Abstract A method for depositing tungsten nitride thin films prior to a formation of tungsten thin films using the plasma-enhanced chemical vapor deposition, capable of restraining an occurrence of corrosions at a silicon substrate, an oxide film and boundary surfaces thereof, during the formation of tungsten thin films. The deposition of tungsten nitride thin film is carried out using a plasma-enhanced chemical vapor deposition at a deposition temperature of 300° C. to 600° C. and a deposition pressure of 0.1-1 Tort while maintaining a NH 3 /WF 6 partial pressure ratio at a range of 0.25 to 2. The obtained tungsten nitride thin film exhibits very low resistivity of 70 μΩ-cm to 300 μΩ-cm and effectively restrains an occurrence of corrosions at a silicon substrate, an oxide film and boundary surfaces thereof, during the formation of tungsten thin films using the plasma-enhanced chemical vapor deposition.
A method of forming a metallic wiring for a silicon semiconductor device which comprises: providing a silicon semiconductor substrate; depositing a layer of tungsten nitride on said silicon semiconductor substrate by a radio frequency plasma enhanced chemical vapor deposition process which utilizes a WF 6 -NH 3 -H 2 reactant gas mixture and a 13.56 MHz glow discharge; and depositing a layer of tungsten on said layer of tungsten nitride by a plasma enhanced chemical vapor deposition process which utilizes a WF 6 -H 2 reactant gas mixture and a 13.56 MHz glow discharge and produces fluorine atoms from the WF 6 , wherein said tungsten nitride layer prevents corrosion of said silicon semiconductor substrate by said fluorine atoms during the deposition of said tungsten layer.
Claim 2
Independent Claim
126 words
A method of forming a metallic wiring for a silicon semiconductor device which comprises: providing a silicon semiconductor substrate; depositing a layer of tungsten nitride on said silicon semiconductor substrate by a radio frequency plasma enhanced chemical vapor deposition process which utilizes a WF 6 -NH 3 -H 2 reactant gas mixture and a 13.56 MHz glow discharge; and depositing a layer of tungsten on said layer of tungsten nitride by a plasma enhanced chemical vapor deposition process which utilizes a WF 6 -H 2 reactant gas mixture and a 13.56 MHz glow discharge and produces fluorine atoms from the WF 6 , wherein said tungsten nitride layer prevents corrosion of said silicon semiconductor substrate by said fluorine atoms during the deposition of said tungsten layer.
Claim 3
Dependent Claim
75 words
A method of forming a metallic wiring for a silicon semiconductor device according to claim 1, wherein said tungsten nitride is deposited using a 13.56 MHz glow discharge of WF 6 -NH 3 -H 2 without DC negative bias while maintaining a NH 3 /WF 6 partial pressure ratio in a range of 0.25 to 2 at a deposition temperature of 300° C. to 600° C. and a deposition pressure of 0.1 to 1 Torr.