US5620559A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Hydrogen radical processing
Assignee: Fujitsu Semiconductor Ltd
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Filing: 1995-03-15
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Granted: 1997-04-15
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Expires: 2015-03-15
Abstract
Abstract A method of manufacturing a semiconductor device. The method includes the application of a gas containing HF vapor and H 2 O or alcohol vapor to a substrate. An excitation energy is applied to a flow of gas containing hydrogen to generate a plasma. Gas containing nitrogen fluoride is added to the gas containing hydrogen at a first position which is downstream from the place where the plasma is generated and at which the concentration of high energy particles in the gas containing hydrogen is negligible. The HF treated substrate is exposed to the gas containing nitrogen fluoride at a second position which is further downstream than the first position where the nitrogen fluoride is added.
Inventors
- 👤 Jun Kikuchi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 20:45
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32192; H01J37/32201; H01J37/32431; H01J37/32715; H01J37/32724; H10P72/00; H10P72/04; H10P72/0402; H10P72/0418; H10P72/0421; H01J37/3244
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
172 words
A method of manufacturing a semiconductor device comprising: applying a gas containing HF and one of H 2 O and an alcohol to a substrate to produce an HF treated substrate; providing a hydrogen containing gas; applying an excitation energy to said hydrogen containing gas at a plasma generating region to thereby generate a plasma in said hydrogen containing gas; causing said hydrogen containing gas to flow from said region to a first position that is downstream from said region, at which first position high energy particles in the hydrogen containing gas have decayed sufficiently so that the concentration of high energy particles in the hydrogen containing gas has become negligible; adding nitrogen fluoride to said hydrogen containing gas at said first position to produce a treatment gas; causing said treatment gas to flow from said first position to a second position that is further downstream; and contacting a surface of said HF treated substrate with said treatment gas at said second position to thereby remove imperfect oxide contamination from said surface.
Claim 2
Independent Claim
172 words
A method of manufacturing a semiconductor device comprising: applying a gas containing HF and one of H 2 O and an alcohol to a substrate to produce an HF treated substrate; providing a hydrogen containing gas; applying an excitation energy to said hydrogen containing gas at a plasma generating region to thereby generate a plasma in said hydrogen containing gas; causing said hydrogen containing gas to flow from said region to a first position that is downstream from said region, at which first position high energy particles in the hydrogen containing gas have decayed sufficiently so that the concentration of high energy particles in the hydrogen containing gas has become negligible; adding nitrogen fluoride to said hydrogen containing gas at said first position to produce a treatment gas; causing said treatment gas to flow from said first position to a second position that is further downstream; and contacting a surface of said HF treated substrate with said treatment gas at said second position to thereby remove imperfect oxide contamination from said surface.
Claim 3
Dependent Claim
26 words
A method of manufacturing a semiconductor device as set forth in claim 1, wherein said contacting is discontinued without exposing the substrate to an oxidizing atmosphere.
Claim 4
Dependent Claim
46 words
A method of manufacturing a semiconductor device as set forth in claim 1, wherein said substrate is heated to a temperature of at least 80° C. to evaporate by-products remaining on said surface of the substrate after said contacting of said surface with said treatment gas.
Claim 5
Dependent Claim
31 words
A method of manufacturing a semiconductor device as set forth in claim 3, wherein said heating of the substrate is performed in an atmosphere of one of hydrogen, nitrogen, or argon.
Claim 6
Dependent Claim
24 words
A method of manufacturing a semiconductor device as set forth in claim 3, wherein said heating of the substrate is performed in a vacuum.
Claim 7
Dependent Claim
18 words
A method of manufacturing a semiconductor device as set forth in claim 3, wherein said by-products include fluorine.
Claim 8
Dependent Claim
35 words
A method of manufacturing a semiconductor device as set forth in claim 1, wherein said contamination on said surface comprises a native oxide film and said hydrogen containing gas further comprises molecules containing oxygen atoms.
Claim 9
Dependent Claim
20 words
A method of manufacturing a semiconductor device as set forth in claim 7, wherein said excitation energy is microwave energy.
Claim 10
Dependent Claim
65 words
A method of manufacturing a semiconductor device as set forth in claim 7, wherein is included an initial start up procedure comprising, in seriatim, first introducing hydrogen gas to said region, second beginning the addition of said nitrogen fluoride at said first position, and thereafter beginning to mix said one of H 2 O and an alcohol with said hydrogen gas upstream from said region.
Claim 11
Dependent Claim
63 words
A method of manufacturing a semiconductor device as set forth in claim 9, wherein is included a shutdown procedure comprising, in seriatim, first stopping the mixing of said one of H 2 O and an alcohol with said hydrogen gas, second stopping the addition of nitrogen fluoride at said first position, and only thereafter stopping the flow of hydrogen gas to said region.
Claim 12
Dependent Claim
33 words
A method of manufacturing a semiconductor device as set forth in claim 7, wherein said substrate is immersed in pure water having reduced dissolved oxygen content after the contamination has been removed therefrom.
Claim 13
Dependent Claim
27 words
A method of manufacturing a semiconductor device as set forth in claim 1, wherein said one of H 2 O and an alcohol is H 2 O.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-04-14 | 2000-10-14 | 2001-04-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-04-14 | 2004-10-14 | 2005-04-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-04-14 | 2008-10-14 | 2009-04-15 | $7700.00 | Window Closed / Lapsed |