Exposure system and exposure method

Claim 2

An exposure system, comprising: a light source for emitting a beam of exposing light; a fly-eye lens for minimizing illumination variety of said beam within a cross section of said beam, said fly-eye lens having lens elements arranged in a plane; an aperture stop for narrowing said beam penetrating through said fly-eye lens and for adjusting an intensity distribution of said beam; a wafer stage for supporting a wafer thereon; an illumination detector for detecting an illumination of a ray of said beam of exposing light penetrating through one of said lens elements of said fly-eye lens; an aligner for aligning a position of said detector with said corresponding one of said lens elements; and a ray-selecting member for selecting one of a plurality of rays of said exposing light penetrating through said lens elements of said fly-eye lens, said member having a penetrating hole and being placed between said aperture stop and said wafer stage, said aligner for moving said ray selecting member along said plane of said fly-eye lens to allow said one of said rays of said exposing light to selectively pass through said hole.

Claim 3

The exposure system as claimed in claim 1, wherein said illumination detector is placed between said aperture stop and said wafer stage, and wherein said detector detects said illumination of said ray penetrating through one of said lens elements of said fly-eye lens and said aperture stop.

Claim 4

The exposure system as claimed in claim 1, wherein said illumination detector is placed on said wafer stage, and wherein said detector detects illumination of said selected ray penetrating through said one of said lens elements of said fly-eye lens.

Claim 5

The exposure system as claimed in claim 1, further comprising a casing comprising said ray-selecting member, said casing being placed between said aperture stop and said wafer stage, wherein said detector is placed in said casing, and said selected ray of said exposing light enters said casing through said hole to be detected by said detector, and wherein said aligner moves said casing along said plane of said fly-eye lens to be selectively located at positions corresponding to ones of said lens elements of said fly-eye lens.

Claim 6

The exposure system as claimed in claim 4, wherein said aligner has first and second pulse motors for translating said casing along said plane of said fly-eye lens, and wherein said first motor translates said casing in a first horizontal direction and said second motor translates said casing in a second horizontal direction perpendicular to said first direction.

Claim 7

The exposure system as claimed in claim 1, further comprising a screen serving as said ray-selecting member, said screen having said penetrating hole and placed between said aperture stop and said wafer stage, wherein said detector is placed on said wafer stage, and said ray of said exposing light penetrates through said hole to be detected by said detector.

Claim 8

The exposure system as claimed in claim 6, wherein said aligner has first and second pulse motors for translating said screen along said plane of said fly-eye lens, and wherein said first motor translates said screen in a first horizontal direction and said second motor translates said screen in a second horizontal direction perpendicular to said first direction.

Claim 9

An exposure method, comprising the steps of: preparing a fly-eye lens for minimizing illumination variety of a beam of exposing light within a cross section of said beam, said fly-eye lens having lens elements arranged in a plane; preparing an aperture stop for narrowing said beam penetrating through said fly-eye lens and for adjusting an intensity distribution thereof; preparing a wafer stage for placing a wafer thereon; preparing a ray-selecting member for selecting one of a plurality of rays of said exposing light penetrating through said lens elements of said fly-eye lens, said member having a penetrating hole and being placed between said aperture stop and said wafer stage; selecting one of said rays of said exposing light penetrating through said lens elements by aligning said hole with a desired one of said lens elements, thereby allowing a selected one of said rays of said exposing light to selectively pass through said hole; measuring an illumination of said selected one of said rays of said exposing light; comparing a measured value of said illumination with a desired value for said illumination; correcting for said measured value of said illumination by adjusting said aperture stop; and performing an exposure process using a corrected value of said illumination.

Claim 10

An exposure method, comprising the steps of: preparing a fly-eye lens for minimizing illumination variety of a beam of exposing light within a cross section of said beam, said fly-eye lens having lens elements arranged in a plane; preparing an aperture stop for narrowing said beam penetrating through said fly-eye lens and for adjusting an intensity distribution thereof; preparing a wafer stage for placing a wafer thereon; preparing a ray-selecting member for selecting one of a plurality of rays of said exposing light penetrating through said lens elements of said fly-eye lens, said member having a penetrating hole and being placed between said aperture stop and said wafer stage; selecting one of said rays of said exposing light penetrating through said lens elements by aligning said hole with a desired one of said lens elements, thereby allowing a selected one of said rays of said exposing light to selectively pass through said hole; measuring an illumination of said selected one of said rays of said exposing light; comparing a measured value of said illumination with a desired value for said illumination; correcting for said measured value of said illumination by adjusting said aperture stop; and performing an exposure process using a corrected value of said illumination.

Claim 11

The exposure method as claimed in claim 8, further comprising the step of placing an illumination detector between said aperture stop and said wafer stage.

Claim 12

The exposure method as claimed in claim 8, further comprising the step of placing an illumination detector on said wafer stage.

Claim 13

The exposure method as claimed in claim 8, further comprising the steps of: placing an illumination detector in a casing comprising said ray-selected member, said casing being placed between said aperture stop and said wafer table; introducing said ray of said exposing light into said casing through said hole to be detected by an illumination detector; and moving said said casing along said plane of said fly-eye lens to be located at positions corresponding to said lens elements of said fly-eye lens.

Claim 14

The exposure method as claimed in claim 11, further comprising the step of translating said casing in a first horizontal direction by a first motor and in a second horizontal direction perpendicular to said first direction by a second motor.

Claim 15

The exposure method as claimed in claim 8, further comprising the step of: providing a screen serving as said ray-selecting member, wherein an illumination detector is placed on said wafer stage and moving said screen along said plane of said fly-eye lens to be located at positions corresponding to said lens elements of said fly-eye lens.

Claim 16

The exposure method as claimed in claim 13, further comprising the step of translating said screen along said plane of said fly-eye lens by first and second pulse motors; and wherein said screen is translated by said first motor in a first horizontal direction said by second motor in a second horizontal direction perpendicular to said first direction.