US4800176A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for forming contact portion in semiconductor integrated circuit devices
Assignee: Toshiba Corp
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Filing: 1988-04-19
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Granted: 1989-01-24
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Expires: 2008-04-19
Abstract
Abstract A method of manufacturing semiconductor devices according to the present invention includes the steps of forming an element isolation region on the main surface of a semiconductor substrate of a first conductivity type, forming a high impurity concentration layer of a second conductivity type in the surface area of a portion of the semiconductor substrate defined by the element isolation region, and forming a first insulation film on the entire surface of the resultant semiconductor structure. Thereafter, a contact hole is formed in the first insulation film which is formed on the high impurity concentration layer, a semiconductor layer containing an impurity of the same conductivity type as the high impurity concentration layer is formed on the first insulation film, and a second insulation film is formed on the semiconductor layer. After this, a planarization film is formed on the entire surface of the second insulation film and is then selectively removed by anisotropic etching, to leave part of the planarization film filling the contact hole. Then, the portion of the planarization film exposed by the anisotropic etching is removed, a metal layer is formed on the entire surface of the resultant semiconductor structure, and the metal layer and semiconductor layer are patterned to form a laminated structure of a wiring layer.
Inventors
- 👤 Masakazu Kakumu
- 👤 Tetsuya Asami
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 21:10
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/092; H10W20/031; H10W20/032; H10W20/033; H10W20/056; H10W20/062
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
146 words
A method of manufacturing semiconductor devices, comprising the steps of: forming a first conductive layer on a semiconductor substrate; forming a first insulation film on said first conductive layer; forming at least one contact hole in said first insulation film formed on said first conductive layer; forming a semiconductor layer on said first insulation film having said contact hole formed therein; forming a second insulation film on said semiconductor layer; forming a planarization film on said second insulation film; selectively removing said planarization film by anisotropic etching, to leave part of said planarization film in, and filling, said contact hole; removing a portion of said second insulation film exposed by the anisotropic etching; forming a second conductive layer on substantially the entire surface of the resultant semiconductor structure; and patterning said second conductive layer and semiconductor layer, to form a laminated structure of a wiring layer.
Claim 2
Independent Claim
146 words
A method of manufacturing semiconductor devices, comprising the steps of: forming a first conductive layer on a semiconductor substrate; forming a first insulation film on said first conductive layer; forming at least one contact hole in said first insulation film formed on said first conductive layer; forming a semiconductor layer on said first insulation film having said contact hole formed therein; forming a second insulation film on said semiconductor layer; forming a planarization film on said second insulation film; selectively removing said planarization film by anisotropic etching, to leave part of said planarization film in, and filling, said contact hole; removing a portion of said second insulation film exposed by the anisotropic etching; forming a second conductive layer on substantially the entire surface of the resultant semiconductor structure; and patterning said second conductive layer and semiconductor layer, to form a laminated structure of a wiring layer.
Claim 3
Dependent Claim
46 words
A method of manufacturing semiconductor devices according to claim 1, which further comprises a step in which a silicide layer is formed on said semiconductor layer after said semiconductor layer has been formed, and in which said second insulation film is formed on said silicide layer.
Claim 4
Dependent Claim
24 words
A method of manufacturing semiconductor devices according to claim 2, wherein said silicide layer is formed of a compound of silicon and refractory metal.
Claim 5
Dependent Claim
43 words
A method of manufacturing semiconductor devices according to claim 1, wherein said first conductive layer is formed in the surface area of said semiconductor substrate and is formed of an impurity layer having a conductivity type opposite to that of said semiconductor substrate.
Claim 6
Dependent Claim
42 words
A method of manufacturing semiconductor devices according to claim 1, which further comprises a step of forming an insulation film on said semiconductor substrate, and in which said first conductive layer is formed of a polysilicon layer formed on said insulation film.
Claim 7
Dependent Claim
30 words
A method of manufacturing semiconductor devices according to claim 1, wherein said semiconductor layer is formed of polysilicon containing an impurity of the same conductivity type as said semiconductor substrate.
Claim 8
Dependent Claim
18 words
A method of manufacturing semiconductor devices according to claim 1, wherein said planarization film is formed of polysilicon.
Claim 9
Dependent Claim
21 words
A method of manufacturing semiconductor devices according to claim 1, wherein said second conductive layer is formed of metal including aluminum.
Claim 10
Independent Claim
203 words
A method of manufacturing semiconductor devices comprising the steps of: forming an element isolation region on the main surface of a semiconductor substrate of a first conductivity type; forming an impurity layer of a second conductivity type in the surface area of a portion of said semiconductor substrate which lies in an element region defined by said element isolation region; forming a first insulation film on substantially the entire surface of the resultant semiconductor structure; forming at least one contact hole in said first insulation film formed on said impurity layer; forming a semiconductor layer of the same conductivity type as said impurity layer on said first insulation film having said contact hole formed therein; forming a second insulation film on said semiconductor layer; forming a planarization film on substantially the entire surface of said second insulation film; selectively removing said planarization film by anisotropic etching, to leave part of said planarization film in, and filling, said contact hole; removing a portion of said second insulation film exposed by the anisotropic etching; forming a conductive layer on substantially the entire surface of the resultant semiconductor structure; and patterning said conductive layer and semiconductor layer, to form a laminated structure of a wiring layer.
