US5615159A
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US
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Memory system with non-volatile data storage unit and method of initializing same
Assignee: Round Rock Research LLC
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Filing: 1995-11-28
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Granted: 1997-03-25
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Expires: 2015-11-28
Abstract
Abstract A memory system (preferably implemented as an integrated circuit) including an array of memory cells, a control unit for controlling operations of the system (such as programming, reading, and erasing the cells), at least one data storage unit which stores control parameter data determining at least one control parameter for the system, and default parameter circuitry for asserting at desired times one or both of: default control parameter data (regardless of the control parameter data stored in each data storage unit); and at least one default voltage level (in place of an otherwise asserted voltage level). In preferred embodiments, the default control parameter data (or voltage levels) are asserted during a test initialize mode in response to an initialization signal generated by the control unit, for use in initializing internal control registers (and voltage levels) of the system so that an external program for controlling the system during the test mode can start from a known condition. Other embodiments are methods for asserting default control parameter data of memory systems at desired times during system operation (regardless of the values of control parameter data stored in storage units of the system), methods for asserting default voltage values at desired times during operation of such systems, and memory systems capable of performing such methods.
Inventors
- 👤 Frankie F. Roohparvar
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 00:19
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/06; G11C16/10; G11C16/20; G11C29/00; G11C29/04; G11C29/08; G11C29/12; G11C29/14; G11C29/16; G11C29/44; G11C29/46
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
103 words
A memory system, including: an array of memory cells; control means for generating control signals for controlling operations of the system, said operations including programming the memory cells and reading the memory cells; a data storage unit which stores control parameter data determining at least one control parameter for at least one of the operations; and default parameter means coupled to the data storage unit for outputting default parameter data rather than the control parameter data in response to a first control signal from the control means, wherein the default parameter data determines a default value of the at least one control parameter.
Claim 2
Dependent Claim
103 words
A memory system, including: an array of memory cells; control means for generating control signals for controlling operations of the system, said operations including programming the memory cells and reading the memory cells; a data storage unit which stores control parameter data determining at least one control parameter for at least one of the operations; and default parameter means coupled to the data storage unit for outputting default parameter data rather than the control parameter data in response to a first control signal from the control means, wherein the default parameter data determines a default value of the at least one control parameter.
Claim 3
Dependent Claim
13 words
The system of claim 1, wherein said memory system is an integrated circuit.
Claim 4
Dependent Claim
61 words
The system of claim 1, also including: a reference voltage means for asserting a reference voltage for use by the system during at least one of the operations, wherein the default parameter means receives the reference voltage, and outputs a default voltage rather than the reference voltage, in addition to said default parameter data, in response to the first control signal.
Claim 5
Dependent Claim
60 words
The system of claim 1, wherein the system is operable in a selected one of a test mode and a normal operating mode, the control means outputs the first control signal with a first level during the test mode, and the default parameter means outputs the default parameter data in response to said first level of the first control signal.
Claim 6
Dependent Claim
44 words
The system of claim 1, wherein the default parameter means is a logic circuit which receives the control parameter data from the data storage unit and outputs the default parameter data rather than the control parameter data in response to the first control signal.
Claim 7
Dependent Claim
63 words
The system of claim 5, wherein the logic circuit includes: an inverter having an input which receives the first control signal and an output for asserting an inverted first control signal in response to the first control signal; and an AND gate having a first input which receives the inverted first control signal and a second input which receives the control parameter data.
Claim 8
Dependent Claim
47 words
The system of claim 1, wherein the default parameter means resets the data storage unit in response to the first control signal, thereby causing the data storage unit to output the default parameter data rather than the control parameter data in response to the first control signal.
Claim 9
Dependent Claim
67 words
The system of claim 1, also including: circuitry for addressing the array of memory cells using a memory address, said memory address corresponding to a portion of the array, and wherein the control means includes circuitry which receives the default parameter data from the default parameter means and varies the portion of the array which corresponds to the memory address in response to the default parameter data.
Claim 10
Dependent Claim
29 words
The system of claim 1, wherein the memory cells are flash memory cells and the data storage unit includes a flash memory cell for storing the control parameter data.
Claim 11
Dependent Claim
16 words
The system of claim 1, wherein the data storage unit is a non-volatile data storage unit.
Claim 12
Dependent Claim
83 words
A memory system, including: an array of memory cells; control means for generating control signals for controlling operations of the system, said operations including programming the memory cells and reading the memory cells; reference voltage means for asserting a reference voltage for use by the system during at least one of the operations; and default parameter means for receiving the reference voltage, and outputting a default voltage rather than the reference voltage in response to a first control signal from the control means.
