Abstract A method for fabricating high-voltage CMOS transistors comprises the steps of: forming a well of a second conductivity type and two lightly-doped diffusion regions of the second conductivity type in a silicon substrate of a first conductivity type; forming a plurality of shielding blocks over the silicon substrate to define source/drain and gate regions; implanting impurities of the first conductivity type in the diffusion regions of the first conductivity type to form drift regions of the first conductivity type therein; implanting impurities of the second conductivity type in the diffusion regions of the second conductivity type to form drift regions of the second conductivity type therein; forming field oxide layers between the shielding blocks over the silicon substrate; removing the shielding blocks; forming gate oxide layers on the exposed surfaces of the silicon substrate and the well respectively; forming gate electrodes over the gate oxide layers; and forming source/drain implanted regions of the first conductivity type in the well and forming source/drain implanted regions of the second conductivity in the silicon substrate.
A method for fabricating a CMOS transistor on a silicon substrate of a first conductivity type, comprising the steps of: forming a well of a second opposite conductivity type and two lightly-doped diffusion regions of the second conductivity type in said silicon substrate; forming a plurality of shielding blocks over said silicon substrate to define source/drain and gate regions; implanting impurities of the first conductivity type in said well of the second conductivity type by using the shielding blocks as marks to form drift regions of the first conductivity type therein; implanting impurities of the second conductivity type in said diffusion regions of the second conductivity type by using the shielding blocks as marks to form drift regions of the second conductivity type therein; forming field oxide layers between said shielding blocks over said silicon substrate; removing said shielding blocks to expose surfaces of said silicon substrate between the two diffusion regions and said well; forming gate oxide layers on the exposed surfaces of said silicon substrate and said well respectively; forming gate electrodes on said gate oxide layers; implanting impurities into said well to form source and drain regions of the first conductivity type; and implanting impurities into said diffusion regions and to form a drain region in the other one of the two diffusion regions.
Claim 2
Independent Claim
217 words
A method for fabricating a CMOS transistor on a silicon substrate of a first conductivity type, comprising the steps of: forming a well of a second opposite conductivity type and two lightly-doped diffusion regions of the second conductivity type in said silicon substrate; forming a plurality of shielding blocks over said silicon substrate to define source/drain and gate regions; implanting impurities of the first conductivity type in said well of the second conductivity type by using the shielding blocks as marks to form drift regions of the first conductivity type therein; implanting impurities of the second conductivity type in said diffusion regions of the second conductivity type by using the shielding blocks as marks to form drift regions of the second conductivity type therein; forming field oxide layers between said shielding blocks over said silicon substrate; removing said shielding blocks to expose surfaces of said silicon substrate between the two diffusion regions and said well; forming gate oxide layers on the exposed surfaces of said silicon substrate and said well respectively; forming gate electrodes on said gate oxide layers; implanting impurities into said well to form source and drain regions of the first conductivity type; and implanting impurities into said diffusion regions and to form a drain region in the other one of the two diffusion regions.
Claim 3
Dependent Claim
15 words
The method of claim 1, wherein said shielding blocks consist essentially of oxide and nitride.
Claim 4
Dependent Claim
13 words
The method of claim 1, wherein said gate electrodes are polysilicon gate electrodes.
Claim 5
Dependent Claim
19 words
The method of claim 1, wherein said first conductivity type is N-type and said second conductivity type is P-type.
Claim 6
Dependent Claim
19 words
The method of claim 1, wherein said first conductivity type is P-type and said second conductivity type is N-type.