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Group IV semiconductor thin films formed at low temperature using nanocrystal precursors

Assignee: Starfire Electronic Development and Marketing Ltd
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Filing: 1994-03-24
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Granted: 1996-11-19
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Expires: 2014-03-24
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Abstract

Abstract Thin films of the Group IV materials silicon and germanium are produced in the range of 2.5 to 25 nm thick from nanocrystal precursors. According to the invention a solid, continuous film of silicon or germanium is formed by depositing a contiguous layer of nanocrystals of the semi-conductor materials onto a substrate, then heating the layer to a temperature below the bulk melting temperature which is nonetheless adequate to melt the nanocrystals and form a continuous liquid thin film upon cooling. The resulting thin film may be doped or intrinsic. The lower processing temperatures make it possible to form these thin semi-conductor films with less stringent thermal requirements on the underlayers, substrates and other related structures, thus supporting applications in microelectronics, solar conversion and so forth.

Inventors

  • 👤 Avery N. Goldstein

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 14:16
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/22; C; C23; C23C; C23C26/00; C23C26/02; H; H10; H10P; H10P14/00; H10P14/20; H10P14/26; H10P14/265; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3451; H10P14/3452; H10P14/3461; H10P14/38; H10P14/3802

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 86 words
A method of forming a solid, continuous film of a Group IV semiconductor material on a surface, comprising the steps of: depositing on the substrate surface a thin, contiguous layer of nanocrystals of the semiconducting material, the size of the nanocrystals being sufficiently small that surface effects contribute to melting temperature; melting the nanocrystals at a temperature below the bulk melting temperature of the semiconductor material in order to form a continuous liquid thin film; and cooling the liquid thin to form a solid thin film.
Claim 2
Independent Claim 86 words
A method of forming a solid, continuous film of a Group IV semiconductor material on a surface, comprising the steps of: depositing on the substrate surface a thin, contiguous layer of nanocrystals of the semiconducting material, the size of the nanocrystals being sufficiently small that surface effects contribute to melting temperature; melting the nanocrystals at a temperature below the bulk melting temperature of the semiconductor material in order to form a continuous liquid thin film; and cooling the liquid thin to form a solid thin film.
Claim 3
Dependent Claim 11 words
The process of claim 1 wherein the semiconducting material is silicon.
Claim 4
Dependent Claim 11 words
The process of claim 1 wherein the semiconducting material is germanium.
Claim 5
Dependent Claim 18 words
The process of claim 1 wherein the nanocrystals have an average diameter of from 1 to 6 nm.
Claim 6
Dependent Claim 33 words
The method of claim 1 wherein the step of cooling the liquid thin film to form a solid thin film includes forming a thin film in the range of 2.5 to 25 nm.

References Cited (Backward Citations)

US4330358A Cited
US4407858A Cited
US5262357A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-11-19 2000-05-20 2000-11-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-11-19 2004-05-20 2004-11-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-11-19 2008-05-20 2008-11-19 $7700.00 Window Closed / Lapsed

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