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US5610854A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory device and fabrication process thereof

Assignee: Fujitsu Ltd
•
Filing: 1995-11-21
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Granted: 1997-03-11
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Expires: 2015-11-21
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Abstract

Abstract A method for fabricating a semiconductor memory device includes the steps of forming, in a semiconductor substrate of a first conductivity type, a well of a second opposite conductivity type by protecting the substrate surface except for a part where the well of the second conductivity type is to be formed, oxidizing the exposed surface of the semiconductor substrate while using the same mask pattern to form a thick oxide film on the surface of the well, and removing the thick oxide film by an etching process to form a recessed surface on the well.

Inventors

  • 👤 Taiji Ema

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 04:08
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; Y; Y10; Y10S; Y10S438/00; Y10S438/965

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 228 words
A semiconductor memory device, comprising: a semiconductor substrate defined with a peripheral circuit region for carrying peripheral circuits and a memory cell array region for carrying a memory cell array; a first well of a first conductivity type formed in said semiconductor substrate in correspondence to said memory cell array region, said first well having a surface at a first level; a second well of a second, opposite conductivity type formed in said first well, said second well having a surface at a second level lower than said first level, said surface of said second well being separated from said surface of said first well by a stepped boundary; a memory cell transistor provided on said second well; a memory cell capacitor provided on the surface of said second well so as to extend in an upward direction therefrom; an insulating film provided on said memory cell array so as to cover said memory cell transistor and said memory cell capacitor; a conductive region provided on said semiconductor substrate so as to extend from the surface of said second well to the surface of said first well across said stepped boundary; a contact hole provided on said insulating film in correspondence to said first well so as to expose said conductive region; and an electrode filling said contact hole to establish an electrical contact with said conductive region.
Claim 2
Dependent Claim 228 words
A semiconductor memory device, comprising: a semiconductor substrate defined with a peripheral circuit region for carrying peripheral circuits and a memory cell array region for carrying a memory cell array; a first well of a first conductivity type formed in said semiconductor substrate in correspondence to said memory cell array region, said first well having a surface at a first level; a second well of a second, opposite conductivity type formed in said first well, said second well having a surface at a second level lower than said first level, said surface of said second well being separated from said surface of said first well by a stepped boundary; a memory cell transistor provided on said second well; a memory cell capacitor provided on the surface of said second well so as to extend in an upward direction therefrom; an insulating film provided on said memory cell array so as to cover said memory cell transistor and said memory cell capacitor; a conductive region provided on said semiconductor substrate so as to extend from the surface of said second well to the surface of said first well across said stepped boundary; a contact hole provided on said insulating film in correspondence to said first well so as to expose said conductive region; and an electrode filling said contact hole to establish an electrical contact with said conductive region.

References Cited (Backward Citations)

US4561170A Cited
US4696092A Cited
US5286666A Cited
US4882289A Cited
JPH0277153A Cited
US5336915A Cited
US5442238A Cited
US5504708A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-03-10 2000-09-09 2001-03-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-03-10 2004-09-09 2005-03-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-03-10 2008-09-09 2009-03-11 $7700.00 Window Closed / Lapsed

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