Trench depletion MOSFET

Claim 2

A high power metal oxide semiconductor field effect trench transistor device exhibiting relatively low on-resistance and relatively high breakdown voltage, said device comprising: a wafer of semiconductor material having first and second opposing semiconductor surfaces, said wafer of semiconductor material including a relatively lightly doped region of a first conductivity type, a plurality of spaced narrow trenches perpendicularly formed in said wafer and extending from said first semiconductor surface, at least a portion of said relatively lightly doped region being disposed between said trenches; gate electrode means disposed in said trenches and spaced from said portion of said relatively lightly doped region by a layer of gate insulation material; a first relatively highly doped region of said first conductivity type disposed between and adjacent to said first semiconductor surface and said relatively lightly doped region; and a first region of a second conductivity type opposite to said first conductivity type, said first region of said second conductivity type being formed in said wafer and extending from said first semiconductor surface adjacent, in a first planar direction, to said first relatively highly doped region of said first conductivity type and directly contacting, in a second planar direction orthogonal to said first planar direction, to said gate insulation material, thereby forming a MOSFET of said second conductivity type, said first region of said second conductivity type comprising a drain region of said MOSFET of said second conductivity type and forming a drain for carriers of said second conductivity type generated in said portion of said relatively lightly doped region of said first conductivity type between said gates to create a deep-depletion region therein and provide enhanced forward blocking capability for the device when a voltage is applied to said gate electrode means to turn off the device.

Claim 3

The device of claim 1, further comprising a second region of said second conductivity type opposite to said first conductivity type formed in said wafer between said trenches and extending from said first semiconductor surface through said first relatively highly doped region of said first conductivity type and through at least a part of said relatively lightly doped region of said first conductivity type, said second region of said second conductivity type being spaced from said trenches on opposite sides thereof by said first relatively highly doped region of said first conductivity type and by said part of said relatively lightly doped region of said first conductivity type through which said second region of said second conductivity type extends; whereby, when said voltage is applied to said gate electrode means to turn off the device, carriers of said first conductivity type in said portion of said relatively lightly doped region of said first conductivity type between said gates are depleted from said relatively lightly doped region of said first conductivity type between said gate electrode means by action of gate depletion and junction depletion to further enhance the forward blocking capability for the device.

Claim 4

The device of claim 2, wherein said relatively lightly doped region of said first conductivity type extends beneath and laterally under said trenches.

Claim 5

The device of claim 2, further comprising a second relatively highly doped region of said first conductivity type disposed between and adjacent to said second semiconductor surface and said relatively lightly doped region of said first conductivity type.

Claim 6

The device of claim 4, wherein said second relatively highly doped region of said first conductivity type extends upwardly from said second semiconductor surface and between said trenches.

Claim 7

The device of claim 2, further comprising a third region of said second conductivity type disposed between and adjacent to said second semiconductor surface and said relatively lightly doped region of said first conductivity type.

Claim 8

The device of claim 2, wherein said first conductivity type comprises N-type and said second conductivity type comprises P-type.

Claim 9

The device of claim 2, wherein said gate electrode means comprises a polysilicon gate.

Claim 10

The device of claim 2, wherein said device is provided in a cellular topology comprising a plurality of parallel-connected identical polygonal cells.

Claim 11

The device of claim 1, wherein said relatively lightly doped region of said first conductivity type extends beneath and laterally under said trenches.

Claim 12

The device of claim 1, further comprising a second relatively highly doped region of said first conductivity type disposed between and adjacent to said second semiconductor surface and said relatively lightly doped region of said first conductivity type.

Claim 13

The device of claim 1, wherein said second relatively highly doped region of said first conductivity type extends upwardly from said second semiconductor surface and between said trenches.

Claim 14

The device of claim 1, further comprising a first relatively highly doped region of said second conductivity type disposed between and adjacent to said second semiconductor surface and said relatively lightly doped region of said first conductivity type.

Claim 15

The device of claim 1, wherein said first conductivity type comprises N-type and said second conductivity type comprises P-type.

Claim 16

The device of claim 1, wherein said gate electrode means comprises a polysilicon gate.

Claim 17

The device of claim 1, wherein said device is provided in a cellular topology comprising a plurality of parallel-connected identical cells.

Claim 18

The device of claim 16, wherein each of said plurality of parallel-connected identical cells has a polygonal shape.

Claim 19

A high power metal oxide semiconductor field effect transistor device exhibiting relatively low on-resistance and relatively high breakdown voltage, said device comprising: a wafer of semiconductor material having first and second opposing semiconductor surfaces; a relatively lightly doped region of a first conductivity type formed in said wafer and extending from said first semiconductor surface to a substrate portion of said wafer, said substrate portion comprising a region of a second conductivity type; gate insulation means on said first semiconductor surface and disposed at least on said relatively lightly doped region of said first conductivity type; gate electrode means disposed over said gate insulation means; a relatively highly doped drain region of said first conductivity type formed in said wafer and extending from said first semiconductor surface to said substrate portion of said wafer, said drain region being disposed laterally and adjacent to said relatively lightly doped region of said first conductivity type on a first side thereof; a relatively highly doped source region of said first conductivity type formed in said wafer and extending from said first semiconductor surface to said substrate portion of said wafer, said source region being disposed laterally and adjacent to said relatively lightly doped region of said first conductivity type on a second side thereof opposite to said first side; a first region of said second conductivity type opposite to said first conductivity type, said first region of said second conductivity type being formed in said wafer and extending from said first semiconductor surface adjacent to said relatively highly doped source region of said first conductivity type; whereby, when a voltage is applied to said gate electrode means to turn off the device, said first region of said second conductivity type forms a drain for carriers of said second conductivity type generated in said relatively lightly doped region of said first conductivity type under said gate electrode means to create a deep-depletion region therein and provide enhanced forward blocking capability for the device.

Claim 20

A high power metal oxide semiconductor field effect transistor device exhibiting relatively low on-resistance and relatively high breakdown voltage, said device comprising: a wafer of semiconductor material having first and second opposing semiconductor surfaces; a relatively lightly doped region of a first conductivity type formed in said wafer and extending from said first semiconductor surface to a substrate portion of said wafer, said substrate portion comprising a region of a second conductivity type; gate insulation means on said first semiconductor surface and disposed at least on said relatively lightly doped region of said first conductivity type; gate electrode means disposed over said gate insulation means; a relatively highly doped drain region of said first conductivity type formed in said wafer and extending from said first semiconductor surface to said substrate portion of said wafer, said drain region being disposed laterally and adjacent to said relatively lightly doped region of said first conductivity type on a first side thereof; a relatively highly doped source region of said first conductivity type formed in said wafer and extending from said first semiconductor surface to said substrate portion of said wafer, said source region being disposed laterally and adjacent to said relatively lightly doped region of said first conductivity type on a second side thereof opposite to said first side; a first region of said second conductivity type opposite to said first conductivity type, said first region of said second conductivity type being formed in said wafer and extending from said first semiconductor surface adjacent to said relatively highly doped source region of said first conductivity type; whereby, when a voltage is applied to said gate electrode means to turn off the device, said first region of said second conductivity type forms a drain for carriers of said second conductivity type generated in said relatively lightly doped region of said first conductivity type under said gate electrode means to create a deep-depletion region therein and provide enhanced forward blocking capability for the device.

Claim 21

The device of claim 18, wherein said first conductivity type comprises N-type and said second conductivity type comprises P-type.

Claim 22

The device of claim 18, wherein said gate electrode means comprises a polysilicon gate.