US5667630A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Low charge-up reactive ion metal etch process
Assignee: Vanguard International Semiconductor Corp
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Filing: 1995-04-28
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Granted: 1997-09-16
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Expires: 2015-04-28
Abstract
Abstract A method for forming metal patterns through use of a multi-step magnetically assisted reactive ion etch plasma process. A metal layer is formed upon a semiconductor substrate. The metal layer is patterned with a photoresist composition which leaves exposed those regions of metal to be removed. The exposed metal is removed through a multi-step magnetically assisted reactive ion etch process. The first etch step is a primary metal etch at elevated levels of radio frequency power and magnetic field strength. The last etch step is a secondary metal over-etch step at lower levels of radio frequency power and magnetic field strength. Intermediate to the first etch step and last etch step are a multiplicity of etch process steps where the radio frequency power and magnetic field strength are independently and sequentially reduced.
Inventors
- 👤 Jui-Cheng Lo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 03:37
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
191 words
A method for forming a residue free patterned metal layer for semiconductor device applications comprising: forming a metal layer upon a semiconductor substrate; providing a patterned etch mask over the metal layer, which mask protects portions of the metal layer which are to remain on the semiconductor substrate; providing a primary etching of the metal layer exposed through the etch mask through the use of a magnetically assisted reactive ion etch plasma, the primary etching being controlled by a first radio frequency power and a first magnetic field strength of the magnetically assisted reactive ion etch plasma; providing a multiplicity of intermediate etching steps of the metal layer exposed through the etch mask by sequentially and independently lowering the first radio frequency power and the first magnetic field strength of the magnetically assisted reactive ion etch plasma to a second radio frequency power and a second magnetic field strength of the magnetically assisted reactive ion etch plasma; and providing a secondary over-etching of the metal layer exposed through the etch mask at the second radio frequency power and the second magnetic field strength of the magnetically assisted reactive ion etch plasma.
Claim 2
Independent Claim
191 words
A method for forming a residue free patterned metal layer for semiconductor device applications comprising: forming a metal layer upon a semiconductor substrate; providing a patterned etch mask over the metal layer, which mask protects portions of the metal layer which are to remain on the semiconductor substrate; providing a primary etching of the metal layer exposed through the etch mask through the use of a magnetically assisted reactive ion etch plasma, the primary etching being controlled by a first radio frequency power and a first magnetic field strength of the magnetically assisted reactive ion etch plasma; providing a multiplicity of intermediate etching steps of the metal layer exposed through the etch mask by sequentially and independently lowering the first radio frequency power and the first magnetic field strength of the magnetically assisted reactive ion etch plasma to a second radio frequency power and a second magnetic field strength of the magnetically assisted reactive ion etch plasma; and providing a secondary over-etching of the metal layer exposed through the etch mask at the second radio frequency power and the second magnetic field strength of the magnetically assisted reactive ion etch plasma.
Claim 3
Dependent Claim
24 words
The method of claim 1 wherein the metal layer is formed from a metal selected from the group consisting of aluminum and aluminum alloys.
Claim 4
Dependent Claim
13 words
The method of claim 1 wherein the metal layer is formed from copper.
Claim 5
Dependent Claim
19 words
The method of claim 2 wherein the metal layer has a thickness from about 0.3 to about 1.5 microns.
Claim 6
Dependent Claim
24 words
The method of claim 1 wherein the secondary over-etching of the metal layer is undertaken at a value of the second magnetic field strength.
Claim 7
Dependent Claim
23 words
The method of claim 5 wherein the multiplicity of intermediate etching steps is initiated by a reduction of the first radio frequency power.
Claim 8
Dependent Claim
23 words
The method of claim 5 wherein the multiplicity of intermediate etching steps is initiated by a reduction of the first magnetic field strength.
Claim 9
Independent Claim
205 words
A method for forming a residue free patterned aluminum containing metal layer for semiconductor device applications comprising: forming an aluminum containing metal layer upon a semiconductor substrate; providing a patterned etch mask over the aluminum containing metal layer, which mask protects portions of the aluminum containing metal layer which are to remain on the semiconductor substrate; providing a primary etching of the aluminum containing metal layer exposed through the etch mask through the use of a Magnetically Enhanced Reactive Ion Etch plasma, the primary etching being controlled by a first radio frequency power and a first magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma; providing a multiplicity of intermediate etching steps of the aluminum containing metal layer exposed through the etch mask by sequentially and independently lowering the first radio frequency power and the first magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma to a second radio frequency power and a second magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma; and providing a secondary over-etching of the aluminum containing metal layer exposed through the etch mask at the second radio frequency power and the second magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma.
