US5571734A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for forming a fluorinated nitrogen containing dielectric
Assignee: NXP USA Inc
•
Filing: 1994-10-03
•
Granted: 1996-11-05
•
Expires: 2014-10-03
Abstract
Abstract This disclosure reveals a manufacturable and controllable method to fabricate a dielectric which increases the device current drive. A nitrogen-containing ambient is used to oxidize a surface of a substrate (10) to form a nitrogen-containing dielectric (12). Then a fluorine-containing specie (F) is introduced, preferably through implanting, into a gate electrode (20) overlying the nitrogen-containing dielectric. The fluorine is then driven into the underlying nitrogen-containing dielectric. A fluorinated nitrogen-containing region (14') is expected to form at the interface between dielectric (12') and substrate (10). The interaction between fluorine and nitrogen increases the peak transconductance as well as the transconductance at a high electric field for the dielectric. Therefore, the overall current drive is increased by this approach.
Inventors
- 👤 Hsing-Huang Tseng
- 👤 Philip J. Tobin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 15:08
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01332; H10D64/01336; H10D64/0134; H10D64/01338; H10D64/01344; H10D64/60; H10D64/66; H10D64/68; H10D64/681; H10D64/685; H10D64/693; H10D64/01346
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
73 words
A method for making a dielectric comprising the steps of: providing a substrate having a surface portion; oxidizing the surface portion of the substrate using a nitrogen-containing oxidant to form a nitrogen-containing dielectric; forming a gate electrode overlying the nitrogen-containing dielectric; implanting fluorine into the gate electrode to form a fluorinated gate electrode; and annealing the fluorinated gate electrode to drive the fluorine into the nitrogen-containing dielectric to form a fluorinated nitrogen-containing dielectric.
Claim 2
Independent Claim
73 words
A method for making a dielectric comprising the steps of: providing a substrate having a surface portion; oxidizing the surface portion of the substrate using a nitrogen-containing oxidant to form a nitrogen-containing dielectric; forming a gate electrode overlying the nitrogen-containing dielectric; implanting fluorine into the gate electrode to form a fluorinated gate electrode; and annealing the fluorinated gate electrode to drive the fluorine into the nitrogen-containing dielectric to form a fluorinated nitrogen-containing dielectric.
Claim 3
Dependent Claim
44 words
The method of claim 1, wherein the step of oxidizing the surface portion is performed with the nitrogen-containing oxidant being selected from a group consisting of: nitrous oxide (N 2 O), nitric oxide (NO), nitrogen dioxide (NO 2 ), and ammonia (NH 3 ).
Claim 4
Dependent Claim
31 words
The method of claim 1, wherein the step of providing the substrate comprises providing a material selected from a group consisting of single-crystalline silicon, polycrystalline silicon, interpolysilicon dielectric, and tunnel dielectric.
Claim 5
Dependent Claim
16 words
The method of claim 1, wherein the step of implanting fluorine comprises implanting pure fluorine ions.
Claim 6
Dependent Claim
28 words
The method of claim 1, wherein the step of annealing the fluorinated gate electrode is performed at a temperature substantially in a range of 600° to 1000° C.
Claim 7
Dependent Claim
16 words
The method of claim 1, further comprising the step of introducing chlorine into the nitrogen-containing dielectric.
Claim 8
Independent Claim
82 words
A method for making a dielectric comprising the steps of: providing a substrate having a surface portion; oxidizing the surface portion of the substrate to form an oxide layer; annealing the oxide layer with a nitrogen-containing ambient to form a nitrogen-containing dielectric; forming a gate electrode overlying the nitrogen-containing dielectric; implanting fluorine into the gate electrode to form a fluorinated gate electrode; and annealing the fluorinated gate electrode to drive the fluorine into the nitrogen-containing dielectric to form a fluorinated nitrogen-containing dielectric.
Claim 9
Independent Claim
82 words
A method for making a dielectric comprising the steps of: providing a substrate having a surface portion; oxidizing the surface portion of the substrate to form an oxide layer; annealing the oxide layer with a nitrogen-containing ambient to form a nitrogen-containing dielectric; forming a gate electrode overlying the nitrogen-containing dielectric; implanting fluorine into the gate electrode to form a fluorinated gate electrode; and annealing the fluorinated gate electrode to drive the fluorine into the nitrogen-containing dielectric to form a fluorinated nitrogen-containing dielectric.
