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US5496754A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for preventing bit line-to-bit line leakage in the access transistor region of an AMG EPROM

Assignee: National Semiconductor Corp
•
Filing: 1994-03-15
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Granted: 1996-03-05
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Expires: 2014-03-15
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Abstract

Abstract The bit lines in an alternate-metal, virtual-ground (AMG) electrically programmable read-only-memory (EPROM), are formed by utilizing a plurality of field oxide regions and a plurality of pairs of dielectric/floating gate strips, which have the ends of each pair of strips connected together over a field oxide region, as an implant mask. By connecting together the ends of each pair of dielectric/floating gate strips, the width of the strips at the edges of the field oxide regions will remain constant. As a result, the isolation between adjacent bit lines, which is defined by the width of the strips, will also remain constant.

Inventors

  • 👤 Albert M. Bergemont
  • 👤 Graham R. Wolstenholme

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 16:07
CPC Classifications
H; H10; H10B; H10B41/00; H10B41/30; H10B41/35; H10B69/00; H10P; H10P14/00; H10P14/20; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3416; H10P14/3424; H10P14/3426; H10W; H10W20/00; H10W20/01; H10W20/071

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 288 words
A method for fabricating an alternate-metal, virtual-ground electrically programmable read-only-memory (EPROM) on a semiconductor substrate, the substrate having an array region and a pair of access select regions arranged so that the array region is formed between and adjoins the pair of access select regions, the method comprising the steps of: forming a plurality of rows of spaced-apart field oxide regions in each access select region, the plurality of rows including a first row and a second row; forming a layer of first dielectric material over the semiconductor substrate in the access select regions and the array region; forming a layer of conductive material over the layer of first dielectric material and the field oxide regions in the access select regions, and over the layer of first dielectric material in the array region; forming a layer of second dielectric material over the layer of conductive material in the access select regions and the array region; defining a plurality of pairs of parallel, spaced-apart strips on the layer of second dielectric material that extend across the array region into both of the access select regions such that a first strip of each pair of strips is formed over a field oxide region in both the first and second rows of field oxide regions in one access select region, such that a second strip of each pair of strips is formed over a field oxide region in the second row of field oxide regions in said one access select region, and such that each pair of strips has ends which are connected together; and etching the second dielectric material and the layer of conductive material underlying the second dielectric material to form the plurality of pairs of parallel, spaced-apart strips.
Claim 2
Independent Claim 288 words
A method for fabricating an alternate-metal, virtual-ground electrically programmable read-only-memory (EPROM) on a semiconductor substrate, the substrate having an array region and a pair of access select regions arranged so that the array region is formed between and adjoins the pair of access select regions, the method comprising the steps of: forming a plurality of rows of spaced-apart field oxide regions in each access select region, the plurality of rows including a first row and a second row; forming a layer of first dielectric material over the semiconductor substrate in the access select regions and the array region; forming a layer of conductive material over the layer of first dielectric material and the field oxide regions in the access select regions, and over the layer of first dielectric material in the array region; forming a layer of second dielectric material over the layer of conductive material in the access select regions and the array region; defining a plurality of pairs of parallel, spaced-apart strips on the layer of second dielectric material that extend across the array region into both of the access select regions such that a first strip of each pair of strips is formed over a field oxide region in both the first and second rows of field oxide regions in one access select region, such that a second strip of each pair of strips is formed over a field oxide region in the second row of field oxide regions in said one access select region, and such that each pair of strips has ends which are connected together; and etching the second dielectric material and the layer of conductive material underlying the second dielectric material to form the plurality of pairs of parallel, spaced-apart strips.
Claim 3
Dependent Claim 15 words
The method of claim 1 wherein the layer of first dielectric material includes an oxide.
Claim 4
Dependent Claim 13 words
The method of claim 1 wherein the layer of conductive material includes polysilicon.
Claim 5
Dependent Claim 17 words
The method of claim 1 wherein the layer of second dielectric material includes a composite of oxide-nitride-oxide.
Claim 6
Independent Claim 283 words
A method for fabricating an alternate-metal, virtual-ground electrically programmable read-only-memory (EPROM) on a semiconductor substrate, the substrate having an array region and a pair of access select regions arranged so that the array region is formed between and adjoins the pair of access select regions, the method comprising the steps of: forming a plurality of rows of spaced-apart field oxide regions in each access select region, the plurality of rows including a first row and a second row; forming a layer of first dielectric material over the semiconductor substrate in the access select regions and the array region; forming a layer of first conductive material over the layer of first dielectric material and the field oxide regions in the access select regions, and over the layer of first dielectric material in the array region; forming a layer of second dielectric material over the layer of first conductive material in the access select regions and the array region; defining a plurality of parallel, spaced-apart strips on the layer of second dielectric material that extend across the array region into both of the access select regions such that first alternating strips are formed over a field oxide region in both the first row and the second row of field oxide regions in one access select region, and such that second alternating strips are formed over a field oxide region in the second row of field oxide regions in said one access select region, each strip having an angled portion formed over the field oxide region in the second row; and etching the second dielectric material and the layer of first conductive material underlying the second dielectric material to form the plurality of parallel, spaced-apart strips.
