Method of determining the thermal resistivity of electrically insulating crystalline materials

Abstract

Abstract The thermal resistivities W s (=1/κ s ) of electrically insulating, crystalline or polycrystalline samples under test (SUTs), all comprising host material such as CVD diamond, can be determined rather quickly once the thermal resistivities W=1/κ of at least two other host crystalline or polycrystalline bodies B 1 and B 2 comprising the same host material as that of the SUTs, and containing the same type of impurity or combination of impurities as the SUTs, are measured by some other technique. These determinations of these thermal resistivities W s of the SUTs thus require only the measurements of the optical absorptivities α 1 and α 2 and of the thermal resistivities W 1 and W 2 , respectively, of at least each of the two other bodies B 1 and B 2 and only of the optical absorptivities α s of each of the SUTs by such other technique. These determinations of W s rely on our discovery that the following linear relationship exists: W=A+Cα, where A and C are constants so long as the type of impurity or combination of impurities in all the bodies B 1 , B 2 , and SUTs is the same, even though the impurities or combination of impurities have different concentrations in the bodies B 1 and B 2 , as well as in the SUTs.

Inventors

• 👤 John E. Graebner
• 👤 Sungho Jin

Bibliographic Details