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Process of making thin film 2H α-sic by laser ablation

Assignee: Kent State University
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Filing: 1994-03-17
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Granted: 1996-06-25
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Expires: 2014-03-17
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Abstract

Abstract Thin films of 2H alpha -silicon carbide are produced by pulsed laser ablation.

Inventors

  • 👤 Mark A. Stan
  • 👤 Martin O. Patton
  • 👤 Joseph D. Warner

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 14:21
CPC Classifications
C; C30; C30B; C30B23/00; C30B23/02; C30B29/00; C30B29/10; C30B29/36; Y; Y10; Y10S; Y10S148/00; Y10S148/148; Y10S438/00; Y10S438/931

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 48 words
A process for producing a thin film of 2H α-silicon carbide, said process comprising contacting a substrate with a high energy plasma wherein said plasma is produced by pulsed laser ablation containing atoms of silicon and atoms of carbon, at least of some of those atoms being ionized.
Claim 2
Dependent Claim 48 words
A process for producing a thin film of 2H α-silicon carbide, said process comprising contacting a substrate with a high energy plasma wherein said plasma is produced by pulsed laser ablation containing atoms of silicon and atoms of carbon, at least of some of those atoms being ionized.
Claim 3
Dependent Claim 21 words
The process of claim 1 wherein said substrate is selected so that said 2H α-silicon carbide grows epitaxially on said substrate.
Claim 4
Dependent Claim 12 words
The process of claim 2 wherein said laser is a krypton/fluorine laser.
Claim 5
Dependent Claim 32 words
The process of claim 3 wherein said laser operates at a wavelength of approximately 248 nanometers, 2 pulses per second and provides an energy density of about 2.5 joules per square centimeter.
Claim 6
Dependent Claim 42 words
The process of claim 3 wherein said pulsed laser creates an energy density of about one-half to 10 joules per square centimeter per pulse, and further wherein the duration of the pulses of said pulse laser are about 15 to 30 nanoseconds.
Claim 7
Dependent Claim 22 words
The process of claim 1 wherein said substrate presents a deposition surface, said deposition surface comprising a plane of hexagonally arranged atoms.
Claim 8
Dependent Claim 17 words
The process of claim 6 wherein the lattice parameter of said basal plane is approximately 3.076 Å.
Claim 9
Dependent Claim 28 words
The process of claim 1 wherein deposition occurs at a pressure 10 -5 to 10 -10 Torr and a substrate holder temperature of 600° C. to 1800° C.
Claim 10
Dependent Claim 16 words
The process of claim 8 wherein molecular oxygen is present in the atmosphere of vapor deposition.
Claim 11
Dependent Claim 28 words
The process of claim 6 wherein said substrate presents a deposition surface whose atoms exhibit substantial registration with the atoms of the basal plane of 2H α-silicon carbide.
Claim 12
Dependent Claim 22 words
The process of claim 10 wherein said substrate is selected from the group consisting of α-silicon carbide, aluminum nitride and solutions thereof.
Claim 13
Dependent Claim 11 words
The process of claim 2 wherein said substrate is 6H SiC.

References Cited (Backward Citations)

US5080753A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-06-25 1999-12-25 2000-06-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-06-25 2003-12-25 2004-06-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-06-25 2007-12-25 2008-06-25 $7700.00 Window Closed / Lapsed

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