US5488578A
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Semiconductor memory device including bit check function and testing method using the same
Assignee: Mitsubishi Electric Corp
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Filing: 1994-08-26
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Granted: 1996-01-30
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Expires: 2014-08-26
Abstract
Abstract The semiconductor memory device includes word lines, bit line pairs crossing the word lines, memory cells disposed, a row decoder, and sense amplifiers. The device further includes a plurality of comparing circuits, a plurality of control circuits, and a determination signal generating circuit. Each comparing circuit compares a data signal read out from the corresponding memory cell with a reference signal externally applied when the reference signal is at an H level, and generates a result signal indicating whether or not the data signal matches the reference signal. Each control circuit carries out control so that a result signal from the comparing circuit indicates a match irrespectively of whether or not the data signal matching the reference signal when the reference signal is at an L level. The determination signal generating circuit generates a determination signal indicating a match when all of the results signals from the comparing circuits indicate a match, and generates a determination signal indicating a mismatch when any of the result signals from the comparing circuits indicates a mismatch.
Inventors
- 👤 Akira Yamada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 16:07
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/04; G11C29/08; G11C29/12; G11C29/38; G11C29/10
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
203 words
A semiconductor memory device, comprising: a plurality of memory cells each for storing one-bit data therein; reading/writing means for reading data from said plurality of memory cells and writing data to said plurality of memory cells; a plurality of comparing means provided corresponding to said plurality of memory cells for comparing a plurality of data signals corresponding to data read out from said plurality of memory cells by said reading/writing means with a plurality of reference signals externally applied corresponding to the plurality of data signals, correspondingly, wherein each of said comparing means generates a result signal indicating whether or not each data signal matches a corresponding reference signal when the corresponding reference signal is at a first logic level, and generates a result signal indicating a match irrespectively of whether or not each data signal matching the corresponding reference signal when the corresponding reference signal is at a second logic level; and determination signal generating means for generating a determination signal indicating a match when all of result signals from said plurality of comparing means indicate a match and for generating a determination signal indicating a mismatch when any of the result signals from said plurality of comparing means indicates a mismatch.
Claim 2
Dependent Claim
203 words
A semiconductor memory device, comprising: a plurality of memory cells each for storing one-bit data therein; reading/writing means for reading data from said plurality of memory cells and writing data to said plurality of memory cells; a plurality of comparing means provided corresponding to said plurality of memory cells for comparing a plurality of data signals corresponding to data read out from said plurality of memory cells by said reading/writing means with a plurality of reference signals externally applied corresponding to the plurality of data signals, correspondingly, wherein each of said comparing means generates a result signal indicating whether or not each data signal matches a corresponding reference signal when the corresponding reference signal is at a first logic level, and generates a result signal indicating a match irrespectively of whether or not each data signal matching the corresponding reference signal when the corresponding reference signal is at a second logic level; and determination signal generating means for generating a determination signal indicating a match when all of result signals from said plurality of comparing means indicate a match and for generating a determination signal indicating a mismatch when any of the result signals from said plurality of comparing means indicates a mismatch.
Claim 3
Dependent Claim
216 words
A semiconductor memory device, comprising: a plurality of memory cells each for storing one-bit data therein; reading/writing means for reading out data from said plurality of memory cells and writing data to said plurality of memory cells; a plurality of comparing means provided corresponding to said plurality of memory cells and each comparing a data signal corresponding to data read out by said reading/writing means from the corresponding memory cell with a reference signal externally applied corresponding to the data signal, and generating a result signal indicating whether or not the data signal matches the reference signal when the reference signal is at a first logic level; a plurality of control means provided corresponding to said plurality of comparing means and each controlling the corresponding comparing means so that a result signal from the corresponding comparing means indicates a match irrespectively of whether or not the corresponding data signal matching the corresponding reference signal when the corresponding reference signal is at a second logic level; and determination signal generating means for generating a determination signal indicating a match when all of result signals from said plurality of comparing means indicate a match, and for generating a determination signal indicating a mismatch when any of the result signals from said plurality of comparing means indicates a mismatch.
Claim 4
Dependent Claim
216 words
A semiconductor memory device, comprising: a plurality of memory cells each for storing one-bit data therein; reading/writing means for reading out data from said plurality of memory cells and writing data to said plurality of memory cells; a plurality of comparing means provided corresponding to said plurality of memory cells and each comparing a data signal corresponding to data read out by said reading/writing means from the corresponding memory cell with a reference signal externally applied corresponding to the data signal, and generating a result signal indicating whether or not the data signal matches the reference signal when the reference signal is at a first logic level; a plurality of control means provided corresponding to said plurality of comparing means and each controlling the corresponding comparing means so that a result signal from the corresponding comparing means indicates a match irrespectively of whether or not the corresponding data signal matching the corresponding reference signal when the corresponding reference signal is at a second logic level; and determination signal generating means for generating a determination signal indicating a match when all of result signals from said plurality of comparing means indicate a match, and for generating a determination signal indicating a mismatch when any of the result signals from said plurality of comparing means indicates a mismatch.
