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US5513518A
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Magnetic modulation of force sensor for AC detection in an atomic force microscope
Assignee: Molecular Imaging Corp
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Filing: 1995-03-10
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Granted: 1996-05-07
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Expires: 2015-03-10
Abstract
Abstract In a scanning force microscope a thin film of a magnetic material is applied to one or both surfaces of a force sensing cantilever. The cantilevers are then placed between the poles of an electromagnet and a magnetizing field applied in the direction of the soft axis of the cantilevers. The field is chosen so as to be bigger than the saturation field for the magnetic film. A small electromagnet is placed in the housing of the microscope so as to generate a field normal to the soft axis of the cantilever. The field is generated by an ac voltage and causes a time varying force to be applied to the cantilever. The corresponding modulation of the cantilever position is sensed by reflection of a laser beam into a position sensitive detector. The magnitude and phase of this signal are determined by a synchronous detector. Images of the sample surface are made at constant force gradient by scanning the cantilever over the surface while adjusting the gap between the probe and sample so as to maintain a constant output from the synchronous detector.
Inventors
- 👤 Stuart M. Lindsay
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 11:11
CPC Classifications
G; G01; G01Q; G01Q60/00; G01Q60/24; G01Q60/32; B; B82; B82Y; B82Y35/00; G01Q10/00; G01Q10/04; G01Q10/06; G01Q30/00; G01Q30/08; G01Q30/12; G01Q30/14; G01Q60/38; Y; Y10; Y10S; Y10S977/00; Y10S977/84; Y10S977/849; Y10S977/85; Y10S977/851; Y10S977/86; Y10S977/863; Y10S977/865; Y10S977/872; Y10S977/873; Y10S977/875; Y10S977/879; Y10S977/88; Y10S977/881; Y10S977/902; Y10S977/932; Y10S977/949; Y10S977/95; Y10S977/951
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
195 words
A scanning probe microscope for generating a signal corresponding to the surface characteristics of a scanned sample, comprising: a force sensing probe tip disposed on a first side of a free end of a flexible cantilever and adapted to be brought into close proximity to a sample surface; a film including a magnetized material disposed on a second side opposite said first side of said flexible cantilever; an XY scanner for generating relative scanning movement between said force sensing probe tip and said sample surface; a Z control for adjusting the distance between said force sensing probe tip and said sample surface; a deflection detector for generating a deflection signal indicative of deflection of said flexible cantilever; an ac signal source; a magnetic field generator for generating a magnetic field directed toward said second side of said flexible cantilever, said magnetic field generator coupled to said ac signal source so as to modulate said magnetic field with said ac signal; and a synchronous detector having said ac signal as a reference input and said deflection signal as a signal input, an output of said synchronous detector corresponding to the surface characteristics of the scanned sample.
Claim 2
Dependent Claim
195 words
A scanning probe microscope for generating a signal corresponding to the surface characteristics of a scanned sample, comprising: a force sensing probe tip disposed on a first side of a free end of a flexible cantilever and adapted to be brought into close proximity to a sample surface; a film including a magnetized material disposed on a second side opposite said first side of said flexible cantilever; an XY scanner for generating relative scanning movement between said force sensing probe tip and said sample surface; a Z control for adjusting the distance between said force sensing probe tip and said sample surface; a deflection detector for generating a deflection signal indicative of deflection of said flexible cantilever; an ac signal source; a magnetic field generator for generating a magnetic field directed toward said second side of said flexible cantilever, said magnetic field generator coupled to said ac signal source so as to modulate said magnetic field with said ac signal; and a synchronous detector having said ac signal as a reference input and said deflection signal as a signal input, an output of said synchronous detector corresponding to the surface characteristics of the scanned sample.
Claim 3
Dependent Claim
16 words
A scanning probe microscope according to claim 1 wherein said magnetic field generator includes a solenoid.
Claim 4
Dependent Claim
27 words
A scanning probe microscope according to claim 1 wherein said flexible cantilever, said force sensing probe tip and said sample surface are all submerged in a fluid.
Claim 5
Dependent Claim
14 words
A scanning probe microscope according to claim 3 wherein said fluid is a liquid.
Claim 6
Dependent Claim
13 words
A scanning probe microscope according to claim 4 wherein said fluid is water.
Claim 7
Dependent Claim
25 words
A scanning probe microscope according to claim 1 wherein said magnetized material has a magnetic moment parallel to the soft axis of said flexible cantilever.
Claim 8
Dependent Claim
23 words
A microscope according to claim 1 wherein said magnetic material has a magnetic moment parallel to the soft axis of said flexible cantilever.
Claim 9
Dependent Claim
157 words
A microscope for determining the characteristics of the surface of a sample, said microscope comprising: a force sensing probe tip disposed on a first side of a free end of a flexible cantilever; a magnetic material disposed on a second side of said free end of a flexible cantilever, said second being opposite said first side; means for detecting bending of said cantilever and producing a deflection signal in response thereto; means for scanning said force sensing probe tip relative to the surface of the sample; and an ac signal source; magnetic field generating means for generating a magnetic field directed toward said second side of said free end of said cantilever, said magnetic field generating means responsive to said ac signal source for causing ac modulation of said magnetic field; and a synchronous detector responsive to said deflection signal and said ac signal for generating an output signal corresponding to surface characteristics of the scanned sample.
Claim 10
Dependent Claim
157 words
A microscope for determining the characteristics of the surface of a sample, said microscope comprising: a force sensing probe tip disposed on a first side of a free end of a flexible cantilever; a magnetic material disposed on a second side of said free end of a flexible cantilever, said second being opposite said first side; means for detecting bending of said cantilever and producing a deflection signal in response thereto; means for scanning said force sensing probe tip relative to the surface of the sample; and an ac signal source; magnetic field generating means for generating a magnetic field directed toward said second side of said free end of said cantilever, said magnetic field generating means responsive to said ac signal source for causing ac modulation of said magnetic field; and a synchronous detector responsive to said deflection signal and said ac signal for generating an output signal corresponding to surface characteristics of the scanned sample.
Claim 11
Dependent Claim
24 words
A microscope according to claim 8 wherein said force sensing probe tip and the surface of the sample are all submerged in a fluid.
Claim 12
Dependent Claim
12 words
A microscope according to claim 9 wherein said fluid is a liquid.
Claim 13
Dependent Claim
11 words
A microscope according to claim 10 wherein said fluid is water.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-05-07 | 1999-11-06 | 2000-05-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-05-07 | 2003-11-06 | 2004-05-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-05-07 | 2007-11-06 | 2008-05-07 | $7700.00 | Window Closed / Lapsed |