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US5647756A Expired / Lapsed US ⏱️ 0.0 years remaining

Integrated circuit test socket having toggle clamp lid

Assignee: 3M Co
•
Filing: 1995-12-19
•
Granted: 1997-07-15
•
Expires: 2015-12-19
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Abstract

Abstract A test socket for integrated circuits includes a lid having a pressure pad which may move independently of the lid. The pressure pad is operated by a lever creating a large mechanical advantage and is provided to apply a large normal force to an integrated circuit in the test socket after the lid is closed to ensure good electrical contact between the integrated circuit device and the contact pins of the test socket.

Inventors

  • 👤 Richard Dean Twigg
  • 👤 Steven Dale Mitchem

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 18:11
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 130 words
An improved test socket for integrated circuits of the type including: a base; a platform supporting said integrated circuit; resilient contacts extending at least partially into said platform for electrical connection to said integrated circuit; and a lid pivotally connected to said base and including a latch for securing said lid relative to said base; the improvement comprising: a pressure pad forming a portion of said lid, said pressure pad being slidably moveable with respect to said lid; a lever pivotally attached to said lid and moveable between a closed position and an open position; and means connecting said lever and said pressure pad for forcing said pressure pad toward said base when said lid is closed and said lever is moved from said open position to said closed position.
Claim 2
Dependent Claim 130 words
An improved test socket for integrated circuits of the type including: a base; a platform supporting said integrated circuit; resilient contacts extending at least partially into said platform for electrical connection to said integrated circuit; and a lid pivotally connected to said base and including a latch for securing said lid relative to said base; the improvement comprising: a pressure pad forming a portion of said lid, said pressure pad being slidably moveable with respect to said lid; a lever pivotally attached to said lid and moveable between a closed position and an open position; and means connecting said lever and said pressure pad for forcing said pressure pad toward said base when said lid is closed and said lever is moved from said open position to said closed position.
Claim 3
Dependent Claim 27 words
A test socket according to claim 1 further including springs for biasing said pressure pad away from said base when said lid is in said closed position.
Claim 4
Dependent Claim 31 words
A test socket according to claim 1 wherein said means connecting said lever and said pressure pad is at least one link pivotally connected to said lever and said pressure pad.
Claim 5
Dependent Claim 21 words
A test socket according to claim 1 further including a latch for retaining said cover in contact with said integrated circuit.

References Cited (Backward Citations)

US4456318A Cited
US4554505A Cited
JPS6276274A Cited
JPS6276273A Cited
US5176524A Cited
US5320551A Cited
US5308256A Cited
US5247250A Cited
US5364284A Cited
EP0613335A1 Cited
EP0622982A1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-07-14 2001-01-13 2001-07-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-07-14 2005-01-13 2005-07-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-07-14 2009-01-13 2009-07-15 $7700.00 Window Closed / Lapsed

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