US5521833A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for programming programmable integrated circuits
Assignee: Siemens AG
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Filing: 1992-10-28
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Granted: 1996-05-28
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Expires: 2012-10-28
Abstract
Abstract Circuit-associated programming signals and at least one additional, circuit-associated programming routine are generated and are then arranged in a testing device. The function check of printed circuit boards equipped with programmable integrated circuits is provided by measuring sensors which may be, for example, needle adapters. A programming of programmable integrated circuits on equipped PC boards results within the framework of the function test. A considerable cost reduction in the manufacture of PC boards for assemblies with programmable integrated circuits may be achieved. Separate programming at a special programming location may be avoided as well as avoiding a program-associated storing of the programmed integrated circuits.
Inventors
- 👤 Hilmar Lesch
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 02:03
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/06; G11C16/10; G11C16/102
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
163 words
A method for programming programmable integrated circuits arranged on a printed circuit board, terminal elements of said integrated circuits may be contacted with measuring sensors connected to a testing means for function testing of the printed circuit board, the method comprising the steps of: controlling the programming of said programmable integrated circuits with assistance of an additional circuit-associated programming routine provided in said testing means; forming circuit-associated programming signals in a matching means provided in said testing means and controlled by said additional circuit programming routine; transferring said circuit-associated programming signals to the measuring sensors which are at least temporarily contacted to said terminal elements; testing said printed circuit board with assistance of said testing means after programming of the integrated circuits; and controlling of circuit-associated programming voltage signals in a matching means in said testing means by said at least one programming routine whereby said circuit-associated programming voltage signals are time and address specific to said at least one programmable integrated circuits.
Claim 2
Independent Claim
163 words
A method for programming programmable integrated circuits arranged on a printed circuit board, terminal elements of said integrated circuits may be contacted with measuring sensors connected to a testing means for function testing of the printed circuit board, the method comprising the steps of: controlling the programming of said programmable integrated circuits with assistance of an additional circuit-associated programming routine provided in said testing means; forming circuit-associated programming signals in a matching means provided in said testing means and controlled by said additional circuit programming routine; transferring said circuit-associated programming signals to the measuring sensors which are at least temporarily contacted to said terminal elements; testing said printed circuit board with assistance of said testing means after programming of the integrated circuits; and controlling of circuit-associated programming voltage signals in a matching means in said testing means by said at least one programming routine whereby said circuit-associated programming voltage signals are time and address specific to said at least one programmable integrated circuits.
Claim 3
Dependent Claim
23 words
The method of claim 1 further comprising the step of: reprogramming said program integrated circuits with said measuring sensors and said testing means.
Claim 4
Dependent Claim
18 words
The method of claim 1 wherein said programming may be provided for integrated circuits with simple programming modes.
Claim 5
Dependent Claim
21 words
The method of claim 1 further comprising the step of: implementing said programming by using needle adapters as said measuring sensors.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-05-28 | 1999-11-27 | 2000-05-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-05-28 | 2003-11-27 | 2004-05-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-05-28 | 2007-11-27 | 2008-05-28 | $7700.00 | Window Closed / Lapsed |