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US5644248A Expired / Lapsed US ⏱️ 0.0 years remaining

Test head cooling system

Assignee: Advantest Corp
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Filing: 1995-12-22
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Granted: 1997-07-01
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Expires: 2015-12-22
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Abstract

Abstract The present invention provides a test head cooling system for cooling test heads of a semiconductor IC test apparatus in an enclosed structure. A sealed housing is provided in a test head wherein an air duct is formed in a wall of the sealed box so that cooling air flow effectively. Several thousands of cables are connected to sockets of a plurality of boards. The boards are fixed in board racks by inserting the boards to sockets of the board racks. Gaps between the boards are arranged to provide good ventilation. A cooling pipe is connected to two heat exchangers for circulating cooling medium. A flexible hose for circulating the cooling medium is connected to one of the heat exchangers. The flexible hose is connected to an outside cooling apparatus so as to freely control the temperature of the cooling medium circulating inside the heat exchanger.

Inventors

  • 👤 Akihiro Fujimoto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 20:02
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/28; G01R31/2851; G01R31/2886; H; H10; H10P; H10P74/00

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 152 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (50, 51) provided for cooling said plurality of boards (80, 81) inserted in said board racks (70, 71); a cooling pipe (61) connected to said heat exchangers (50, 51); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (50); a fan (30) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (50); a fan (31) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (51).
Claim 2
Dependent Claim 152 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (50, 51) provided for cooling said plurality of boards (80, 81) inserted in said board racks (70, 71); a cooling pipe (61) connected to said heat exchangers (50, 51); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (50); a fan (30) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (50); a fan (31) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (51).
Claim 3
Dependent Claim 155 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (52, 53) having good ventilation provided, said heat exchangers (52, 53) being connected to a cooling pipe (61) for cooling a plurality of boards (80, 81) inserted in board racks (70, 71); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (53); a fan (32) for generating cooling air in said sealed housing (10) provided in rear of said heat exchanger (53); a fan (33) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (52).
Claim 4
Dependent Claim 155 words
A test head cooling system, wherein a cable (90) extended from a semiconductor IC test apparatus is connected to a socket of board racks (70, 71), and a plurality of boards (80, 81) is inserted to said socket, comprising: a sealed housing (10); an air duct (20) provided in a wall inside said sealed housing (10); heat exchangers (52, 53) having good ventilation provided, said heat exchangers (52, 53) being connected to a cooling pipe (61) for cooling a plurality of boards (80, 81) inserted in board racks (70, 71); a flexible hose (60) connected to an outside cooling apparatus for circulating cooling medium, said flexible hose (60) being connected to said heat exchanger (53); a fan (32) for generating cooling air in said sealed housing (10) provided in rear of said heat exchanger (53); a fan (33) for generating cooling air in said sealed housing (10) provided in front of said heat exchanger (52).

References Cited (Backward Citations)

US5084671A Cited
US5198752A Cited
US5153815A Cited
US5205132A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-06-30 2000-12-30 2001-07-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-06-30 2004-12-30 2005-07-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-06-30 2008-12-30 2009-07-01 $7700.00 Window Closed / Lapsed

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