Claim 7
Independent Claim 283 words
A method for fabricating an alternate-metal, virtual-ground electrically programmable read-only-memory (EPROM) on a semiconductor substrate, the substrate having an array region and a pair of access select regions arranged so that the array region is formed between and adjoins the pair of access select regions, the method comprising the steps of: forming a plurality of rows of spaced-apart field oxide regions in each access select region, the plurality of rows including a first row and a second row; forming a layer of first dielectric material over the semiconductor substrate in the access select regions and the array region; forming a layer of first conductive material over the layer of first dielectric material and the field oxide regions in the access select regions, and over the layer of first dielectric material in the array region; forming a layer of second dielectric material over the layer of first conductive material in the access select regions and the array region; defining a plurality of parallel, spaced-apart strips on the layer of second dielectric material that extend across the array region into both of the access select regions such that first alternating strips are formed over a field oxide region in both the first row and the second row of field oxide regions in one access select region, and such that second alternating strips are formed over a field oxide region in the second row of field oxide regions in said one access select region, each strip having an angled portion formed over the field oxide region in the second row; and etching the second dielectric material and the layer of first conductive material underlying the second dielectric material to form the plurality of parallel, spaced-apart strips.
Claim 8
Dependent Claim 115 words
The method of claim 5 and further comprising the steps of: forming a layer of third dielectric material over the layer of first dielectric material and the and the field oxide regions between the parallel, spaced-apart strips; forming a layer of second conductive material over the layer of third dielectric material and the plurality of parallel, spaced-apart strips; defining a plurality of word lines; and etching the layer of second conductive material, the second dielectric material and the layer of first conductive material underlying the second dielectric material to form the plurality of word lines, whereby the angled portions formed over the field oxide regions in the second row of field oxide regions are removed.
Claim 9
Dependent Claim 13 words
The method of claim 6 wherein the layer of conductive material includes polysilicon.
Claim 10
Dependent Claim 17 words
The method of claim 6 wherein the layer of second dielectric material includes a composite of oxide-nitride-oxide.
Claim 11
Independent Claim 154 words
A method for fabricating an electrically programmable read-only-memory (EPROM) on a semiconductor substrate comprising the steps of: forming a plurality of spaced-apart field oxide regions in the semiconductor substrate; forming a layer of first dielectric material over the semiconductor substrate; forming a layer of conductive material over the layer of first dielectric material and the field oxide regions; forming a layer of second dielectric material over the layer of conductive material; defining a plurality of unmasked, spaced-apart parallel strips, and a plurality of pairs of masked, spaced-apart parallel strips on the layer of second dielectric material, each pair of masked strips having ends which are connected together over a field oxide region; and etching away the unmasked strips of second dielectric material and the layer of conductive material underlying the unmasked strips of second dielectric material to form a plurality of pairs of spaced-apart parallel strips of second dielectric material and underlying conductive material.
Claim 12
Independent Claim 154 words
A method for fabricating an electrically programmable read-only-memory (EPROM) on a semiconductor substrate comprising the steps of: forming a plurality of spaced-apart field oxide regions in the semiconductor substrate; forming a layer of first dielectric material over the semiconductor substrate; forming a layer of conductive material over the layer of first dielectric material and the field oxide regions; forming a layer of second dielectric material over the layer of conductive material; defining a plurality of unmasked, spaced-apart parallel strips, and a plurality of pairs of masked, spaced-apart parallel strips on the layer of second dielectric material, each pair of masked strips having ends which are connected together over a field oxide region; and etching away the unmasked strips of second dielectric material and the layer of conductive material underlying the unmasked strips of second dielectric material to form a plurality of pairs of spaced-apart parallel strips of second dielectric material and underlying conductive material.
Claim 13
Dependent Claim 15 words
The method of claim 9 wherein the layer of first dielectric material includes an oxide.
Claim 14
Dependent Claim 13 words
The method of claim 9 wherein the layer of conductive material includes polysilicon.
Claim 15
Dependent Claim 17 words
The method of claim 9 wherein the layer of second dielectric material includes a composite of oxide-nitride-oxide.
Claim 16
Dependent Claim 15 words
The method of claim 6 wherein the layer of first dielectric material includes an oxide.

References Cited (Backward Citations)

US5204835A Cited
US5371030A Cited
US5227326A Cited
US5346842A Cited
US5246874A Cited
EP0573168A1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-03-05 1999-09-04 2000-03-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-03-05 2003-09-04 2004-03-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-03-05 2007-09-04 2008-03-05 $7700.00 Window Closed / Lapsed

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