Semiconductor memory cell and process for formation thereof

Claim 2

A DRAM cell comprising: a first storage electrode formed on an insulating surface of a substrate; a first dielectric layer formed on the first storage electrode; a first plate electrode formed on the first dielectric layer; an insulating layer formed on the first plate electrode; a semiconductor layer formed over the first plate electrode and connected to the storage electrode through a contact hole in the insulating layer; and a gate electrode formed on the semiconductor layer, an impurity region formed at the side of the gate electrode in the semiconductor layer, wherein the impurity region is connected to the storage electrode, wherein the semiconductor layer includes an insulating region formed in the semiconductor layer to isolate the impurity region.

Claim 3

The DRAM cell as claimed in claim 1, further comprising a stacked type capacitor connected to the impurity region, wherein the stacked type capacitor comprises: a second storage electrode formed over the gate electrode and connected to the first storage electrode and the impurity region; a second dielectric layer formed on the second storage electrode; and a second plate electrode formed on the second dielectric layer.

Claim 4

The DRAM cell as claimed in claim 2, wherein the first and second storage electrodes and the first and second plate electrodes comprise doped polysilicon.

Claim 5

The DRAM cell as claimed in claim 2, wherein the first and second dielectric layers comprise oxide.

Claim 6

The DRAM cell as claimed in claim 2, wherein the first and second dielectric layers comprise a stacked structure comprising an oxide and a nitride.

Claim 7

The DRAM cell as claimed in claim 1, wherein an insulating layer is formed on the substrate, wherein the substrate comprises polysilicon and serves as a substrate plate electrode.

Claim 8

A memory cell comprising: a first dielectric layer formed on a substrate; a storage electrode formed on the first dielectric layer; a second dielectric layer formed on the first storage electrode; a plate electrode formed on the second dielectric layer; a third dielectric layer formed on the plate electrode; a semiconductor layer formed over the plate electrode and connected to the storage electrode through a contact hole in the third dielectric layer; a gate electrode formed on the semiconductor layer; and an impurity region formed at the side of the gate electrode in the semiconductor layer, wherein the impurity region is connected to the storage electrode, wherein the semiconductor layer includes an insulating region formed in the semiconductor layer to isolate the impurity region.

Claim 9

A memory cell comprising: a first dielectric layer formed on a substrate; a storage electrode formed on the first dielectric layer; a second dielectric layer formed on the first storage electrode; a plate electrode formed on the second dielectric layer; a third dielectric layer formed on the plate electrode; a semiconductor layer formed over the plate electrode and connected to the storage electrode through a contact hole in the third dielectric layer; a gate electrode formed on the semiconductor layer; and an impurity region formed at the side of the gate electrode in the semiconductor layer, wherein the impurity region is connected to the storage electrode, wherein the semiconductor layer includes an insulating region formed in the semiconductor layer to isolate the impurity region.

Claim 10

The memory cell as claimed in claim 7, wherein the plate electrode is electrically connected to the substrate.

Claim 11

The memory cell as claimed in claim 7, wherein the substrate comprises a silicon substrate doped with an impurity.

Claim 12

The memory cell as claimed in claim 7, further comprising a circuit portion of a DRAM connected to the storage electrode.

Claim 13

The memory cell as claimed in claim 7, wherein the first and second storage electrodes and the plate electrode comprise doped polysilicon.

Claim 14

The memory cell as claimed in claim 7, wherein the first, second, and third dielectric layers comprise oxide.

Claim 15

The memory cell as claimed in claim 7, wherein the first, second, and third dielectric layers comprise a stacked structure comprising an oxide and a nitride.

Claim 16

The memory cell as claimed in claim 7, further comprising a stacked type capacitor connected to the impurity region, wherein the stacked type capacitor comprises: a second storage electrode formed over the gate electrode and connected to the storage electrode and the impurity region; a fourth dielectric layer formed on the second storage electrode; and a second plate electrode formed on the fourth dielectric layer.