Claim 5
Dependent Claim
24 words
The semiconductor memory device as recited in claim 2, wherein said plurality of comparing means are activated in response to a predetermined activation signal.
Claim 6
Dependent Claim
45 words
The semiconductor memory device as recited in claim 2, wherein each of said plurality of control means includes a first logical product circuit responsive to the result signal from the corresponding comparing means and the corresponding reference signal for supplying a logical product signal thereof.
Claim 7
Dependent Claim
48 words
The semiconductor memory device as recited in claim 4, wherein each of said plurality of control means further includes a second logical product circuit responsive to the corresponding reference signal and a predetermined activation signal for supplying a logical product signal thereof to said first logical product circuit.
Claim 8
Dependent Claim
99 words
The semiconductor memory device as recited in claim 2, wherein each of said plurality of comparing means includes first amplifying means activated in response to the corresponding reference signal for amplifying, when activated, a first data signal corresponding to data read out from the corresponding memory cell, second amplifying means activated in response to the inverted signal of the corresponding reference signal for amplifying, when activated, a second data signal complementary to the first data signal, and means responsive to outputs from said first and second amplifying means for supplying the result signal to said determination signal generating means.
Claim 9
Dependent Claim
43 words
The semiconductor memory device as recited in claim 6, wherein each of said plurality of control means includes deactivating means for deactivating first and second amplifying means in the corresponding comparing means when the corresponding reference signal is at a second logic level.
Claim 10
Dependent Claim
86 words
The semiconductor memory device as recited in claim 7, wherein said deactivating means includes a third logical product circuit responsive to the corresponding reference signal and a reference signal synchronized with the reference signal for supplying logical product signal thereof to first amplifying means in the corresponding comparing means, and a fourth logical product circuit responsive to the inverted signal of the corresponding reference signal and the synchronized reference signal for supplying a logical product signal thereof to second amplifying means in the corresponding comparing means.
Claim 11
Dependent Claim
46 words
The semiconductor memory device as recited in claim 8, wherein said deactivating means further includes a fifth logical product circuit responsive to the corresponding reference signal and a predetermined activation signal for supplying a logical product signal thereof to said third and fourth logical product circuits.
Claim 12
Independent Claim
312 words
A method of testing using a semiconductor memory device including a plurality of memory cells each for storing one-bit data therein, reading/writing means for reading out data from said plurality of memory cells and writing data to said plurality of memory cells, a plurality of comparing means provided corresponding to said plurality of memory cells and each comparing a data signal corresponding to data read out by said reading/writing means from the corresponding memory cell with a reference signal externally applied corresponding to the data signal, and generating a result signal indicating whether or not the data signal matches the reference signal when the corresponding reference signal is at a first logic level, a plurality of control means provided corresponding to said plurality of comparing means and each controlling the corresponding comparing means so that a result signal from the corresponding comparing means indicates a match irrespectively of whether or not the corresponding data signal matching the corresponding reference signal when the corresponding reference signal is at a second logic level, and determination signal generating means for generating a determination signal indicating a match when all of result signals from said plurality of comparing means indicate a match, and for generating a determination signal indicating a mismatch when any of the result signals from said plurality of comparing means indicates a mismatch, comprising the steps of: writing data corresponding to the first logic level to said plurality of memory cells; reading data from said plurality of memory cells; supplying a plurality of reference signals including one reference signal of the first logic level and the other reference signals of a second logic level to said plurality of comparing means, correspondingly; and determining that one memory cell corresponding to the one reference signal of the first logic level is defective when the determination signal from said determination signal generating means indicates a mismatch.
Claim 13
Independent Claim
312 words
A method of testing using a semiconductor memory device including a plurality of memory cells each for storing one-bit data therein, reading/writing means for reading out data from said plurality of memory cells and writing data to said plurality of memory cells, a plurality of comparing means provided corresponding to said plurality of memory cells and each comparing a data signal corresponding to data read out by said reading/writing means from the corresponding memory cell with a reference signal externally applied corresponding to the data signal, and generating a result signal indicating whether or not the data signal matches the reference signal when the corresponding reference signal is at a first logic level, a plurality of control means provided corresponding to said plurality of comparing means and each controlling the corresponding comparing means so that a result signal from the corresponding comparing means indicates a match irrespectively of whether or not the corresponding data signal matching the corresponding reference signal when the corresponding reference signal is at a second logic level, and determination signal generating means for generating a determination signal indicating a match when all of result signals from said plurality of comparing means indicate a match, and for generating a determination signal indicating a mismatch when any of the result signals from said plurality of comparing means indicates a mismatch, comprising the steps of: writing data corresponding to the first logic level to said plurality of memory cells; reading data from said plurality of memory cells; supplying a plurality of reference signals including one reference signal of the first logic level and the other reference signals of a second logic level to said plurality of comparing means, correspondingly; and determining that one memory cell corresponding to the one reference signal of the first logic level is defective when the determination signal from said determination signal generating means indicates a mismatch.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-01-29 | 1999-07-31 | 2000-01-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-01-29 | 2003-07-31 | 2004-01-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-01-29 | 2007-07-31 | 2008-01-30 | $7700.00 | Window Closed / Lapsed |