Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
184 words
A method for optimally locating a plurality of electrical terminals on a border of a microelectronic circuit that includes a plurality of cells, comprising the steps of: (a) performing a placement of said cells; (b) calculating cell interconnect points in said placement corresponding to the electrical terminals respectively; (c) calculating positions on said border at which distances between said positions and said interconnect points are minimum respectively; and (d) locating the terminals at said positions respectively, in which: step (c) enables said positions to be calculated such that the terminals can overlap after performing step (d); and the method further comprises the steps, performed after step (d), of: (e) calculating adjusted positions for said terminals respectively in accordance with a predetermined function such that said overlap is eliminated; and (f) locating the terminals at said adjusted positions respectively; step (c) comprises calculating said positions in two-dimensional coordinates respectively; and step (e) comprises the substeps of: (g) converting said positions into one-dimensional coordinates measured along said border respectively; (h) calculating said adjusted positions in one-dimensional coordinates; and (i) converting said adjusted positions into two-dimensional coordinates.
Claim 2
Independent Claim
184 words
A method for optimally locating a plurality of electrical terminals on a border of a microelectronic circuit that includes a plurality of cells, comprising the steps of: (a) performing a placement of said cells; (b) calculating cell interconnect points in said placement corresponding to the electrical terminals respectively; (c) calculating positions on said border at which distances between said positions and said interconnect points are minimum respectively; and (d) locating the terminals at said positions respectively, in which: step (c) enables said positions to be calculated such that the terminals can overlap after performing step (d); and the method further comprises the steps, performed after step (d), of: (e) calculating adjusted positions for said terminals respectively in accordance with a predetermined function such that said overlap is eliminated; and (f) locating the terminals at said adjusted positions respectively; step (c) comprises calculating said positions in two-dimensional coordinates respectively; and step (e) comprises the substeps of: (g) converting said positions into one-dimensional coordinates measured along said border respectively; (h) calculating said adjusted positions in one-dimensional coordinates; and (i) converting said adjusted positions into two-dimensional coordinates.
Claim 3
Independent Claim
184 words
A method for optimally locating a plurality of electrical terminals on a border of a microelectronic circuit that includes a plurality of cells, comprising the steps of: (a) performing a placement of said cells; (b) calculating cell interconnect points in said placement corresponding to the electrical terminals respectively; (c) calculating positions on said border at which distances between said positions and said interconnect points are minimum respectively; and (d) locating the terminals at said positions respectively, in which: step (c) enables said positions to be calculated such that the terminals can overlap after performing step (d); and the method further comprises the steps, performed after step (d), of: (e) calculating adjusted positions for said terminals respectively in accordance With a predetermined function such that said overlap is eliminated; and (f) locating the terminals at said adjusted positions respectively; step (c) comprises calculating said positions in rectangular coordinates respectively; and step (e) comprises the substeps of: (g) converting said positions into linear coordinates measured along said border respectively; (h) calculating said adjusted positions in linear coordinates; and (i) converting said adjusted positions into rectangular coordinates.
Claim 4
Independent Claim
184 words
A method for optimally locating a plurality of electrical terminals on a border of a microelectronic circuit that includes a plurality of cells, comprising the steps of: (a) performing a placement of said cells; (b) calculating cell interconnect points in said placement corresponding to the electrical terminals respectively; (c) calculating positions on said border at which distances between said positions and said interconnect points are minimum respectively; and (d) locating the terminals at said positions respectively, in which: step (c) enables said positions to be calculated such that the terminals can overlap after performing step (d); and the method further comprises the steps, performed after step (d), of: (e) calculating adjusted positions for said terminals respectively in accordance With a predetermined function such that said overlap is eliminated; and (f) locating the terminals at said adjusted positions respectively; step (c) comprises calculating said positions in rectangular coordinates respectively; and step (e) comprises the substeps of: (g) converting said positions into linear coordinates measured along said border respectively; (h) calculating said adjusted positions in linear coordinates; and (i) converting said adjusted positions into rectangular coordinates.
Claim 5
Independent Claim
122 words
A method for removing overlap between electrical terminals on a border of a microelectronic circuit resulting from initial location of the terminals at positions that allow said overlap, comprising the steps of: (a) identifying overlapping clusters of terminals; (b) calculating adjusted positions for said terminals of said clusters respectively in accordance with a predetermined function such that said overlap is eliminated; and (c) locating the terminals at said adjusted positions respectively, in which: said positions are specified in two-dimensional coordinates prior to performing step (a) respectively; and step (b) comprises the substeps of: (d) converting said positions into one-dimensional coordinates measured along said border respectively; (e) calculating said adjusted positions in one-dimensional coordinates; and (f) converting said adjusted positions into two-dimensional coordinates.
Claim 6
Independent Claim
122 words
A method for removing overlap between electrical terminals on a border of a microelectronic circuit resulting from initial location of the terminals at positions that allow said overlap, comprising the steps of: (a) identifying overlapping clusters of terminals; (b) calculating adjusted positions for said terminals of said clusters respectively in accordance with a predetermined function such that said overlap is eliminated; and (c) locating the terminals at said adjusted positions respectively, in which: said positions are specified in two-dimensional coordinates prior to performing step (a) respectively; and step (b) comprises the substeps of: (d) converting said positions into one-dimensional coordinates measured along said border respectively; (e) calculating said adjusted positions in one-dimensional coordinates; and (f) converting said adjusted positions into two-dimensional coordinates.
Claim 7
Dependent Claim
47 words
A method as in claim 3, in which step (b) comprises calculating said adjusted positions such that centers of gravity of said clusters of terminals after performing step (c) are substantially the same as said centers of gravity of said clusters of terminals before performing step (a).
Claim 8
Dependent Claim
59 words
A method as in claim 3, in which: said clusters of terminals can be concatenated to form overlapping new clusters of terminals after performing step (c); and the method further comprises the steps, performed after step (c), of: (g) identifying said new overlapping clusters of terminals; and (h) calculating new adjusted positions to expand said new clusters of terminals.
Claim 9
Independent Claim
122 words
A method for removing overlap between electrical terminals on a border of a microelectronic circuit resulting from initial location of the terminals at positions that allow said overlap, comprising the steps of: (a) identifying overlapping clusters of terminals; (b) calculating adjusted positions for said terminals of said clusters respectively in accordance with a predetermined function such that said overlap is eliminated; and (c) locating the terminals at said adjusted positions respectively, in which: said positions are specified in rectangular coordinates prior to performing step (a) respectively; and step (b) comprises the substeps of: (d) converting said positions into linear coordinates measured along said border respectively; (e) calculating said adjusted positions in linear coordinates; and (f) converting said adjusted positions into rectangular coordinates.
Claim 10
Independent Claim
122 words
A method for removing overlap between electrical terminals on a border of a microelectronic circuit resulting from initial location of the terminals at positions that allow said overlap, comprising the steps of: (a) identifying overlapping clusters of terminals; (b) calculating adjusted positions for said terminals of said clusters respectively in accordance with a predetermined function such that said overlap is eliminated; and (c) locating the terminals at said adjusted positions respectively, in which: said positions are specified in rectangular coordinates prior to performing step (a) respectively; and step (b) comprises the substeps of: (d) converting said positions into linear coordinates measured along said border respectively; (e) calculating said adjusted positions in linear coordinates; and (f) converting said adjusted positions into rectangular coordinates.
Claim 11
Dependent Claim
32 words
A method as in claim 6, in which step (b) further comprises the substep, performed between steps (d) and (e), of: (g) sorting said positions in accordance with said linear coordinates thereof.