Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
167 words
A method of manufacturing a semiconductor device whereby on a surface of a semiconductor body a conductor track of polycrystalline silicon insulated from the surface is formed in a layer of doped polycrystalline silicon provided on a layer of insulating material, and whereby a strip of polycrystalline silicon is formed between an edge of the conductor and a portion of the surface adjoining said edge, after which a semiconductor zone is formed in the semiconductor body through diffusion of dopant from the conductor through the strip, characterized in that a window is etched into the layer of polycrystalline silicon by means of a first etching mask after which the insulating layer is removed from the surface within said window, the window is provided at its edge with a strip of polycrystalline silicon, and the conductor track is formed in the layer of polycrystalline silicon by means of a second etching mask with said second etching mask covering at least a portion of the edge of the window.
Claim 2
Independent Claim
167 words
A method of manufacturing a semiconductor device whereby on a surface of a semiconductor body a conductor track of polycrystalline silicon insulated from the surface is formed in a layer of doped polycrystalline silicon provided on a layer of insulating material, and whereby a strip of polycrystalline silicon is formed between an edge of the conductor and a portion of the surface adjoining said edge, after which a semiconductor zone is formed in the semiconductor body through diffusion of dopant from the conductor through the strip, characterized in that a window is etched into the layer of polycrystalline silicon by means of a first etching mask after which the insulating layer is removed from the surface within said window, the window is provided at its edge with a strip of polycrystalline silicon, and the conductor track is formed in the layer of polycrystalline silicon by means of a second etching mask with said second etching mask covering at least a portion of the edge of the window.
Claim 3
Dependent Claim
57 words
A method as claimed in claim 1, characterized in that the layer of polycrystalline silicon is provided on an insulating layer formed on a surface of the semiconductor body to which field insulation regions adjoin, while the window is provided both above a field insulation region and above an active region bounded by said field insulation region.
Claim 4
Dependent Claim
58 words
A method as claimed in claim 2, characterized in that the window is provided at its edge with the strip of polycrystalline silicon through deposition of an auxiliary layer of polycrystalline silicon and by subjecting said auxiliary layer to a subsequent anisotropic etching treatment until the surface of the semiconductor body inside the window has been exposed again.
Claim 5
Dependent Claim
86 words
A method as claimed in claim 2, characterized in that the window is provided at its edge with the strip of polycrystalline silicon in that the layer of insulating material is etched away isotropically from the surface in a track situated below the edge of the window, in that then an auxiliary layer of polycrystaline silicon is deposited, and in that the auxiliary layer is subsequently subjected to an isotropic etching treatment until the surface of the semiconductor body inside the window has been exposed again.
Claim 6
Dependent Claim
58 words
A method as claimed in claim 1, characterized in that the window is provided at its edge with the strip of polycrystalline silicon through deposition of an auxiliary layer of polycrystalline silicon and by subjecting said auxiliary layer to a subsequent anisotropic etching treatment until the surface of the semiconductor body inside the window has been exposed again.
Claim 7
Dependent Claim
86 words
A method as claimed in claim 1, characterized in that the window is provided at its edge with the strip of polycrystalline silicon, in that the layer of insulating material is etched away isoptropically from the surface in a track situated below the edge of the window, in that then an auxiliary layer of polycrystalline silicon is deposited, and in that the auxiliary layer is subsequently subjected to an isotropic etching treatment until the surface of the semiconductor body inside the window has been exposed again.