Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
182 words
A LAN cable test instrument for testing a LAN cable having a near-end and a far-end, comprising: (a) input means for coupling to a plurality of wires from said LAN cable at said near-end, said plurality of wires forming twisted-wire pairs within said LAN cable; (b) first and second switch means coupled to said input means, said first switch means selectively coupling a first wire of said plurality of wires to a first output and said second switch means selectively coupling a second wire of said plurality of wires to a second output; (c) measurement means with a first input coupled to said first output and a second input coupled to said second output, said measurement means measuring the resistance and the capacitance between said first and second wires to produce resistance and capacitance measurement values; (d) memory means coupled to said measurement means for storing said resistance and capacitance measurement values; and (e) a microprocessor coupled to said said memory means wherein said microprocessor operates on said resistance and capacitance measurement values to determine said twisted-wire pairs in said LAN cable.
Claim 2
Dependent Claim
182 words
A LAN cable test instrument for testing a LAN cable having a near-end and a far-end, comprising: (a) input means for coupling to a plurality of wires from said LAN cable at said near-end, said plurality of wires forming twisted-wire pairs within said LAN cable; (b) first and second switch means coupled to said input means, said first switch means selectively coupling a first wire of said plurality of wires to a first output and said second switch means selectively coupling a second wire of said plurality of wires to a second output; (c) measurement means with a first input coupled to said first output and a second input coupled to said second output, said measurement means measuring the resistance and the capacitance between said first and second wires to produce resistance and capacitance measurement values; (d) memory means coupled to said measurement means for storing said resistance and capacitance measurement values; and (e) a microprocessor coupled to said said memory means wherein said microprocessor operates on said resistance and capacitance measurement values to determine said twisted-wire pairs in said LAN cable.
Claim 3
Dependent Claim
35 words
A LAN cable test instrument according to claim 1 wherein said memory means contains said resistance and capacitance measurement values for each pair of said plurality of wires formed by said first and second wires.
Claim 4
Dependent Claim
37 words
A LAN cable test instrument according to claim 2 wherein said microprocessor calculates a difference capacitance matrix from said capacitance measurement values in said memory means to evaluate near-end cross-talk isolation between each of said twisted-wire pairs.
Claim 5
Dependent Claim
35 words
A LAN cable test instrument according to claim 1 wherein said microprocessor compares said resistance and capacitance measurement values against a first predetermined value to detect a short circuit between said first and second wires.
Claim 6
Dependent Claim
35 words
A LAN cable test instrument according to claim 1 wherein said microprocessor compares said resistance and capacitance measurement values against a second predetermined value to detect an open circuit between said first and second wires.
Claim 7
Dependent Claim
26 words
A LAN cable test instrument according to claim 1 further comprising a display coupled to said microprocessor for displaying said twisted-wire pairs of said LAN cable.
Claim 8
Dependent Claim
46 words
A LAN cable test instrument according to claim 1 further comprising a cable identifier having an identifier number, said cable identifier coupled to said far-end of said LAN cable to provide a predetermined resistance value associated with said identifier number across said first and second wires.
Claim 9
Dependent Claim
29 words
A LAN cable test instrument according to claim 7 wherein said microprocessor compares said predetermined resistance value against a series of figures of merit to determine said identifier number.