Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
152 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (50, 51) provided for cooling said plurality of boards (80, 81) inserted in said board racks (70, 71); a cooling pipe (61) connected to said heat exchangers (50, 51); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (50); a fan (30) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (50); a fan (31) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (51).
Claim 2
Dependent Claim
152 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (50, 51) provided for cooling said plurality of boards (80, 81) inserted in said board racks (70, 71); a cooling pipe (61) connected to said heat exchangers (50, 51); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (50); a fan (30) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (50); a fan (31) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (51).
Claim 3
Dependent Claim
155 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (52, 53) having good ventilation provided, said heat exchangers (52, 53) being connected to a cooling pipe (61) for cooling a plurality of boards (80, 81) inserted in board racks (70, 71); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (53); a fan (32) for generating cooling air in said sealed housing (10) provided in rear of said heat exchanger (53); a fan (33) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (52).
Claim 4
Dependent Claim
155 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (52, 53) having good ventilation provided, said heat exchangers (52, 53) being connected to a cooling pipe (61) for cooling a plurality of boards (80, 81) inserted in board racks (70, 71); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (53); a fan (32) for generating cooling air in said sealed housing (10) provided in rear of said heat exchanger (53); a fan (33) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (52).