Precision integrated resistor

Claim 2

A precision resistor formed on a semiconductor substrate, comprising: a first and a second stripe made of a resistive conductive material disposed on an insulating material, said first and second stripe each having a first sheet resistance per square R p and a patterned width W p ; a doped third stripe in said semiconductor substrate, having a patterned width W M which is substantially equal to a lateral separation between said first and second stripes, and lying directly beneath a gap between said first and second stripes, and having a second resistance per square R M : first and second metallizations connected respectively to first and second extremities of said three stripes; wherein said widths W p and W M , and said sheet resistances R p and R M , are related as R p W p -2R M W M .

Claim 3

The resistor of claim 1, wherein said resistive conductive material consists essentially of doped polycrystalline silicon.

Claim 4

The resistor of claim 1, wherein said third stripe is laterally surrounded by field oxide regions, wherein said first and second stripes extend partially over a field oxide layer and partially over a second oxide layer which is thinner than said field oxide layer, said second oxide layer being adjacent said field oxide layer.

Claim 5

A precision resistor comprising: a semiconductor substrate; a first stripe of doping implanted in said semiconductor substrate, said first stripe having a first and a second edge which are opposite to each other, and having a patterned width W M and a first sheet resistance per square R M ; a layer of insulating material formed over said semiconductor substrate, wherein said first stripe is not covered by said insulating material; a second and a third stripe of a resistive conductive material formed on said insulating material, wherein said second stripe has a first edge which is parallel to and in a fixed relation to said first edge of said first stripe and said third stripe has a first edge which is parallel to and in a fixed relation to said second edge of said first stripe, each of said second and third stripes having a second sheet resistance per square R p and a patterned width W p ; first and second metallizations connected respectively to first and second extremities of said three stripes; wherein said widths W p and W M , and said sheet resistances R p and R M , are related as R p W p -2R M W M .

Claim 6

A precision resistor comprising: a semiconductor substrate; a first stripe of doping implanted in said semiconductor substrate, said first stripe having a first and a second edge which are opposite to each other, and having a patterned width W M and a first sheet resistance per square R M ; a layer of insulating material formed over said semiconductor substrate, wherein said first stripe is not covered by said insulating material; a second and a third stripe of a resistive conductive material formed on said insulating material, wherein said second stripe has a first edge which is parallel to and in a fixed relation to said first edge of said first stripe and said third stripe has a first edge which is parallel to and in a fixed relation to said second edge of said first stripe, each of said second and third stripes having a second sheet resistance per square R p and a patterned width W p ; first and second metallizations connected respectively to first and second extremities of said three stripes; wherein said widths W p and W M , and said sheet resistances R p and R M , are related as R p W p -2R M W M .

Claim 7

The resistor of claim 4, wherein said insulating material is an oxide.

Claim 8

The resistor of claim 4, wherein said first stripe is laterally surrounded by field oxide regions, wherein said second and third stripes extend partially over a field oxide layer and partially over a second oxide layer which is thinner than said field oxide layer, said second oxide layer being adjacent said field oxide layer.

Claim 9

The resistor of claim 4, wherein R p has a value of approximately 25 Ω/□, and R M has a value of approximately 10 Ω/□.

Claim 10

The resistor of claim 4, wherein said stripes are substantially rectilinear.

Claim 11

The resistor of claim 4, wherein said second and said third stripes are polycrystalline silicon.

Claim 12

The resistor of claim 9, wherein said first, second, and third stripes are doped simultaneously.

Claim 13

The resistor of claim 4, wherein said second and said third stripes are metal silicide.

Claim 14

The resistor of claim 4, wherein said substrate has a doping type opposite said first stripe.

Claim 15

A precision resistor comprising: a semiconductor substrate; a first stripe of doping implanted in said semiconductor substrate, said first stripe having a first and a second edge which are opposite to each other, and having a patterned width W M and a first sheet resistance per square R M ; a layer of insulating material formed over said semiconductor substrate, wherein said first stripe is not covered by said insulating material; a second and a third stripe of a resistive conductive material formed on said insulating material, wherein said second stripe has a first edge which is parallel to and in a fixed relation to said first edge of said first stripe and said third stripe has a first edge which is parallel to and in a fixed relation to said second edge of said first stripe, each of said second and third stripes having a second sheet resistance per square R p and said second and third stripes together having a combined patterned width 2W p ; first and second metallizations connected respectively to first and second extremities of said three stripes; wherein said widths W p and W M , and said sheet resistances R p and R M , are related as R p W p -2R M W M .

Claim 16

A precision resistor comprising: a semiconductor substrate; a first stripe of doping implanted in said semiconductor substrate, said first stripe having a first and a second edge which are opposite to each other, and having a patterned width W M and a first sheet resistance per square R M ; a layer of insulating material formed over said semiconductor substrate, wherein said first stripe is not covered by said insulating material; a second and a third stripe of a resistive conductive material formed on said insulating material, wherein said second stripe has a first edge which is parallel to and in a fixed relation to said first edge of said first stripe and said third stripe has a first edge which is parallel to and in a fixed relation to said second edge of said first stripe, each of said second and third stripes having a second sheet resistance per square R p and said second and third stripes together having a combined patterned width 2W p ; first and second metallizations connected respectively to first and second extremities of said three stripes; wherein said widths W p and W M , and said sheet resistances R p and R M , are related as R p W p -2R M W M .

Claim 17

The resistor of claim 13, wherein said insulating material is an oxide.

Claim 18

The resistor of claim 13, wherein said first stripe is laterally surrounded by field oxide regions, wherein said second and third stripes extend partially over a field oxide layer and partially over a second oxide layer which is thinner than said field oxide layer, said second oxide layer being adjacent said field oxide layer.

Claim 19

The resistor of claim 13, wherein R p has a value of approximately 25 Ω/□, and R M has a value of approximately 10 Ω/□.

Claim 20

The resistor of claim 13, wherein said stripes are substantially rectilinear.

Claim 21

The resistor of claim 13, wherein said second and said third stripes are polycrystalline silicon.

Claim 22

The resistor of claim 13, wherein said first, second, and third stripes are doped simultaneously.

Claim 23

The resistor of claim 13, wherein said second and said third stripes are metal silicide.

Claim 24

The resistor of claim 13, wherein said substrate has a doping type opposite said first stripe.