US5594741A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for control of random test vector generation
Assignee: Samsung Electronics Co Ltd
•
Filing: 1994-11-28
•
Granted: 1997-01-14
•
Expires: 2014-11-28
Abstract
Abstract A method of testing an integrated circuit design includes the steps of providing a logical model of an integrated circuit, having a plurality of data ports, providing at least two simulators, the first simulator coupled to a first data port of the integrated circuit model, and the second simulator coupled to a second different data ports of said integrated circuit model. The further includes the steps of providing an instruction stream to the first and second simulators, the instruction stream including at least two instruction threads corresponding to the at least two simulators, the simulators providing signals to the data ports in accordance with instructions provided from each of the instruction threads. In addition, the method further includes the step of delaying the first simulator from processing its corresponding instruction thread until dependencies between instruction threads have been satisfied.
Inventors
- 👤 Paul M. Kinzelman
- 👤 Nicholas A. Warchol
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 10:42
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3183; G01R31/318307; Y; Y10; Y10S; Y10S706/00; Y10S706/902; Y10S706/919; Y10S706/92
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
165 words
A method of providing a test set for testing computer model comprising the steps of: providing a logical model of an integrated circuit, having a plurality of data ports; providing at least two simulators, a first simulator coupled to a first one of said plurality of data ports of said integrated circuit model, and second simulator coupled to a second different one of said plurality of data ports of said integrated circuit model; providing an instruction stream to said first and second simulators, said instruction stream comprising at least two instruction threads corresponding to said at least two simulators, said simulators providing signals to said data ports in accordance with instructions provided from each of said instruction threads, wherein each of said instruction threads includes command instructions for providing command data to said corresponding data port; and delaying said first simulator from processing its corresponding instruction thread when a dependency is present between said at least two instruction threads until said dependency has been satisfied.
Claim 2
Independent Claim
165 words
A method of providing a test set for testing computer model comprising the steps of: providing a logical model of an integrated circuit, having a plurality of data ports; providing at least two simulators, a first simulator coupled to a first one of said plurality of data ports of said integrated circuit model, and second simulator coupled to a second different one of said plurality of data ports of said integrated circuit model; providing an instruction stream to said first and second simulators, said instruction stream comprising at least two instruction threads corresponding to said at least two simulators, said simulators providing signals to said data ports in accordance with instructions provided from each of said instruction threads, wherein each of said instruction threads includes command instructions for providing command data to said corresponding data port; and delaying said first simulator from processing its corresponding instruction thread when a dependency is present between said at least two instruction threads until said dependency has been satisfied.
Claim 3
Dependent Claim
35 words
The method of claim 1, wherein each of said instruction threads includes responder instructions for providing data to one of said plurality of ports of said structural model in response to signals from said port.
Claim 4
Dependent Claim
46 words
The method of claim 1, wherein said step of delaying is responsive to a synchronizing instruction in said instruction stream which precludes said first simulator from processing said corresponding instruction thread until a selected instruction in said second instruction thread is processed by said second simulator.
Claim 5
Dependent Claim
34 words
The method of claim 3, wherein said synchronizing instruction includes a bit mask having at least two bits wherein each bit of said bit mask corresponds to one of said at least two simulators.
Claim 6
Dependent Claim
51 words
The method of claim 4, wherein at least one of said simulators is precluded from processing a commander instruction from said corresponding instruction thread responsive to a set condition of said corresponding bit of said bit mask and a set condition of at least one other bit in said bit mask.
Claim 7
Dependent Claim
43 words
The method of claim 4, wherein said simulator precluded from processing said corresponding instruction thread is allowed to process said corresponding instruction thread when said simulator corresponding to said one other set bit in said bit mask completes processing of said synchronization instruction.
Claim 8
Independent Claim
91 words
A method of providing a test set for testing a computer model having a plurality of simulators, said method comprising the steps of: selecting a base instruction set, said base instruction set including a plurality of instructions for each of said plurality of simulators; randomly selecting an instruction from said base instruction set to provide said test set; identifying instructions of said test set which require predetermined conditions to be completed before execution; and modifying said identified instruction to preclude execution of said identified instruction until said predetermined condition is satisfied.
Claim 9
Independent Claim
91 words
A method of providing a test set for testing a computer model having a plurality of simulators, said method comprising the steps of: selecting a base instruction set, said base instruction set including a plurality of instructions for each of said plurality of simulators; randomly selecting an instruction from said base instruction set to provide said test set; identifying instructions of said test set which require predetermined conditions to be completed before execution; and modifying said identified instruction to preclude execution of said identified instruction until said predetermined condition is satisfied.
Claim 10
Dependent Claim
75 words
The method of claim 7, wherein said step of modifying said identified instruction further comprises the steps of: inserting a synchronization instruction before said identified instruction, said synchronization instruction having a bit mask with each bit of said bit mask corresponding to one of said plurality of simulators, and with each set bit of said bit mask indicating that said corresponding simulator should be synchronized to said identified instruction before said identified instruction is executed.
References Cited (Backward Citations)
US4194113A
Cited
US4183459A
Cited
US4282584A
Cited
US4306286A
Cited
US4527798A
Cited
US4823119A
Cited
US4635259A
Cited
US4687988A
Cited
US5214655A
Cited
US4873656A
Cited
US5010331A
Cited
US5202889A
Cited
US5233612A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-01-14 | 2000-07-15 | 2001-01-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-01-14 | 2004-07-15 | 2005-01-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-01-14 | 2008-07-15 | 2009-01-14 | $7700.00 | Window Closed / Lapsed |