Claim 13
Dependent Claim
83 words
A memory system, including: an array of memory cells; control means for generating control signals for controlling operations of the system, said operations including programming the memory cells and reading the memory cells; reference voltage means for asserting a reference voltage for use by the system during at least one of the operations; and default parameter means for receiving the reference voltage, and outputting a default voltage rather than the reference voltage in response to a first control signal from the control means.
Claim 14
Dependent Claim
13 words
The system of claim 11, wherein said memory system is an integrated circuit.
Claim 15
Dependent Claim
59 words
The system of claim 11, wherein the system is operable in a selected one of a test mode and a normal operating mode, the control means asserts the first control signal with a first level during the test mode, and the default parameter means outputs the default voltage in response to said first level of the first control signal.
Claim 16
Dependent Claim
79 words
The system of claim 11, wherein the default parameter means includes: a resistive divider circuit for asserting a default voltage at a first node; and a switch means connected between the first node, the reference voltage means, and an output, for asserting the default voltage at the output in response to a first level of the first control signal and for asserting the reference voltage to the output in response to a second level of the first control signal.
Claim 17
Independent Claim
120 words
A method for operating a memory system in a test mode, said system including a data storage unit and a memory means capable of operating in a normal operating mode under control of signals including a parameter signal indicative of control parameter data stored in the data storage unit, said method including the steps of: (a) asserting a test mode code to the system; (b) entering the test mode in response to the test mode code; and (c) during at least a portion of the test mode, asserting a default signal indicative of default control parameter data to the memory means and operating the memory means under control of the default signal rather than under control of said parameter signal.
Claim 18
Independent Claim
120 words
A method for operating a memory system in a test mode, said system including a data storage unit and a memory means capable of operating in a normal operating mode under control of signals including a parameter signal indicative of control parameter data stored in the data storage unit, said method including the steps of: (a) asserting a test mode code to the system; (b) entering the test mode in response to the test mode code; and (c) during at least a portion of the test mode, asserting a default signal indicative of default control parameter data to the memory means and operating the memory means under control of the default signal rather than under control of said parameter signal.
Claim 19
Dependent Claim
139 words
The method of claim 15, wherein the system includes a first set of pins and a second set of pins, said first set including at least a first pin and a second pin, said method also including the step of: not later than during step (a), asserting a high voltage to each of the pins in the first set, and wherein step (b) includes the steps of comparing the test mode code against predetermined codes, and entering the test mode in response to a match between the test mode code and one of the predetermined codes, and wherein the first pin remains at the high voltage during the test mode and the second pin undergoes a transition during the test mode from the high voltage to a normal voltage, wherein said normal voltage is lower than said high voltage.
Claim 20
Dependent Claim
49 words
The method of claim 15, wherein a reference voltage is asserted at a first node in said normal operating mode, and also including the step of: (d) during at least a portion of the test mode, asserting a default voltage at the first node rather than said reference voltage.
Claim 21
Independent Claim
87 words
A method for operating a memory system in a test mode, said system including a memory means capable of operating in a normal operating mode in which a reference voltage is asserted at a first node, said method including the steps of: (a) asserting a test mode code to the system; (b) entering the test mode in response to the test mode code; and (c) during at least a portion of the test mode, asserting a default voltage at the first node rather than said reference voltage.
Claim 22
Independent Claim
87 words
A method for operating a memory system in a test mode, said system including a memory means capable of operating in a normal operating mode in which a reference voltage is asserted at a first node, said method including the steps of: (a) asserting a test mode code to the system; (b) entering the test mode in response to the test mode code; and (c) during at least a portion of the test mode, asserting a default voltage at the first node rather than said reference voltage.
Claim 23
Dependent Claim
131 words
The method of claim 18, wherein the system includes a first set of pins and a second set of pins, said first set including at least a first pin and a second pin, said method also including the step of: not later than during step (a), asserting a high voltage to the first set of pins, and wherein step (b) includes the steps of comparing the test mode code against predetermined codes, and entering the test mode in response to a match between the test mode code and one of the predetermined codes, and wherein the first pin remains at the high voltage during the test mode and the second pin undergoes a transition during the test mode from the high voltage to a normal voltage lower than said high voltage.
References Cited (Backward Citations)
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2000-03-24 | 2000-09-23 | 2001-03-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-03-24 | 2004-09-23 | 2005-03-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-03-24 | 2008-09-23 | 2009-03-25 | $7700.00 | Window Closed / Lapsed |