Memory with on-chip detection of bit line leaks

Claim 2

A circuit for detection of leakage currents on a bit line of an electrically programmable read-only memory which is composed of cells organized in rows and columns, each cell having a source, gate and drain, wherein the drains of all said cells in each column are connected to a respective bit line; said circuit comprising: a current generator; a control circuit for the application, in detection mode, of a control voltage to said current generator and for ground connection of said gate of each said cell in a selected bit line; and a comparison circuit connected, firstly, to said selected bit line and, secondly, to said current generator to detect a leakage current on said selected bit line greater than the current delivered by said current generator; wherein said comparison circuit comprises a comparator, a first current/voltage converter, the input of said first current/voltage converter being connected to said current generator and the output of said first current/voltage converter being connected to said comparator, and a second current/voltage converter, the input of said second current/voltage converter being connected in detection mode to said selected bit line and the output of said second current/voltage converter being connected to said comparator.

Claim 3

A detection circuit according to claim 1, further comprising: a reference circuit with at least one reference cell connected to the input of said first current/voltage converter; a first switch-over transistor controlled, at its gate, by a detection signal and placed in series between said first converter and said current generator; and a second switch-over transistor controlled at its gate by a signal which is complementary to said detection signal and placed in series between said first converter and said reference circuit.

Claim 4

A detection circuit according to claim 1, the gates of said cells of a same row being connected together to a respective word line, wherein a decoder of said word lines receives a detection signal of said control circuit and wherein, when said detection signal is active, said word line decoder connects all said word lines to ground.

Claim 5

A detection circuit according to claim 1, wherein said control voltage delivered by said control circuit is variable.

Claim 6

A chip comprising a detection circuit according to claim 1, wherein said detection circuit detects defective bit lines and outputs corresponding location data.

Claim 7

A chip, comprising: a non-volatile memory composed of cells organized in rows and columns, wherein the drains of all said cells in each column are connected to a respective bit line and wherein the gates of all said cells in each row are connected to a respective word line; a current generator; a control circuit; a comparator; a first current/voltage converter, the input of said first current/voltage converter being connected in detection mode to said current generator and the output of said first current/voltage converter being connected to said comparator; and a second current/voltage converter, the input of said second current/voltage converter being connected in detection mode to a selected bit line and the output of said second current/voltage converter being connected to said comparator; wherein, in detection mode, said control circuit supplies a control voltage to said current generator and connects the gates of said cells in said selected bit line to ground; and wherein, in detection mode, said comparator is connected to compare the output of said current generator with the current on said selected bit line to detect a current leakage on said selected bit line.

Claim 8

A chip, comprising: a non-volatile memory composed of cells organized in rows and columns, wherein the drains of all said cells in each column are connected to a respective bit line and wherein the gates of all said cells in each row are connected to a respective word line; a current generator; a control circuit; a comparator; a first current/voltage converter, the input of said first current/voltage converter being connected in detection mode to said current generator and the output of said first current/voltage converter being connected to said comparator; and a second current/voltage converter, the input of said second current/voltage converter being connected in detection mode to a selected bit line and the output of said second current/voltage converter being connected to said comparator; wherein, in detection mode, said control circuit supplies a control voltage to said current generator and connects the gates of said cells in said selected bit line to ground; and wherein, in detection mode, said comparator is connected to compare the output of said current generator with the current on said selected bit line to detect a current leakage on said selected bit line.

Claim 9

The chip of claim 6, further comprising: a reference circuit with at least one reference cell connected to the input of said first current/voltage converter; a switch to selectably connect said first current/voltage converter to either said reference circuit or said current generator; wherein in read mode, said switch connects said first current/voltage converter to said reference circuit; and wherein in detect mode, said switch connects said first current/voltage converter to said current generator.

Claim 10

The chip of claim 7, wherein the current passed by said current generator during detect mode is less than one-fourth of the current passed by said reference circuit during read mode.

Claim 11

A detection circuit comprising: a non-volatile memory composed of cells organized in rows and columns, wherein the drains of all said cells in each column are connected to a respective bit line and wherein the gates of all said cells in each row are connected to a respective word line; a current generator; a control circuit; and a comparison circuit, a first input of said comparison circuit being connected to the output of said current generator; wherein, in detection mode, said control circuit supplies a control voltage to said current generator and connects the gates of said cells in a selected bit line to ground; and wherein, in detection mode, said comparison circuit is connected to compare the output of said current generator with the current on said selected bit line to detect a current leakage on said selected bit line; wherein said comparison circuit comprises a comparator, a first current/voltage converter, the input of said first current/voltage converter being connected to said current generator and the output of said first current/voltage converter being connected to said comparator, and a second current/voltage converter, the input of said second current/voltage converter being connected in detection mode to said selected bit line and the output of said second current/voltage converter being connected to said comparator.

Claim 12

A detection circuit comprising: a non-volatile memory composed of cells organized in rows and columns, wherein the drains of all said cells in each column are connected to a respective bit line and wherein the gates of all said cells in each row are connected to a respective word line; a current generator; a control circuit; and a comparison circuit, a first input of said comparison circuit being connected to the output of said current generator; wherein, in detection mode, said control circuit supplies a control voltage to said current generator and connects the gates of said cells in a selected bit line to ground; and wherein, in detection mode, said comparison circuit is connected to compare the output of said current generator with the current on said selected bit line to detect a current leakage on said selected bit line; wherein said comparison circuit comprises a comparator, a first current/voltage converter, the input of said first current/voltage converter being connected to said current generator and the output of said first current/voltage converter being connected to said comparator, and a second current/voltage converter, the input of said second current/voltage converter being connected in detection mode to said selected bit line and the output of said second current/voltage converter being connected to said comparator.

Claim 13

The detection circuit of claim 9, wherein said non-volatile memory is a flash-EEPROM.

Claim 14

The detection circuit of claim 9, wherein said current generator is a weak transistor.

Claim 15

The detection circuit of claim 11, wherein said weak transistor has a length greater than two times its width.

Claim 16

The detection circuit of claim 9, wherein the output of said current generator in detection mode is in the range of 10-15 μA.

Claim 17

The detection circuit of claim 9, further comprising: a reference circuit with at least one reference cell connected to the input of said first current/voltage converter.

Claim 18

The detection circuit of claim 9, further comprising: a reference circuit with at least one reference cell connected to the input of said first current/voltage converter; a switch to selectably connect said first current/voltage converter to either said reference circuit or said current generator; wherein in read mode, said switch connects said first current/voltage converter to said reference circuit; and wherein in detect mode, said switch connects said first current/voltage converter to said current generator.

Claim 19

The detection circuit of claim 15, wherein the current passed by said current generator during detect mode is less than one-fourth of the current passed by said reference circuit during read mode.

Claim 20

The detection circuit of claim 15, wherein the current passed by said current generator during detect mode is approximately 10 μA and the current passed by said reference circuit during read mode is approximately 100 μA.