Claim 10
Independent Claim
205 words
A method for forming a residue free patterned aluminum containing metal layer for semiconductor device applications comprising: forming an aluminum containing metal layer upon a semiconductor substrate; providing a patterned etch mask over the aluminum containing metal layer, which mask protects portions of the aluminum containing metal layer which are to remain on the semiconductor substrate; providing a primary etching of the aluminum containing metal layer exposed through the etch mask through the use of a Magnetically Enhanced Reactive Ion Etch plasma, the primary etching being controlled by a first radio frequency power and a first magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma; providing a multiplicity of intermediate etching steps of the aluminum containing metal layer exposed through the etch mask by sequentially and independently lowering the first radio frequency power and the first magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma to a second radio frequency power and a second magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma; and providing a secondary over-etching of the aluminum containing metal layer exposed through the etch mask at the second radio frequency power and the second magnetic field strength of the Magnetically Enhanced Reactive Ion Etch plasma.
Claim 11
Dependent Claim
31 words
The method of claim 8 wherein the first radio frequency power is about 500 to about 1000 watts and the first magnetic field strength is about 20 to about 160 gauss.
Claim 12
Dependent Claim
31 words
The method of claim 8 wherein the second radio frequency power is about 200 to about 1000 watts and the second magnetic field strength is about 20 to about 160 gauss.
Claim 13
Dependent Claim
23 words
The method of claim 8 wherein the multiplicity of intermediate etching steps is initiated by a reduction in the first radio frequency power.
Claim 14
Dependent Claim
23 words
The method of claim 8 wherein the multiplicity of intermediate etching steps is initiated by a reduction in the first magnetic field strength.
Claim 15
Dependent Claim
21 words
The method of claim 8 wherein the aluminum containing metal layer has a thickness from about 0.3 to about 1.5 microns.
Claim 16
Dependent Claim
22 words
The method of claim 13 wherein the aluminum containing metal layer has a composition from about 90 to about 100 percent aluminum.
Claim 17
Dependent Claim
21 words
The method of claim 14 wherein the aluminum containing metal layer is etched with a chlorine containing reactive ion etch plasma.
Claim 18
Dependent Claim
43 words
The method of claim 15 wherein the chlorine containing reactive etch plasma is comprised of chlorine gas at about 10 to about 200 standard cubic centimeters per minute and boron trichloride gas at about 10 to about 200 standard cubic centimeters per minute.
Claim 19
Dependent Claim
19 words
The method of claim 16 wherein the chlorine containing reactive ion etch plasma further comprises a non-reactive diluent gas.
Claim 20
Dependent Claim
24 words
The method of claim 17 wherein the non-reactive diluent gas is nitrogen gas at about 0 to about 150 standard cubic centimeters per minute.
Claim 21
Independent Claim
200 words
A method for forming a residue free patterned aluminum containing metal layer for semiconductor device applications comprising: forming an aluminum containing metal layer upon a semiconductor substrate; providing a layered etch mask over the aluminum containing metal layer, which mask protects portions of the aluminum containing metal layer which are to remain on the semiconductor substrate; providing a primary etching of the aluminum containing metal layer exposed through the etch mask through the use of an Electron Cyclotron Resonance etch plasma, the primary etching being controlled by a first radio frequency power and a first magnetic field strength of the Electron Cyclotron Resonance etch plasma; providing a multiplicity of intermediate etching steps of the aluminum containing metal layer exposed through the etch mask by sequentially and independently lowering the first radio frequency power and the first magnetic field strength of the Electron Cyclotron Resonance etch plasma to a second radio frequency power and a second magnetic field strength of the Electron Cyclotron Resonance etch plasma; and providing a secondary over-etching of the aluminum containing metal layer exposed through the etch mask at the second radio frequency power and the second magnetic field strength of the Electron Cyclotron Resonance etch plasma.
Claim 22
Independent Claim
200 words
A method for forming a residue free patterned aluminum containing metal layer for semiconductor device applications comprising: forming an aluminum containing metal layer upon a semiconductor substrate; providing a layered etch mask over the aluminum containing metal layer, which mask protects portions of the aluminum containing metal layer which are to remain on the semiconductor substrate; providing a primary etching of the aluminum containing metal layer exposed through the etch mask through the use of an Electron Cyclotron Resonance etch plasma, the primary etching being controlled by a first radio frequency power and a first magnetic field strength of the Electron Cyclotron Resonance etch plasma; providing a multiplicity of intermediate etching steps of the aluminum containing metal layer exposed through the etch mask by sequentially and independently lowering the first radio frequency power and the first magnetic field strength of the Electron Cyclotron Resonance etch plasma to a second radio frequency power and a second magnetic field strength of the Electron Cyclotron Resonance etch plasma; and providing a secondary over-etching of the aluminum containing metal layer exposed through the etch mask at the second radio frequency power and the second magnetic field strength of the Electron Cyclotron Resonance etch plasma.
Claim 23
Dependent Claim
31 words
The method of claim 19 wherein the first radio frequency power is about 20 to about 100 watts and the first magnetic field strength is about 20 to about 160 gauss.
Claim 24
Dependent Claim
31 words
The method of claim 19 wherein the second radio frequency power is about 20 to about 100 watts and the second magnetic field strength is about 20 to about 160 gauss.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-09-15 | 2001-03-17 | 2001-09-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-09-15 | 2005-03-17 | 2005-09-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-09-15 | 2009-03-17 | 2009-09-16 | $7700.00 | Window Closed / Lapsed |