Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
90 words
A process for forming a multilevel electronic interconnect structure, said process comprising the steps of: providing a main aluminum layer over a substrate surface; selectively masking said main aluminum layer to define exposed areas; carrying out a barrier anodization process on said main aluminum layer to form a surface barrier oxide on the exposed areas of said main aluminum layer; removing the masking; providing an upper aluminum layer over said main aluminum layer; selectively masking said upper aluminum layer; and subjecting said main and upper aluminum layers to porous anodization.
Claim 2
Dependent Claim
90 words
A process for forming a multilevel electronic interconnect structure, said process comprising the steps of: providing a main aluminum layer over a substrate surface; selectively masking said main aluminum layer to define exposed areas; carrying out a barrier anodization process on said main aluminum layer to form a surface barrier oxide on the exposed areas of said main aluminum layer; removing the masking; providing an upper aluminum layer over said main aluminum layer; selectively masking said upper aluminum layer; and subjecting said main and upper aluminum layers to porous anodization.
Claim 3
Dependent Claim
140 words
A process for forming a multilevel electronic interconnect structure, said electronic interconnect structure having level conductive paths parallel to a substrate and interlevel electrical interconnections perpendicular to said substrate, said process comprising the steps of: providing a main aluminum layer over said substrate surface; defining level conductive paths by forming a blocking mask on said main aluminum layer, said blocking mask leaving exposed areas corresponding to said level conductive paths; carrying out a barrier anodization process to form a surface barrier oxide on said main aluminum layer over said level conductive paths; removing the blocking mask; providing an upper aluminum layer over the main aluminum layer; defining interlevel interconnections by forming a blocking mask on said upper aluminum layer, said blocking mask covering areas corresponding to said interlevel interconnections; and subjecting said main and upper aluminum layers to porous anodization.
Claim 4
Dependent Claim
140 words
A process for forming a multilevel electronic interconnect structure, said electronic interconnect structure having level conductive paths parallel to a substrate and interlevel electrical interconnections perpendicular to said substrate, said process comprising the steps of: providing a main aluminum layer over said substrate surface; defining level conductive paths by forming a blocking mask on said main aluminum layer, said blocking mask leaving exposed areas corresponding to said level conductive paths; carrying out a barrier anodization process to form a surface barrier oxide on said main aluminum layer over said level conductive paths; removing the blocking mask; providing an upper aluminum layer over the main aluminum layer; defining interlevel interconnections by forming a blocking mask on said upper aluminum layer, said blocking mask covering areas corresponding to said interlevel interconnections; and subjecting said main and upper aluminum layers to porous anodization.
Claim 5
Dependent Claim
53 words
A process according to claim 2, wherein the step of porous anodization is carried out by way of immersing the substrate into an electrolyte at a rate of 0.4-1.0×10 -4 m/s, with the substrate surface substantially perpendicular to the electrolyte surface; and keeping the substrate in the electrolyte until the aluminum is through-anodized.
Claim 6
Dependent Claim
77 words
A process according to claim 2, wherein the main aluminum layer is formed such that its thickness uniformly increases from one of the edges to the opposite edge, and the thickness gain of the aluminum layer measured in nm per mm unit substrate length is within the range of from 1.5 to 2.0, and wherein the voltage in the step of porous anodization is supplied from the side of the substrate having the larger thickness of aluminum.