Claim 10
Dependent Claim
45 words
The method of claim 7, wherein the step of annealing the oxide layer is performed in an ambient containing a gas selected from a group consisting of: nitrous oxide (N 2 O), nitric oxide (NO), nitrogen dioxide (NO 2 ), and ammonia (NH 3 ).
Claim 11
Dependent Claim
31 words
The method of claim 7, wherein the step of providing the substrate comprises providing a material selected from a group consisting of single-crystalline silicon, polycrystalline silicon, interpolysilicon dielectric, and tunnel dielectric.
Claim 12
Dependent Claim
16 words
The method of claim 7, wherein the step of implanting fluorine comprises implanting pure fluorine ions.
Claim 13
Dependent Claim
28 words
The method of claim 7, wherein the step of annealing the fluorinated gate electrode is performed at a temperature substantially in a range of 600° to 1000° C.
Claim 14
Dependent Claim
16 words
The method of claim 7, further comprising the step of introducing chlorine into the nitrogen-containing dielectric.
Claim 15
Independent Claim
75 words
A method for making a dielectric comprising the steps of: providing a silicon substrate having a surface portion; forming a nitrogen-containing dielectric on the surface portion of the silicon substrate; forming a gate electrode overlying the nitrogen-containing dielectric; and growing a fluorinated dielectric, which contains fluorine, overlying the gate electrode, wherein the fluorine in the fluorinated dielectric is driven, by heating, through the gate electrode into the nitrogen-containing dielectric to form a fluorinated nitrogen-containing dielectric.
Claim 16
Independent Claim
75 words
A method for making a dielectric comprising the steps of: providing a silicon substrate having a surface portion; forming a nitrogen-containing dielectric on the surface portion of the silicon substrate; forming a gate electrode overlying the nitrogen-containing dielectric; and growing a fluorinated dielectric, which contains fluorine, overlying the gate electrode, wherein the fluorine in the fluorinated dielectric is driven, by heating, through the gate electrode into the nitrogen-containing dielectric to form a fluorinated nitrogen-containing dielectric.
Claim 17
Dependent Claim
37 words
The method of claim 13, wherein the step of growing the fluorinated dielectric is performed by oxidizing a top surface portion of the gate electrode with O 2 and a fluorine-containing ambient, to form a fluorinated oxide.
Claim 18
Dependent Claim
42 words
The method of claim 14, wherein heating of the fluorinated dielectric is further characterized as annealing the fluorinated oxide in a temperature range of 600° to 1000° C. to drive the fluorine into the nitrogen-containing dielectric to form the fluorinated nitrogen-containing dielectric.
Claim 19
Dependent Claim
58 words
The method of claim 13, wherein the step of growing the fluorinated dielectric comprises the steps of: oxidizing a top surface of the gate electrode with O 2 to form an oxide layer; and annealing the oxide layer in a fluorine-containing ambient to introduce fluorine into the oxide layer and to drive the fluorine into the nitrogen-containing dielectric.
Claim 20
Dependent Claim
41 words
The method of claim 13, wherein the step of growing the fluorinated dielectric comprises the steps of: oxidizing a top surface of the gate electrode with O 2 to form an oxide layer; and implanting fluorine ions into the oxide layer.
Claim 21
Dependent Claim
42 words
The method of claim 17, wherein heating of the fluorinated dielectric is further characterized as annealing the fluorinated dielectric in a temperature range of 600° to 1000° C. to drive the fluorine into the nitrogen-containing dielectric to form the fluorinated nitrogen-containing dielectric.
Claim 22
Dependent Claim
30 words
The method of claim 13, further comprising the step of introducing a chlorine-containing specie into the surface portion of the silicon substrate during the step of forming the nitrogen-containing dielectric.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-11-05 | 2000-05-06 | 2000-11-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-11-05 | 2004-05-06 | 2004-11-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-11-05 | 2008-05-06 | 2008-11-05 | $7700.00 | Window Closed / Lapsed |