielectric layer.
Claim 46
Independent Claim
164 words
A method of forming multipurpose unitary and branched post structures as storage nodes in dynamic random access memory (DRAM) cells comprising the steps of: providing a semiconductor substrate over which are formed first polysilicon I gates on gate oxide; depositing over said substrate a layer of silicon nitride (SIN); depositing over said SiN first layer of dielectric; planarizing said first dielectric layer; forming a mask over said first dielectric layer; opening contact holes through said dielectric layer; forming node openings in said dielectric layer for said unitary and branched post structures; etching native oxide in said contact holes; depositing second polysilicon II over said substrate; etching back said polysilicon II layer; removing said first dielectric layer to form said unitary and branched post structures; removing said silicon nitride layer; depositing dielectric film over said substrate; depositing third polysilicon III layer over said dielectric film; etching said polysilicon III layer to form outer node electrode; depositing second dielectric layer; and planarizing said second dielectric layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2000-09-15 | 2001-03-17 | 2001-09-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-09-15 | 2005-03-17 | 2005-09-16 | $3760.00 | Window Closed / Lapsed |
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