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US5605724A
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Method of forming a metal conductor and diffusion layer
Assignee: Texas Instruments Inc
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Filing: 1995-03-20
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Granted: 1997-02-25
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Expires: 2015-03-20
Abstract
Abstract A method for minimizing reaction between metal conductors and other metals to minimize change in sheet resistance of the conductors upon heat treatment which includes providing a substrate. The substrate is preferably one of a dielectric, a metal or a semiconductor. A metallic diffusion barrier layer, preferably one of TiN, TiW or TiWN and preferably having a thickness of from about 10 nanometers to about 100 nanometers, is deposited on the substrate, preferably by one of sputtering, electron beam evaporation or chemical vapor deposition. The exposed surface of the metallic diffusion barrier layer is treated with a plasma, preferably an oxygen plasma, a nitrous oxide plasma or a plasma of an oxygen-containing species. An electrical conductor, preferably one of aluminum, aluminum-metal alloys, copper or copper-metal alloys and preferably having a thickness of from about 100 nanometers to about 1200 nanometers, is then deposited on the plasma-treated surface of the metallic diffusion barrier layer. The layers can be formed as one of a blanket or continuous films over the substrate. The conductor can then be patterned.
Inventors
- 👤 Qi-Zhong Hong
- 👤 Robert H. Havemann
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 02:54
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/047; H10W20/048; H10W20/033
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
73 words
A method for minimizing reaction between a metal conductor and another metal to minimize change in sheet resistance of said conductor upon heat treatment, comprising the steps of: (a) providing a substrate; (b) depositing a diffusion barrier layer having a metal component on said substrate; (c) treating the exposed surface of said diffusion barrier layer with a plasma; and (d) depositing an electrical conductor on plasma treated surface of said diffusion barrier layer.
Claim 2
Independent Claim
73 words
A method for minimizing reaction between a metal conductor and another metal to minimize change in sheet resistance of said conductor upon heat treatment, comprising the steps of: (a) providing a substrate; (b) depositing a diffusion barrier layer having a metal component on said substrate; (c) treating the exposed surface of said diffusion barrier layer with a plasma; and (d) depositing an electrical conductor on plasma treated surface of said diffusion barrier layer.
Claim 3
Dependent Claim
26 words
The method of claim 1 wherein a top portion of said substrate below said metal conductor is one of a dielectric, a metal, or a semiconductor.
Claim 4
Dependent Claim
17 words
The method of claim 1 wherein said diffusion barrier layer is one of TiN, TiW, or TiWN.
Claim 5
Dependent Claim
26 words
The method of claim 3 wherein said plasma is essentially one of an oxygen plasma, a nitrous oxide plasma or a plasma of an oxygen-containing species.
Claim 6
Dependent Claim
26 words
The method of claim 1 wherein said plasma is essentially one of an oxygen plasma, a nitrous oxide plasma or a plasma of an oxygen-containing species.
Claim 7
Dependent Claim
22 words
The method of claim 1 wherein said conductor is taken from the class consisting of aluminum, aluminum-metal alloys, copper and copper-metal alloys.
Claim 8
Dependent Claim
23 words
The method of claim 1 wherein said diffusion barrier layer is deposited by one of sputtering, electron beam evaporation or chemical vapor deposition.
Claim 9
Dependent Claim
15 words
The method of claim 7 wherein the thickness of said diffusion barrier layer is from.
Claim 10
Dependent Claim
20 words
The method of claim 8 wherein the thickness of said conductor is from about 100 nanometers to about 1200 nanometers.
Claim 11
Dependent Claim
52 words
The method of claim 9 wherein said plasma is an oxygen plasma providing from about 30 to about 50 percent oxygen in a surface region of said diffusion barrier layer having a thickness sufficient to substantially block reaction between said electrical conductor and said diffusion barrier layer up to about 50 Å.
Claim 12
Dependent Claim
18 words
The method of claim 9 wherein said layers are formed as one of a blanket or continuous films.
Claim 13
Dependent Claim
13 words
The method of claim 11 further including the step of patterning said conductor.
Claim 14
Dependent Claim
20 words
The method of claim 1 wherein the thickness of said conductor is from about 100 nanometers to about 1200 nanometers.
Claim 15
Dependent Claim
22 words
The method of claim 1 wherein the thickness of said diffusion barrier layer is from about 10 nanometers to about 100 nanometers.
Claim 16
Dependent Claim
18 words
The method of claim 1 wherein said layers are formed as one of a blanket or continuous films.
Claim 17
Dependent Claim
13 words
The method of claim 1 further including the step of patterning said conductor.
Claim 18
Dependent Claim
52 words
The method of claim 1 wherein said plasma is an oxygen plasma providing from about 30 to about 50 percent oxygen in a surface region of said diffusion barrier layer having a thickness sufficient to substantially block reaction between said electrical conductor and said diffusion barrier layer up to about 50 Å.
Claim 19
Independent Claim
76 words
A method for forming a combined metal conductor and diffusion barrier layer having stabilized sheet resistance upon heat treatment, comprising the steps of: providing a substrate; forming a diffusion barrier layer by depositing a diffusion barrier material having a metal component on said substrate; treating an exposed surface of said diffusion barrier layer with a plasma; depositing a metal layer on said plasma treated exposed surface; and etching said metal layer to form said metal conductor.
Claim 20
Independent Claim
76 words
A method for forming a combined metal conductor and diffusion barrier layer having stabilized sheet resistance upon heat treatment, comprising the steps of: providing a substrate; forming a diffusion barrier layer by depositing a diffusion barrier material having a metal component on said substrate; treating an exposed surface of said diffusion barrier layer with a plasma; depositing a metal layer on said plasma treated exposed surface; and etching said metal layer to form said metal conductor.
Claim 21
Dependent Claim
23 words
The method of claim 18, wherein said diffusion barrier layer comprises a material selected from the group consisting of TiN, TiW, and TiWN.
Claim 22
Dependent Claim
12 words
The method of claim 18, wherein said plasma is an oxygen plasma.
Claim 23
Dependent Claim
55 words
The method of claim 18, wherein said plasma is an oxygen plasma providing from about 30 to about 50 percent oxygen in a surface region of said diffusion barrier layer, said surface region having a thickness sufficient to substantially block reaction between said electrical conductor and said diffusion barrier layer up to about 50 Å.
Claim 24
Dependent Claim
19 words
The method of claim 18, wherein said diffusion barrier layer has a thickness in the range of 10-100 nanometers.
References Cited (Backward Citations)
No citation records indexed.
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-02-25 | 2000-08-26 | 2001-02-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-02-25 | 2004-08-26 | 2005-02-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-02-25 | 2008-08-26 | 2009-02-25 | $7700.00 | Window Closed / Lapsed |