Claim 17

A memory cell comprising: a first dielectric layer formed on a substrate; a first storage electrode formed on the first dielectric layer; a second dielectric layer formed on the first storage electrode; a first plate electrode formed on the second dielectric layer; a third dielectric layer formed on the first plate electrode; a semiconductor layer formed over the first plate electrode and connected to the first storage electrode through a contact hole in the third dielectric layer; a circuit portion formed on the semiconductor layer; and an impurity region formed at the side of the gate electrode in the semiconductor layer, wherein the impurity region is connected to the first storage electrode and the circuit portion, wherein the semiconductor layer includes an insulating region formed in the semiconductor layer to isolate the impurity the region; a stacked type capacitor connected to the first storage electrode and the impurity region, wherein the stacked type capacitor comprises: a second storage electrode connected to the first storage electrode and the impurity region; a third dielectric layer formed on the second storage electrode; and a second plate electrode formed on the third dielectric layer.

Claim 18

A memory cell comprising: a first dielectric layer formed on a substrate; a first storage electrode formed on the first dielectric layer; a second dielectric layer formed on the first storage electrode; a first plate electrode formed on the second dielectric layer; a third dielectric layer formed on the first plate electrode; a semiconductor layer formed over the first plate electrode and connected to the first storage electrode through a contact hole in the third dielectric layer; a circuit portion formed on the semiconductor layer; and an impurity region formed at the side of the gate electrode in the semiconductor layer, wherein the impurity region is connected to the first storage electrode and the circuit portion, wherein the semiconductor layer includes an insulating region formed in the semiconductor layer to isolate the impurity the region; a stacked type capacitor connected to the first storage electrode and the impurity region, wherein the stacked type capacitor comprises: a second storage electrode connected to the first storage electrode and the impurity region; a third dielectric layer formed on the second storage electrode; and a second plate electrode formed on the third dielectric layer.

Claim 19

The memory cell as claimed in claim 15, wherein the first and second plate electrodes are electrically connected to the substrate.

Claim 20

The memory cell as claimed in claim 15, wherein the substrate comprises a silicon substrate doped with an impurity.

Claim 21

The memory cell as claimed in claim 15, wherein the first and second storage electrodes and the first and second plate electrodes comprise doped polysilicon.

Claim 22

The memory cell as claimed in claim 14, wherein the first, second, and third dielectric layers comprise oxide.

Claim 23

The memory cell as claimed in claim 14, wherein the first, second, and third dielectric layers comprise a stacked structure comprising an oxide and a nitride.

Claim 24

A memory cell, comprising: a first capacitor formed on an insulating surface of a substrate, the first capacitor comprising a first storage electrode formed on the insulating surface of the substrate, a first dielectric layer formed on the first storage electrode and a first plate electrode formed on the first dielectric layer; and a transistor formed in a semiconductor layer formed over the first capacitor, wherein the semiconductor layer is insulated from the first capacitor by an insulating layer, wherein the semiconductor layer is electrically connected to the first storage electrode of the capacitor through a contact hole in the insulating layer, wherein the semiconductor layer includes an insulating region formed in the semiconductor layer to isolate the transistor.

Claim 25

A memory cell, comprising: a first capacitor formed on an insulating surface of a substrate, the first capacitor comprising a first storage electrode formed on the insulating surface of the substrate, a first dielectric layer formed on the first storage electrode and a first plate electrode formed on the first dielectric layer; and a transistor formed in a semiconductor layer formed over the first capacitor, wherein the semiconductor layer is insulated from the first capacitor by an insulating layer, wherein the semiconductor layer is electrically connected to the first storage electrode of the capacitor through a contact hole in the insulating layer, wherein the semiconductor layer includes an insulating region formed in the semiconductor layer to isolate the transistor.

Claim 26

The memory cell of claim 21, further comprising a second capacitor, the second capacitor comprising a stacked type capacitor having a second storage electrode and a second plate electrode, wherein the second storage electrode is electrically connected to the semiconductor layer.

Claim 27

The memory cell of claim 21, wherein the second capacitor comprises a stacked type capacitor formed over the transistor.