Multilevel gate array integrated circuit structure with perpendicular access to all active device regions

Claim 2

A multilevel gate array integrated circuit structure wherein each region of each active device in the multilevel gate array integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first level of active semiconductor devices formed in and on said semiconductor substrate, each of said active semiconductor devices of said first level having a plurality of semiconductor regions and at least one electrode region; c) a first insulation layer over said first level of semiconductor devices; d) at least one further semiconductor layer formed over said first insulation layer and having active semiconductor devices formed therein to comprise a second level of active semiconductor devices positioned to permit access, perpendicular to the plane of said substrate, to each of said semiconductor and electrode regions of each of said semiconductor devices formed in said first level of active semiconductor devices in said substrate, each of said active semiconductor devices of said second level having a plurality of semiconductor regions and at least one electrode region; and e) a second insulation layer formed over said second level of semiconductor devices; whereby each of said semiconductor regions and said at least one electrode region of each active semiconductor device formed in each of said first level of semiconductor devices and said second level of semiconductor devices is directly accessible perpendicular to the plane of said substrate.

Claim 3

The multilevel gate array integrated circuit structure of claim 1 wherein said active devices comprise MOS devices, said semiconductor regions comprise source regions and drain regions, and said electrode regions comprise gate electrode regions.

Claim 4

The MOS-type multilevel gate array integrated circuit structure of claim 2 wherein said multilevel structure comprises two levels of active semiconductor devices.

Claim 5

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over one of said one or more first source regions and arranged to permit access, normal to the plane of said substrate, to said underlying first source region; ii) a second drain region formed over one of said one or more first drain regions and arranged to permit access, normal to the plane of said substrate, to said underlying first drain region; and iii) a second gate electrode region formed over one of said one or more first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said underlying first gate electrode region; and e) a second insulation layer formed over said second semiconductor device level; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible perpendicular to the plane of said substrate.

Claim 6

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over one of said one or more first source regions and arranged to permit access, normal to the plane of said substrate, to said underlying first source region; ii) a second drain region formed over one of said one or more first drain regions and arranged to permit access, normal to the plane of said substrate, to said underlying first drain region; and iii) a second gate electrode region formed over one of said one or more first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said underlying first gate electrode region; and e) a second insulation layer formed over said second semiconductor device level; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible perpendicular to the plane of said substrate.

Claim 7

The multilevel gate array MOS-type integrated circuit structure of claim 4 wherein each of said one or more source regions in said first semiconductor device level is formed having at least one dimension selected from the group consisting of width and length larger than the same dimension in a corresponding second source region in said second semiconductor device level formed over said each of said one or more first source regions to thereby permit perpendicular access to each of said one or more first source regions formed in said first semiconductor device level.

Claim 8

The multilevel gate array MOS-type integrated circuit structure of claim 4 wherein each of said one or more drain regions in said first semiconductor device level is formed having at least one dimension selected from the group consisting of width and length larger than the same dimension in a corresponding second drain region in said second semiconductor device level formed over said each of said one or more first drain regions to thereby permit perpendicular access to each of said one or more first drain regions formed in said first semiconductor device level.

Claim 9

The multilevel gate array MOS-type integrated circuit structure of claim 4 wherein: said MOS active devices formed in said first semiconductor device level are formed in islands, and each of said islands of said first device level is laterally separated by insulation from other islands in the same level; and said MOS active devices formed in said second semiconductor device level are formed in islands, and each of said islands of said second device level is laterally separated by insulation from other islands in the same level.

Claim 10

The multilevel gate array MOS-type integrated circuit structure of claim 4 wherein one gate electrode region is formed in each island in each level.

Claim 11

The multilevel gate array MOS-type integrated circuit structure of claim 4 wherein two spaced apart gate electrode regions are formed in each island in each level.

Claim 12

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region arranged to permit access, normal to the plane of said substrate, to an underlying one of said one or more first source regions; ii) a second drain region arranged to permit access, normal to the plane of said substrate, to an underlying one of said one or more first drain regions; and iii) a second gate electrode region arranged to permit access, normal to the plane of said substrate, to an underlying one of said one or more first gate electrode regions; e) a second insulation layer formed over said multilevel gate array integrated circuit structure; and f) contact openings formed in said second insulation layer normal to the plane of said substrate to one or more of: i) said source regions, ii) said drain regions, and iii) said gate electrode regions in each of said semiconductor device levels.

Claim 13

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region arranged to permit access, normal to the plane of said substrate, to an underlying one of said one or more first source regions; ii) a second drain region arranged to permit access, normal to the plane of said substrate, to an underlying one of said one or more first drain regions; and iii) a second gate electrode region arranged to permit access, normal to the plane of said substrate, to an underlying one of said one or more first gate electrode regions; e) a second insulation layer formed over said multilevel gate array integrated circuit structure; and f) contact openings formed in said second insulation layer normal to the plane of said substrate to one or more of: i) said source regions, ii) said drain regions, and iii) said gate electrode regions in each of said semiconductor device levels.

Claim 14

The multilevel gate array MOS-type integrated circuit structure of claim 10 wherein each of said one or more first source regions in said first semiconductor device level formed beneath a corresponding second source region is formed having at least one dimension selected from the group consisting of width and length larger than the same dimension in said corresponding second source region in said second semiconductor device level above said each of said one or more first source regions to thereby permit perpendicular access, through said first insulation layer, to each of said one or more first source regions formed in said first semiconductor device level.