Claim 11
Independent Claim
203 words
A method of manufacturing semiconductor devices comprising the steps of: forming an element isolation region on the main surface of a semiconductor substrate of a first conductivity type; forming an impurity layer of a second conductivity type in the surface area of a portion of said semiconductor substrate which lies in an element region defined by said element isolation region; forming a first insulation film on substantially the entire surface of the resultant semiconductor structure; forming at least one contact hole in said first insulation film formed on said impurity layer; forming a semiconductor layer of the same conductivity type as said impurity layer on said first insulation film having said contact hole formed therein; forming a second insulation film on said semiconductor layer; forming a planarization film on substantially the entire surface of said second insulation film; selectively removing said planarization film by anisotropic etching, to leave part of said planarization film in, and filling, said contact hole; removing a portion of said second insulation film exposed by the anisotropic etching; forming a conductive layer on substantially the entire surface of the resultant semiconductor structure; and patterning said conductive layer and semiconductor layer, to form a laminated structure of a wiring layer.
Claim 12
Dependent Claim
46 words
A method of manufacturing semiconductor devices according to claim 9, which further comprises a step in which a silicide layer is formed on said semiconductor layer after said semiconductor layer has been formed, and in which said second insulation film is formed on said silicide layer.
Claim 13
Dependent Claim
24 words
A method of manufacturing semiconductor devices according to claim 10, wherein said silicide layer is formed of a compound of silicon and refractory metal.
Claim 14
Dependent Claim
18 words
A method of manufacturing semiconductor devices acording to claim 9, wherein said semiconductor layer is formed of polysilicon.
Claim 15
Dependent Claim
18 words
A method of manufacturing semiconductor devices according to claim 9, wherein said planarization film is formed of polysilicon.
Claim 16
Dependent Claim
21 words
A method of manufacturing semiconductor devices according to claim 9, wherein said second conductive layer is formed of metal including aluminum.
Claim 17
Independent Claim
157 words
A method of manufacturing semiconductor devices, comprising the steps of: forming a first conductive layer on a first insulation film; forming a second insulation film on substantially the entire surface of the resultant semiconductor structure; forming at least one contact hole in said second insulation film formed on said first conductive layer; forming a semiconductor layer on said second insulation film having said contact hole formed therein; forming a third insulation film on said semiconductor layer; forming a planarization film on substantially the entire surface of said third insulation film; selectively removing said planarization film by anisotropic etching, to leave part of said planarization film in, and filling, said contact hole; removing a portion of said third insulation film exposed by the anisotropic etching; forming a second conductive layer on substantially the entire surface of the resultant semiconductor structure; and patterning said second conductive layer and semiconductor layer, to form a laminated structure of a wiring layer.
Claim 18
Independent Claim
157 words
A method of manufacturing semiconductor devices, comprising the steps of: forming a first conductive layer on a first insulation film; forming a second insulation film on substantially the entire surface of the resultant semiconductor structure; forming at least one contact hole in said second insulation film formed on said first conductive layer; forming a semiconductor layer on said second insulation film having said contact hole formed therein; forming a third insulation film on said semiconductor layer; forming a planarization film on substantially the entire surface of said third insulation film; selectively removing said planarization film by anisotropic etching, to leave part of said planarization film in, and filling, said contact hole; removing a portion of said third insulation film exposed by the anisotropic etching; forming a second conductive layer on substantially the entire surface of the resultant semiconductor structure; and patterning said second conductive layer and semiconductor layer, to form a laminated structure of a wiring layer.
Claim 19
Dependent Claim
46 words
A method of manufacturing semiconductor devices according to claim 15, which further comprises a step in which a silicide layer is formed on said semiconductor layer after said semiconductor layer has been formed, and in which said second insulation film is formed on said silicide layer.
Claim 20
Dependent Claim
24 words
A method of manufacturing semiconductor devices according to claim 16, wherein said silicide layer is formed of a compound of silicon and refractory metal.
Claim 21
Dependent Claim
21 words
A method of manufacturing semiconductor devices according to claim 15, wherein said semiconductor layer is formed of polysilicon containing an impurity.
Claim 22
Dependent Claim
18 words
A method of manufacturing semiconductor devices according to claim 15, wherein said planarization film is formed of polysilicon.
Claim 23
Dependent Claim
21 words
A method of manufacturing semiconductor devices according to claim 15, wherein said second conductive layer is formed of metal including aluminum.
References Cited (Backward Citations)
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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