Abstract A failure analyzer for the semiconductor tester which tests a plurality of devices at the same time and stores a first fail information for each device under test (DUT) and inhibits further fail information from being stored in a fail memory. The failure analyzer includes a plurality of comparators connected to corresponding DUT for generating a fail signal when the output signal from the DUT disagrees with an expected signal, a fail memory connected to the comparators to store fail information on the DUT, a plurality of fail receiving circuits for receiving the fail signals from the comparators wherein each of the fail receiving circuits counts the number of the fail signal from corresponding one of the comparators and generating a counted signal when the fail signal reaches a predetermined number, a plurality of inhibit circuits connected to the fail receiving circuits to inhibit the fail signals received after the predetermined number from affecting the fail memory, an OR-gate for combining output signals from the inhibit circuits to generate an overall fail signal, and a fail memory controller connected to the fail memory to enable the fail memory when receiving the overall fail signal from the OR-gate.
A failure analyzer for a semiconductor tester for simultaneously measuring a plurality of semiconductor devices, comprising: a plurality of comparators connected to corresponding semiconductor devices to be tested (DUT) to receive output signals from said semiconductor devices, each of said comparators generating a fail signal when the output signal from said DUT disagrees with an expected signal; a fail memory connected to outputs of said plurality of comparators to store fail information of said DUT; a plurality of fail receiving circuits for receiving said fail signals from said comparators, each of said fail receiving circuits counting the number of said fail signal from corresponding one of said comparators and generating a counted signal when the number of said fail signal reaches a predetermined value; a plurality of inhibit circuits connected to said fail receiving circuits to inhibit said fail signals received after said counted signal from affecting said fail memory; and an OR-gate for combining output signals from said plurality of inhibit circuits to generate an overall fail signal; and a fail memory controller connected to said fail memory and said OR-gate to enable said fail memory when receiving said overall fail signal from said OR-gate.
Claim 2
Dependent Claim
196 words
A failure analyzer for a semiconductor tester for simultaneously measuring a plurality of semiconductor devices, comprising: a plurality of comparators connected to corresponding semiconductor devices to be tested (DUT) to receive output signals from said semiconductor devices, each of said comparators generating a fail signal when the output signal from said DUT disagrees with an expected signal; a fail memory connected to outputs of said plurality of comparators to store fail information of said DUT; a plurality of fail receiving circuits for receiving said fail signals from said comparators, each of said fail receiving circuits counting the number of said fail signal from corresponding one of said comparators and generating a counted signal when the number of said fail signal reaches a predetermined value; a plurality of inhibit circuits connected to said fail receiving circuits to inhibit said fail signals received after said counted signal from affecting said fail memory; and an OR-gate for combining output signals from said plurality of inhibit circuits to generate an overall fail signal; and a fail memory controller connected to said fail memory and said OR-gate to enable said fail memory when receiving said overall fail signal from said OR-gate.
Claim 3
Dependent Claim
52 words
A failure analyzer as defined in claim 1, wherein each of said fail receiving circuits is a flip-flop which changes state by receiving a first fail signal from said comparator and initiates corresponding one of said inhibit circuits to inhibit fail signal other than said first fail signal from reaching said OR-gate.
Claim 4
Dependent Claim
53 words
A failure analyzer as defined in claim 1, wherein each of said fail receiving circuits is a counter which changes state by receiving a predetermined number of fail signals from said comparator and initiates corresponding one of said inhibit circuits to inhibit fail signals other than said predetermined number from reaching said OR-gate.
Claim 5
Dependent Claim
45 words
A failure analyzer as defined in claim 1, wherein each of said inhibit circuits is an AND-gate one input of which is connected to corresponding one of said comparators and the other input of which is provided with said counted signal from said receiving circuit.
Claim 6
Dependent Claim
44 words
A failure analyzer as defined in claim 1, wherein said failure analyzer further includes a plurality of selectors to selectively transmit either said fail signals from said comparators or said fail signals received before said counted signal from said inhibit circuits to said OR-gate.