US5627646A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for locating flaws in a smooth surface of an object
Assignee: Research Foundation of the State University of New York
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Filing: 1995-07-21
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Granted: 1997-05-06
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Expires: 2015-07-21
Abstract
Abstract A method for locating flaws in a smooth surface using at least one light source includes the steps of setting the light source at a predetermined length above the smooth surface, locating a highlight line, translating the light source across the smooth surface to create a plurality of highlight lines and locating distortions in the smooth surface.
Inventors
- 👤 Paul J. Stewart
- 👤 Yifan Chen
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 09:25
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/89; G01N21/8901; G01B; G01B11/00; G01B11/30; G01B11/306
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
99 words
A method for locating flaws in a smooth surface using at least one light source, the method comprising the steps of: setting the light source a predetermined length above the smooth surface; locating a highlight line; translating the light source across the smooth surface to create a plurality of highlight lines; decomposing each of the highlight lines into their respective spatial components; measuring spatial parameters of each of the highlight lines; transforming the spatial parameters into frequency parameters; comparing the frequency parameters to a threshold; identifying frequency parameters exceeding the threshold signal; and locating flaws in the smooth surface.
Claim 2
Independent Claim
99 words
A method for locating flaws in a smooth surface using at least one light source, the method comprising the steps of: setting the light source a predetermined length above the smooth surface; locating a highlight line; translating the light source across the smooth surface to create a plurality of highlight lines; decomposing each of the highlight lines into their respective spatial components; measuring spatial parameters of each of the highlight lines; transforming the spatial parameters into frequency parameters; comparing the frequency parameters to a threshold; identifying frequency parameters exceeding the threshold signal; and locating flaws in the smooth surface.
Claim 3
Dependent Claim
24 words
A method as set forth in claim 1 including the step of inversely transforming the frequency parameters into spatial parameters to locate the flaws.
Claim 4
Dependent Claim
33 words
A method as set forth in claim 2 including the step of locating the spatial parameters associated with the frequency parameters exceeding the threshold signal to locate the flaws in the smooth surface.
Claim 5
Independent Claim
96 words
A method for locating flaws into a smooth surface using a plurality of light sources, the method comprising the steps of: setting the light sources at a predetermined length above the smooth surface; locating highlight lines, each of the highlight lines created by each of the light sources; decomposing each of the highlight lines into their respective spatial components; measuring spatial parameters of each of the highlight lines; transforming the spatial parameters into frequency parameters; comparing the frequency parameters to a threshold; identifying frequency parameters exceeding the threshold signal; and locating flaws in the smooth surface.
Claim 6
Independent Claim
96 words
A method for locating flaws into a smooth surface using a plurality of light sources, the method comprising the steps of: setting the light sources at a predetermined length above the smooth surface; locating highlight lines, each of the highlight lines created by each of the light sources; decomposing each of the highlight lines into their respective spatial components; measuring spatial parameters of each of the highlight lines; transforming the spatial parameters into frequency parameters; comparing the frequency parameters to a threshold; identifying frequency parameters exceeding the threshold signal; and locating flaws in the smooth surface.
Claim 7
Independent Claim
161 words
A method for fabricating an object having a smooth surface using at least one light source, the method comprising the steps of: defining a preliminary piece source a predetermined length above the smooth surface; locating a highlight line; translating the light source across the smooth surface to create a plurality of highlight lines; locating flaws in the smooth surface; illuminating the flaws from the smooth surface of the preliminary piece; shaping a tool to produce the piece from the preliminary piece after eliminating the flaws therefrom; setting the light source a predetermined length above the tool; locating a highlight line; translating the light source across the tool to create a plurality of highlight lines; decomposing each of the highlight lines into their respective spatial components; measuring spatial parameters of each of the highlight lines; transforming the spatial parameters into frequency parameters; comparing the frequency parameters to a threshold; identifying frequency parameters exceeding the threshold signal; and locating flaws in the tool.
Claim 8
Independent Claim
161 words
A method for fabricating an object having a smooth surface using at least one light source, the method comprising the steps of: defining a preliminary piece source a predetermined length above the smooth surface; locating a highlight line; translating the light source across the smooth surface to create a plurality of highlight lines; locating flaws in the smooth surface; illuminating the flaws from the smooth surface of the preliminary piece; shaping a tool to produce the piece from the preliminary piece after eliminating the flaws therefrom; setting the light source a predetermined length above the tool; locating a highlight line; translating the light source across the tool to create a plurality of highlight lines; decomposing each of the highlight lines into their respective spatial components; measuring spatial parameters of each of the highlight lines; transforming the spatial parameters into frequency parameters; comparing the frequency parameters to a threshold; identifying frequency parameters exceeding the threshold signal; and locating flaws in the tool.
Claim 9
Dependent Claim
30 words
A method as set forth in claim 5 including the step of redefining the preliminary piece when removing the flaws from the tool alters the smooth surface of the tool.
Claim 10
Dependent Claim
18 words
A method as set forth in claim 5 including the step of forming the piece from the tool.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-05-05 | 2000-11-04 | 2001-05-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-05-05 | 2004-11-04 | 2005-05-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-05-05 | 2008-11-04 | 2009-05-06 | $7700.00 | Window Closed / Lapsed |