Claim 15

The multilevel gate array MOS-type integrated circuit structure of claim 10 wherein a portion of each of said one or more first gate electrode regions in said first semiconductor device level formed beneath a corresponding second gate electrode region is formed in a location different than said corresponding second gate electrode region in said second semiconductor device level above said each of said one or more first gate electrode regions to thereby permit perpendicular access, through said first insulation layer, to each of said one or more first gate electrode regions formed in said first semiconductor device level.

Claim 16

The multilevel gate array MOS-type integrated circuit structure of claim 10 wherein each of said one or more first drain regions in said first semiconductor device level formed beneath a corresponding second drain region is formed having at least one dimension selected from the group consisting of width and length larger than the same dimension in said corresponding second drain region in said second semiconductor device level above said each of said one or more first drain region to thereby permit perpendicular access, through said first insulation layer, to each of said one or more first drain regions formed in said first semiconductor device level.

Claim 17

The multilevel gate array MOS-type integrated circuit structure of claim 10 wherein each of said one or more second drain regions in said second semiconductor device level is formed with one or more oxide islands therein to thereby permit perpendicular access, through said first insulation layer and through said one or more oxide islands, to each of said one or more first drain regions formed in said first semiconductor device level beneath a corresponding second drain region in said second semiconductor device level.

Claim 18

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over one of said one or more first source regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first source regions; ii) a second drain region formed over one of said one or more first drain regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first drain regions; and iii) a second gate electrode region formed over one of said one or more first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first gate electrode regions, wherein a portion of each of said one or more first gate electrode regions in said first semiconductor device level is formed in a location different than the corresponding second gate electrode region in said second semiconductor device level above said each of said one or more first gate electrode regions to thereby permit direct perpendicular access through said first insulation layer to said each of said one or more first gate electrode regions formed in said first semiconductor device level; and e) a second insulation layer formed over said second semiconductor device level; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible normal to the plane of said substrate.

Claim 19

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over one of said one or more first source regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first source regions; ii) a second drain region formed over one of said one or more first drain regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first drain regions; and iii) a second gate electrode region formed over one of said one or more first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first gate electrode regions, wherein a portion of each of said one or more first gate electrode regions in said first semiconductor device level is formed in a location different than the corresponding second gate electrode region in said second semiconductor device level above said each of said one or more first gate electrode regions to thereby permit direct perpendicular access through said first insulation layer to said each of said one or more first gate electrode regions formed in said first semiconductor device level; and e) a second insulation layer formed over said second semiconductor device level; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible normal to the plane of said substrate.

Claim 20

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; and d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over one of said one or more first source regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first source regions; ii) a second drain region formed over one of said one or more first drain regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more first drain regions, wherein said second drain region in said second semiconductor device level is formed with one or more oxide islands therein to thereby permit direct perpendicular access, through said first insulation layer and through said one or more oxide islands, to said one of said one or more first drain regions formed in said first semiconductor device level beneath said second drain region in said second semiconductor device level; and iii) a second gate electrode region formed over one of said one or more first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more first gate electrode regions; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible normal to the plane of said substrate.

Claim 21

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising one or more first source regions, one or more first drain regions, and one or more first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; and d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over one of said one or more first source regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more of said first source regions; ii) a second drain region formed over one of said one or more first drain regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more first drain regions, wherein said second drain region in said second semiconductor device level is formed with one or more oxide islands therein to thereby permit direct perpendicular access, through said first insulation layer and through said one or more oxide islands, to said one of said one or more first drain regions formed in said first semiconductor device level beneath said second drain region in said second semiconductor device level; and iii) a second gate electrode region formed over one of said one or more first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said one of said one or more first gate electrode regions; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible normal to the plane of said substrate.

Claim 22

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising first source regions, first drain regions, and first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over each of said first source regions and arranged to permit access, normal to the plane of said substrate, to said corresponding underlying first source region; ii) a second drain region formed over each of said first drain regions and arranged to permit access, normal to the plane of said substrate, to said corresponding underlying first drain region; and iii) a second gate electrode region formed over each of said first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said corresponding underlying first gate electrode region; and e) a second insulation layer formed over said second semiconductor device level; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible perpendicular to the plane of said substrate.

Claim 23

A multilevel gate array MOS-type integrated circuit structure wherein each region of each active device in the integrated circuit structure is directly accessible normal to the plane of the underlying substrate comprising: a) a semiconductor substrate; b) a first semiconductor device level formed in and on said semiconductor substrate comprising first source regions, first drain regions, and first gate electrode regions; c) a first insulation layer formed over said first semiconductor device level; d) a second semiconductor device level formed over said first semiconductor device level comprising: i) a second source region formed over each of said first source regions and arranged to permit access, normal to the plane of said substrate, to said corresponding underlying first source region; ii) a second drain region formed over each of said first drain regions and arranged to permit access, normal to the plane of said substrate, to said corresponding underlying first drain region; and iii) a second gate electrode region formed over each of said first gate electrode regions and arranged to permit access, normal to the plane of said substrate, to said corresponding underlying first gate electrode region; and e) a second insulation layer formed over said second semiconductor device level; whereby each of said source regions, drain regions, and gate electrode regions in both of said semiconductor device levels is directly accessible perpendicular to the plane of said substrate.