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High speed bipolar transistor using a patterned etch stop and diffusion source

Assignee: Texas Instruments Inc
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Filing: 1995-06-07
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Granted: 1997-05-13
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Expires: 2015-06-07
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Abstract

Abstract A bipolar transistor (100) and a method for forming the same. A base-link diffusion source layer (118) is formed over a portion of the collector region (102). The base-link diffusion source layer (118) comprises a material that is capable of being used as a dopant source and is capable of being etched selectively with respect to silicon. A base electrode (114) is formed over at least one end portion of the base-link diffusion source layer (118) and the exposed portions of the base-link diffusion source layer (118) are removed. An extrinsic base region (110) is diffused from the base electrode (114) and a base link-up region (112) is diffused from the base-link diffusion source layer (118). Processing may then continue to form an intrinsic base region (108), emitter region (126), and emitter electrode (124).

Inventors

  • 👤 F. Scott Johnson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 20:02
CPC Classifications
H; H10; H10D; H10D10/00; H10D10/01; H10D10/051; H10D10/40; H10D10/421

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 85 words
A bipolar transistor comprising: a collector region; an intrinsic base region within said collector region; an extrinsic base region within said collector region; a base link-up region within said collector region between said intrinsic base region and said extrinsic base region; a base-link diffusion source layer above and substantially coextensive with said base link-up region; a base electrode above said extrinsic base layer, said base electrode and said base-link diffusion source layer made of different materials; and an emitter region within said intrinsic base region.
Claim 2
Dependent Claim 85 words
A bipolar transistor comprising: a collector region; an intrinsic base region within said collector region; an extrinsic base region within said collector region; a base link-up region within said collector region between said intrinsic base region and said extrinsic base region; a base-link diffusion source layer above and substantially coextensive with said base link-up region; a base electrode above said extrinsic base layer, said base electrode and said base-link diffusion source layer made of different materials; and an emitter region within said intrinsic base region.
Claim 3
Dependent Claim 16 words
The biopolar transistor of claim 1, wherein said base-link diffusion source layer comprises a silicate glass.
Claim 4
Dependent Claim 15 words
The biopolar transistor of claim 1, wherein said base-link diffusion source layer comprises borosilicate glass.
Claim 5
Dependent Claim 16 words
The bipolar transistor of claim 1, wherein said base-link diffusion source layer comprises a phosphosilicate glass.
Claim 6
Dependent Claim 14 words
The biopolar transistor of claim 1, wherein said base-link diffusion source layer comprises silicon-germanium.
Claim 7
Dependent Claim 38 words
The bipolar transistor of claim 1, wherein said bipolar transistor comprises two layers of polysilicon, a first of said layers of polysilicon forming said base electrode and a second of said layers of polysilicon abutting said emitter region.

References Cited (Backward Citations)

US4843034A Cited
US5331199A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-05-12 2000-11-11 2001-05-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-05-12 2004-11-11 2005-05-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-05-12 2008-11-11 2009-05-13 $7700.00 Window Closed / Lapsed

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