Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
111 words
A solid-state imaging device comprising: a plurality of pixels arranged in an array, said plurality of pixels forming an image area of said imaging device; a plurality of photodetectors for detecting incident light to generate signal charges; a plurality of charge transfer devices for transferring said signal charges generated in said plurality of photodetectors; each of said plurality of pixels containing one of said plurality of photodetectors and one of said plurality of charge transfer devices; and sensitivity of said plurality of photodetectors varies according to placement of said photodetectors in said image area; wherein said sensitivity has a distribution that cancels nonuniformity of said incident light in said image area.
Claim 2
Dependent Claim
111 words
A solid-state imaging device comprising: a plurality of pixels arranged in an array, said plurality of pixels forming an image area of said imaging device; a plurality of photodetectors for detecting incident light to generate signal charges; a plurality of charge transfer devices for transferring said signal charges generated in said plurality of photodetectors; each of said plurality of pixels containing one of said plurality of photodetectors and one of said plurality of charge transfer devices; and sensitivity of said plurality of photodetectors varies according to placement of said photodetectors in said image area; wherein said sensitivity has a distribution that cancels nonuniformity of said incident light in said image area.
Claim 3
Dependent Claim
27 words
A solid-state imaging device as claimed in claim 1, wherein said sensitivity of said plurality of photodetectors is distributed concentrically with the center of said image area.
Claim 4
Dependent Claim
32 words
A solid-state imaging device as claimed in claim 2, wherein said sensitivity of said plurality of photodetectors is distributed to increase dependent on a distance from said center of said image area.
Claim 5
Dependent Claim
64 words
A solid-state imaging device as claimed in claim 1, wherein said plurality of photodetectors are Schottky-barrier photodiodes, each of said photodiodes having a metal electrode contacted with a semiconductor material; and wherein an interface of said metal electrode and said semiconductor material is doped with an impurity, a doping concentration of said impurity varying according to placement of said photodetectors in said image area.
Claim 6
Dependent Claim
25 words
A solid-state imaging device as claimed in claim 4, wherein said doping concentration of said impurity varies concentrically with the center of said image area.
Claim 7
Dependent Claim
30 words
A solid-state imaging device as claimed in claim 5, wherein said doping concentration of said impurity varies to increase dependent on a distance from said center of said image area.
Claim 8
Dependent Claim
28 words
A solid-state imaging device as claimed in claim 4, wherein said interface of said metal electrode and said semiconductor material is doped with said impurity by selective ion-implantation.
Claim 9
Dependent Claim
116 words
A solid-state device comprising: a plurality of pixels arranged in an array, said plurality of pixels forming an image area of said imaging device; a plurality of Schottky-barrier photodiodes for detecting incident light to generate signal charges; a plurality of charge transfer devices for transferring said signal charges generated in said plurality of photodiodes; each of said plurality of pixels containing one of said plurality of photodiodes and one of said plurality of charge transfer devices; and Schottky-barrier heights of said plurality of photodiodes vary according to placement of said photodiodes in said image area; wherein sensitivity of said plurality of photodiodes has a distribution that cancels nonuniformity of said incident light in said image area.
Claim 10
Dependent Claim
116 words
A solid-state device comprising: a plurality of pixels arranged in an array, said plurality of pixels forming an image area of said imaging device; a plurality of Schottky-barrier photodiodes for detecting incident light to generate signal charges; a plurality of charge transfer devices for transferring said signal charges generated in said plurality of photodiodes; each of said plurality of pixels containing one of said plurality of photodiodes and one of said plurality of charge transfer devices; and Schottky-barrier heights of said plurality of photodiodes vary according to placement of said photodiodes in said image area; wherein sensitivity of said plurality of photodiodes has a distribution that cancels nonuniformity of said incident light in said image area.
Claim 11
Dependent Claim
27 words
A solid-state imaging device as claimed in claim 8, wherein said sensitivity of said plurality of photodiodes is distributed concentrically with the center of said image area.
Claim 12
Dependent Claim
32 words
A solid-state imaging device as claimed in claim 9, wherein said sensitivity of said plurality of photodiodes is distributed to increase dependent on a distance from said center of said image area.
Claim 13
Dependent Claim
59 words
A solid-state imaging device as claimed in claim 8, wherein each of said plurality of photodiodes has a metal electrode contacted with a semiconductor material; and wherein an interface of said metal electrode and said semiconductor material is doped with an impurity, a doping concentration of said impurity varying according to placement of said photodiodes in said image area.
Claim 14
Dependent Claim
25 words
A solid-state imaging device as claimed in claim 11, wherein said doping concentration of said impurity varies concentrically with the center of said image area.
Claim 15
Dependent Claim
30 words
A solid-state imaging device as claimed in claim 12, wherein said doping concentration of said impurity varies to increase dependent on a distance from said center of said image area.
Claim 16
Dependent Claim
28 words
A solid-state imaging device as claimed in claim 11, wherein said interface of said metal electrode and said semiconductor material is doped with said impurity by selective ion-implantation.