US5525909A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus and method for measuring programmed antifuse resistance
Assignee: Microsemi SoC Corp
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Filing: 1995-05-03
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Granted: 1996-06-11
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Expires: 2015-05-03
Abstract
Abstract Apparatus for measuring the resistance of a programmed antifuse in an integrated circuit is integrated on the same integrated circuit as the antifuse and is controlled by a programming circuit disposed on an integrated circuit and comprises a first voltage sensing transistor having a first drain/source electrically connected to a first I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a first electrode of the antifuse, and a second voltage sensing transistor having a first drain/source electrically connected to a second I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a second electrode of the antifuse.
Inventors
- 👤 John L. McCollum
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 13:00
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/02; G01; G01R; G01R27/00; G01R27/02; G01R27/14; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884; G11C17/00; G11C17/14; G11C17/16; H; H10; H10P; H10P74/00; H10P74/20; H10P74/207
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
128 words
In an integrated circuit having a plurality of antifuses disposed thereon, each of said antifuses having a first electrode and a second electrode, and further having antifuse programming circuitry disposed thereon, a circuit for determining the resistance of a programmed one off said antifuses comprising: a first voltage-sensing I/O pad; a second voltage-sensing I/O pad; antifuse selection means for selecting one of said antifuses; first circuit path means, responsive to said selection means, for creating a circuit path from said first voltage-sensing I/O pad to the first electrode of an antifuse selected by said selection means; second circuit path means, responsive to said selection means, for creating a circuit path from said second voltage-sensing I/O pad to the second electrode of said antifuse selected by said selection means.
Claim 2
Dependent Claim
128 words
In an integrated circuit having a plurality of antifuses disposed thereon, each of said antifuses having a first electrode and a second electrode, and further having antifuse programming circuitry disposed thereon, a circuit for determining the resistance of a programmed one off said antifuses comprising: a first voltage-sensing I/O pad; a second voltage-sensing I/O pad; antifuse selection means for selecting one of said antifuses; first circuit path means, responsive to said selection means, for creating a circuit path from said first voltage-sensing I/O pad to the first electrode of an antifuse selected by said selection means; second circuit path means, responsive to said selection means, for creating a circuit path from said second voltage-sensing I/O pad to the second electrode of said antifuse selected by said selection means.
Claim 3
Independent Claim
96 words
A method for determining the resistance of a programmed antifuse disposed in an integrated circuit, including the steps of: providing a circuit path from a first voltage sensing I/O pad on the integrated circuit to a first terminal of the antifuse; providing a circuit path from a second voltage sensing I/O pad on the integrated circuit to a second terminal of the antifuse; providing a known soaking current to said antifuse through programming circuitry located on said integrated circuit; measuring the voltage between said first and second voltage sensing I/O pads with a high impedance voltmeter.
Claim 4
Independent Claim
96 words
A method for determining the resistance of a programmed antifuse disposed in an integrated circuit, including the steps of: providing a circuit path from a first voltage sensing I/O pad on the integrated circuit to a first terminal of the antifuse; providing a circuit path from a second voltage sensing I/O pad on the integrated circuit to a second terminal of the antifuse; providing a known soaking current to said antifuse through programming circuitry located on said integrated circuit; measuring the voltage between said first and second voltage sensing I/O pads with a high impedance voltmeter.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-06-11 | 1999-12-11 | 2000-06-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-06-11 | 2003-12-11 | 2004-06-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-06-11 | 2007-12-11 | 2008-06-11 | $7700.00 | Window Closed / Lapsed |