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Polishing apparatus and method using a rotary work holder travelling down a rail for polishing a workpiece with linear pads

Assignee: DuPont Electronic Materials Holding Inc
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Filing: 1993-02-09
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Granted: 1996-01-30
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Expires: 2013-02-09
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Abstract

Abstract The present invention relates to an apparatus for polishing semiconductor wafers and, in particular, one in which the polishing pads are linear, that is, the polishing pads have a long linear dimension relative to their width and have a uniform cross-section along this linear dimension. In addition, the wafer holder travels in a straight line parallel to the long linear dimension of the polishing pads.

Inventors

  • 👤 Elmer W. Jensen

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 16:17
CPC Classifications
B; B24; B24B; B24B7/00; B24B7/20; B24B7/22; B24B37/00; B24B37/04; B24B37/07; B24B37/08; B24B37/10; B24B37/105; B24B37/107; B24B37/11; B24B37/20

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 121 words
An apparatus for polishing a flat surface comprising: (a) one or more linear polishing pads each of which has a long linear dimension such that the surface of each pad which contacts said workpiece is long and narrow; and (b) a carrier which holds at least one workpiece to be polished, said carrier mounted to a rail which is parallel to a longitudinal axis of said linear polishing pad or pads whereby said carrier periodically passes each workpiece over a different portion of said pad surface as said carrier travels along said rail generally in a straight line parallel to said long linear dimension of said linear polishing pad or pads down the length of said linear polishing pad or pads.
Claim 2
Independent Claim 121 words
An apparatus for polishing a flat surface comprising: (a) one or more linear polishing pads each of which has a long linear dimension such that the surface of each pad which contacts said workpiece is long and narrow; and (b) a carrier which holds at least one workpiece to be polished, said carrier mounted to a rail which is parallel to a longitudinal axis of said linear polishing pad or pads whereby said carrier periodically passes each workpiece over a different portion of said pad surface as said carrier travels along said rail generally in a straight line parallel to said long linear dimension of said linear polishing pad or pads down the length of said linear polishing pad or pads.
Claim 3
Dependent Claim 13 words
An apparatus according to claim 1, wherein said workpiece is a semiconductor wafer.
Claim 4
Dependent Claim 23 words
An apparatus according to claim 1, wherein said carrier rotates about an axis perpendicular to said straight line of travel of said carrier.
Claim 5
Dependent Claim 13 words
An apparatus according to claim 3, wherein said workpiece is a semiconductor wafer.
Claim 6
Dependent Claim 23 words
An apparatus according to claim 1, further comprising: (c) means for holding said workpiece against said linear polishing pads with a steady pressure.
Claim 7
Dependent Claim 13 words
An apparatus according to claim 5, wherein said workpiece is a semiconductor wafer.
Claim 8
Dependent Claim 19 words
An apparatus according to claim 5, wherein the pressure holding said workpiece against said linear polishing pads is adjustable.
Claim 9
Dependent Claim 13 words
An apparatus according to claim 7, wherein said workpiece is a semiconductor wafer.
Claim 10
Dependent Claim 16 words
An apparatus according to claim 1, wherein the cross-section of said linear polishing pad is rectangular.
Claim 11
Dependent Claim 13 words
An apparatus according to claim 9, wherein said workpiece is a semiconductor wafer.
Claim 12
Dependent Claim 24 words
An apparatus according to claim 1, wherein the surface of said linear polishing pad which contacts said workpiece is part of a cylindrical surface.
Claim 13
Dependent Claim 13 words
An apparatus according to claim 11, wherein said workpiece is a semiconductor wafer.
Claim 14
Dependent Claim 25 words
An apparatus according to claim 11, wherein said linear polishing pad is moved about its axis to continuously expose fresh pad surface to said workpiece.
Claim 15
Dependent Claim 13 words
An apparatus according to claim 13, wherein said workpiece is a semiconductor wafer.
Claim 16
Dependent Claim 17 words
An apparatus according to claim 1 , wherein polishing composition is applied to said linear polishing pads.
Claim 17
Dependent Claim 13 words
An apparatus according to claim 15, wherein said workpiece is a semiconductor wafer.
Claim 18
Dependent Claim 13 words
An apparatus according to claim 15, wherein said polishing composition is a slurry.
Claim 19
Dependent Claim 13 words
An apparatus according to claim 17, wherein said workpiece is a semiconductor wafer.
Claim 20
Independent Claim 88 words
A method for polishing a flat surface of a workpiece comprising: (a) placing said workpiece in a carrier mounted to a rail which is parallel to a longitudinal axis of linear polishing pad or pads and (b) periodically passing said workpiece over a different portion of the surface of said polishing pad or pads as said carrier travels along said rail generally in a straight line parallel to a long linear dimension of said polishing pad or pads down the length of said linear polishing pad or pads.
Claim 21
Independent Claim 88 words
A method for polishing a flat surface of a workpiece comprising: (a) placing said workpiece in a carrier mounted to a rail which is parallel to a longitudinal axis of linear polishing pad or pads and (b) periodically passing said workpiece over a different portion of the surface of said polishing pad or pads as said carrier travels along said rail generally in a straight line parallel to a long linear dimension of said polishing pad or pads down the length of said linear polishing pad or pads.
Claim 22
Dependent Claim 13 words
A method according to claim 19, wherein said workpiece is a semiconductor wafer.

References Cited (Backward Citations)

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US4663890A Cited
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US4918870A Cited
US4934102A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-01-29 1999-07-31 2000-01-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-01-29 2003-07-31 2004-01-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-01-29 2007-07-31 2008-01-30 $7700.00 Window Closed / Lapsed

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